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Wang, Zidong, 1966- author.
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Abou Houran, Mohamad editor
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Albertos, P., ed.
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American Institute of Chemical Engineers. Center for Chemical Process Safety, issuing body.
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Bouzid, Monia Ben Khader, editor.
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Fault location (Engineering)
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Electronic books.
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Fault location (Engineering).
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Machine learning.
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Adaptive control systems.
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1. 
DATA-DRIVEN FAULT DIAGNOSIS a machine learning approach for industrial components. için kapak resmi
DATA-DRIVEN FAULT DIAGNOSIS a machine learning approach for industrial components.
Yazar 
VASHISHTHA, GOVIND.
Yer Numarası 
Q325.5
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003614821
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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2. 
INTELLIGENT MACHINERY FAULT DIAGNOSTICS AND PROGNOSTICS the future of smart manufacturing için kapak resmi
INTELLIGENT MACHINERY FAULT DIAGNOSTICS AND PROGNOSTICS the future of smart manufacturing
Yazar 
Goyal, Deepam editor Sharma, Ankit (Professor of mechanical engineering), editor. Abou Houran, Mohamad editor
Yer Numarası 
TJ174
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003480822
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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3. 
Artificial intelligence in process fault diagnosis : methods for plant surveillance için kapak resmi
Artificial intelligence in process fault diagnosis : methods for plant surveillance
Yazar 
Fickelscherer, Richard J., author.
Yer Numarası 
TP155.75
Elektronik Erişim 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119825920
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4. 
Filter design for system modeling, state estimation and fault diagnosis için kapak resmi
Filter design for system modeling, state estimation and fault diagnosis
Yazar 
Wang, Ziyun, 1989- author. Wang, Yan, 1978- author. Ji, Zhicheng, 1959- author.
Yer Numarası 
TA168
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003327219
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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5. 
Filter-based fault diagnosis and remaining useful prediction için kapak resmi
Filter-based fault diagnosis and remaining useful prediction
Yazar 
Zhang, Yong, author. Wang, Zidong, 1966- author. Yuan, Ye, author.
Yer Numarası 
TA169.6
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003330998
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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6. 
Electrical and mechanical fault diagnosis in wind energy conversion systems için kapak resmi
Electrical and mechanical fault diagnosis in wind energy conversion systems
Yazar 
Bouzid, Monia Ben Khader, editor. Champenois, Gérard, editor.
Yer Numarası 
TJ820 .E44 2023
Elektronik Erişim 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781394236442
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7. 
State estimation and fault diagnosis under imperfect measurements için kapak resmi
State estimation and fault diagnosis under imperfect measurements
Yazar 
Liu, Yang (College teacher), author. Wang, Zidong, 1966- author. Zhou, Donghua, author.
Yer Numarası 
QA402.3
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003309482
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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8. 
Reliability modelling with information measures için kapak resmi
Reliability modelling with information measures
Yazar 
Nair, N. Unnikrishnan, 1945- author. Sunoj, S. M., 1972- author. Rajesh, G., 1971- author.
Yer Numarası 
TA169 .N3526 2022 EB
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003309635
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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9. 
Machine learning-based fault diagnosis for industrial engineering systems için kapak resmi
Machine learning-based fault diagnosis for industrial engineering systems
Yazar 
Yang, Rui (Professor of computer engineering), author. Zhong, Maiying, author.
Yer Numarası 
TA169.6
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003240754
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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10. 
Intelligent fault diagnosis and accommodation control için kapak resmi
Intelligent fault diagnosis and accommodation control
Yazar 
Huang, Sunan, 1962- author. Tan, Kok Kiong, 1967- author. Poi Voon Er, author. Lee, Tong Heng, 1958- author.
Yer Numarası 
TA169.6 .H83 2020 EB
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9780429263880
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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11. 
Advanced condition monitoring and fault diagnosis of electric machines için kapak resmi
Advanced condition monitoring and fault diagnosis of electric machines
Yazar 
Irfan, Muhammad, editor. IGI Global, publisher.
Yer Numarası 
ONLINE
Elektronik Erişim 
Chapter PDFs via platform: http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-5225-6989-3
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12. 
Recognizing and responding to normalization of deviance için kapak resmi
Recognizing and responding to normalization of deviance
Yazar 
American Institute of Chemical Engineers. Center for Chemical Process Safety, issuing body.
Yer Numarası 
TA169.5 .R43 2018
Elektronik Erişim 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119506638
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