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1. 
Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992 için kapak resmi
Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992
Yazar 
Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control (1992 : Strasbourg, France) Crean, G. M. Stuck, R. Woollam, John A. European Materials Research Society.
Yer Numarası 
ONLINE
Elektronik Erişim 
ScienceDirect http://www.sciencedirect.com/science/book/9780444899088
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2. 
Superconducting and low-temperature particle detectors proceedings of Symposium C on Superconducting and Low-Temperature Particle Detectors of the 1988 E-MRS Fall Conference, Strasbourg, France, 8-10 November 1988 için kapak resmi
Superconducting and low-temperature particle detectors proceedings of Symposium C on Superconducting and Low-Temperature Particle Detectors of the 1988 E-MRS Fall Conference, Strasbourg, France, 8-10 November 1988
Yazar 
Symposium C on Superconducting and Low-Temperature Particle Detectors (1988 : Strasbourg, France) Waysand, G. Chardin, G. European Materials Research Society. Meeting (1988 : Strasbourg, France)
Yer Numarası 
ONLINE
Elektronik Erişim 
ScienceDirect http://www.sciencedirect.com/science/book/9780444874146
Format: 
Durum 
Çevrimiçi Kütüphane~1
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