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6 sonuç bulundu Arama sonuçlarına abone ol
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1. 
Emerging VLSI Devices, Circuits and Architectures Proceedings of the 27th International Symposium, VDAT 2023 için kapak resmi
Emerging VLSI Devices, Circuits and Architectures Proceedings of the 27th International Symposium, VDAT 2023
Yazar 
Gupta, Anu. editor. Pandey, Jai Gopal. editor. (orcid)0000-0001-9937-7438 Chaturvedi, Nitin. editor. Dwivedi, Devesh. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-981-97-5269-0
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2. 
VLSI for Embedded Intelligence Proceedings of the 27th International Symposium, VDAT 2023 için kapak resmi
VLSI for Embedded Intelligence Proceedings of the 27th International Symposium, VDAT 2023
Yazar 
Gupta, Anu. editor. Pandey, Jai Gopal. editor. (orcid)0000-0001-9937-7438 Chaturvedi, Nitin. editor. Dwivedi, Devesh. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-981-97-3756-7
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Durum 
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3. 
Image Analysis and Processing - ICIAP 2023 Workshops Udine, Italy, September 11-15, 2023, Proceedings, Part II için kapak resmi
Image Analysis and Processing - ICIAP 2023 Workshops Udine, Italy, September 11-15, 2023, Proceedings, Part II
Yazar 
Foresti, Gian Luca. editor. Fusiello, Andrea. editor. Hancock, Edwin. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-031-51026-7
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4. 
Tests and Proofs 11th International Conference, TAP 2017, Held as Part of STAF 2017, Marburg, Germany, July 19-20, 2017, Proceedings için kapak resmi
Tests and Proofs 11th International Conference, TAP 2017, Held as Part of STAF 2017, Marburg, Germany, July 19-20, 2017, Proceedings
Yazar 
Gabmeyer, Sebastian. editor. Johnsen, Einar Broch. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-319-61467-0
Format: 
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5. 
VLSI-SoC: System-on-Chip in the Nanoscale Era - Design, Verification and Reliability 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016, Revised Selected Papers için kapak resmi
VLSI-SoC: System-on-Chip in the Nanoscale Era - Design, Verification and Reliability 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016, Revised Selected Papers
Yazar 
Hollstein, Thomas. editor. Raik, Jaan. editor. Kostin, Sergei. editor. Tšertov, Anton. editor. O'Connor, Ian. editor.
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-319-67104-8
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6. 
VLSI-SoC: Design for Reliability, Security, and Low Power 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers için kapak resmi
VLSI-SoC: Design for Reliability, Security, and Low Power 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers
Yazar 
Shin, Youngsoo. editor. Tsui, Chi Ying. editor. Kim, Jae-Joon. editor. Choi, Kiyoung. editor. Reis, Ricardo. editor. (orcid)0000-0001-5781-5858
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-319-46097-0
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