part Section I Devices -- chapter 1 Radiation Damage in Silicon / chapter 2 Radiation-Tolerant CMOS Single-Photon Imagers for Multiradiation Detection / chapter 3 Effects of Hydrogen on the Radiation Response of Field-Oxide Field-Effect Transistors and High-K Dielectrics / chapter 4 Novel Total Dose and Heavy-Ion Charge Collection Phenomena in a New SiGe HBT on Thin-Film SOI Technology -- chapter 5 Radiation-Hard Voltage and Current References in Standard CMOS Technologies / chapter 6 Nanocrystal Memories: An Evolutionary Approach to Flash Memory Scaling and a Class of Radiation-Tolerant Devices -- part Section II Circuits and Systems -- chapter 7 7Chapter Radiation Hardened by Design SRAM Strategies for TID and SEE Mitigation / chapter 8 8Chapter A Complete Guide to Multiple Upsets in SRAMs Processed in Decananometric CMOS Technologies / chapter 9 9Chapter Real-Time Soft Error Rate Characterization of Advanced SRAMs / chapter 10 1Chapter 0 Fault Tolerance Techniques and Reliability Modeling for SRAM-Based FPGAs / chapter 11 1Chapter 1 Assuring Robust Triple Modular Redundancy Protected Circuits in SRAM-Based FPGAs / chapter 12 1Chapter 2 SEU/SET Tolerant Phase-Locked Loops / chapter 13 1Chapter 3 Autonomous Detection and Characterization of Radiation-Induced Transients in Semiconductor Integrated Circuits -- chapter 14 Soft Errors in Digital Circuits: Overview and Protection Techniques for Digital Filters / chapter 15 Fault-Injection Techniques for Dependability Analysis: An Overview