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Yayın Yılı: 2001

Yazar

Taylor and Francis.

(2)

(1)

Chan, H. Anthony, 1952-

(1)

Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida)

(1)

(1)

Englert, Paul J, 1960-

(1)

Feinberg, Alec.

(1)

Inman, Keith., author.

(1)

Itoigawa, Naosuke, 1935-

(1)

Kartalopoulos, Stamatios V.

(1)

Mittal, Kash L., 1945- editor.

(1)

Neale, M. J. (Michael John)

(1)

Pistone, Giovanni., author.

(1)

(1)

Riccomagno, Eva.

(1)

(1)

Schrieber, Randall R.

(1)

(1)

(1)

Tsokos, Chris P.

(1)

United States. Air Force. Office of Scientific Research.

(1)

University of South Florida.

(1)

Welch, Gregory V.

(1)

Whitaker, Jerry C., author.

(1)

Willis, H. Lee, 1949, author.

(1)

Wilpert, Bernhard, 1936-

(1)

(1)

Tümünü genişlet

Dil

(11)

Konu

Electronic books.

(2)

Reliability (Engineering)

(2)

Adhesion -- Congresses.

(1)

(1)

(1)

Bayesian statistical decision theory -- Congresses.

(1)

Coatings -- Congresses.

(1)

(1)

Electric power distribution -- Costs.

(1)

Electric power failures.

(1)

Electric power systems -- Deterioration.

(1)

Electric power systems -- Reliability.

(1)

Electric transformers -- Design and construction.

(1)

Electric utilities -- United States.

(1)

Electronic apparatus and appliances -- Design and construction -- Quality control.

(1)

Electronic apparatus and appliances -- Reliability.

(1)

Electronic apparatus and appliances -- Testing.

(1)

Electronics -- Handbooks, manuals, etc.

(1)

Environmental testing.

(1)

Fault location (Engineering)

(1)

Forensic sciences.

(1)

Industrial design.

(1)

Industrial safety -- Management.

(1)

Lubrication and lubricants -- Handbooks, manuals, etc.

(1)

Manufacturing processes.

(1)

Mathematical statistics.

(1)

Nuclear industry -- Employees -- Attitudes.

(1)

Nuclear power plants -- Safety measures.

(1)

Optical communications.

(1)

Organizational behavior.

(1)

Reliability (Engineering) -- Handbooks, manuals, etc.

(1)

Reliability (Engineering) -- Mathematical models -- Congresses.

(1)

Signal processing -- Digital techniques.

(1)

Thin films -- Congresses.

(1)

(1)

Wavelength division multiplexing.

(1)

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1.

Design for reliability için kapak resmi

Design for reliability

Design for reliability

Yazar

Crow, Dana. Feinberg, Alec.

Yer Numarası

TK7836 .D473 2001

Elektronik Erişim

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2.

Lubrication and reliability handbook için kapak resmi

Lubrication and reliability handbook

Lubrication and reliability handbook

Yazar

Neale, M. J. (Michael John)

Yer Numarası

ONLINE

Elektronik Erişim

ScienceDirect http://www.sciencedirect.com/science/book/9780750651547

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3.

The theory and applications of reliability with emphasis on Bayesian and nonparametric methods için kapak resmi

The theory and applications of reliability with emphasis on Bayesian and nonparametric methods

The theory and applications of reliability with emphasis on Bayesian and nonparametric methods

Yazar

Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida) Tsokos, Chris P. Shimi, I. N. United States. Air Force. Office of Scientific Research. University of South Florida.

Yer Numarası

ONLINE

Elektronik Erişim

ScienceDirect http://www.sciencedirect.com/science/book/9780127021010

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4.

Fault detectability in DWDM toward higher signal quality & system reliability için kapak resmi

Fault detectability in DWDM toward higher signal quality & system reliability

Fault detectability in DWDM toward higher signal quality & system reliability

Yazar

Kartalopoulos, Stamatios V.

Yer Numarası

ONLINE

Elektronik Erişim

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263624

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5.

Adhesion measurement of films and coatings. Volume 2 için kapak resmi

Adhesion measurement of films and coatings. Volume 2

Adhesion measurement of films and coatings. Volume 2

Yazar

Mittal, Kash L., 1945- editor. Taylor and Francis.

Yer Numarası

QC183

Elektronik Erişim

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6.

Accelerated stress testing handbook guide for achieving quality products için kapak resmi

Accelerated stress testing handbook guide for achieving quality products

Accelerated stress testing handbook guide for achieving quality products

Yazar

Chan, H. Anthony, 1952- Englert, Paul J, 1960-

Yer Numarası

ONLINE

Elektronik Erişim

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5270476

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7.

Designing capable and reliable products için kapak resmi

Designing capable and reliable products

Designing capable and reliable products

Yazar

Booker, J. D. Raines, M. Swift, K. G.

Yer Numarası

ONLINE

Elektronik Erişim

ScienceDirect http://www.sciencedirect.com/science/book/9780750650762

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8.

The resource handbook of electronics için kapak resmi

The resource handbook of electronics

The resource handbook of electronics

Yazar

Whitaker, Jerry C., author.

Yer Numarası

TK7825 .W48 2001

Elektronik Erişim

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9.

Principles and practice of criminalistics : the profession of forensic science için kapak resmi

Principles and practice of criminalistics : the profession of forensic science

Principles and practice of criminalistics : the profession of forensic science

Yazar

Inman, Keith., author. Rudin, Norah.

Yer Numarası

HV8073 .I443 2001

Elektronik Erişim

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10.

Safety culture in nuclear power operations için kapak resmi

Safety culture in nuclear power operations

Safety culture in nuclear power operations

Yazar

Wilpert, Bernhard, 1936- Itoigawa, Naosuke, 1935-

Yer Numarası

TK9152.14 .S34 2001

Elektronik Erişim

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11.

Algebraic statistics : computational commutative algebra in statistics için kapak resmi

Algebraic statistics : computational commutative algebra in statistics

Algebraic statistics : computational commutative algebra in statistics

Yazar

Pistone, Giovanni., author. Riccomagno, Eva. Wynn, Henry P.

Yer Numarası

QA276 .P53 2001

Elektronik Erişim

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12.

Aging power delivery infrastructures için kapak resmi

Aging power delivery infrastructures

Aging power delivery infrastructures

Yazar

Willis, H. Lee, 1949, author. Welch, Gregory V. Schrieber, Randall R.

Yer Numarası

TK1010 .W55 2001

Elektronik Erişim

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