Arama Sonuçlarını Sınırlandır
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European Materials Research Society.
(3)
IUMRS International Conference on Advanced Materials (3rd : 1993 : Tokyo, Japan)
(2)
Materials Research Society.
(2)
Siffert, P. (Paul)
(2)
Triboulet, R.
(2)
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Congresses.
(3)
Materials -- Congresses.
(3)
Semiconductors -- Congresses.
(3)
Silicon crystals -- Congresses.
(3)
Cadmium alloys.
(2)
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1. 
Nuclear and electron resonance spectroscopies applied to materials science : proceedings of the Materials Research Society Meeting. Nov. 1980, Copley Plaza Hotel, Boston, Mass. için kapak resmi
Nuclear and electron resonance spectroscopies applied to materials science : proceedings of the Materials Research Society Meeting. Nov. 1980, Copley Plaza Hotel, Boston, Mass.
Yazar 
Kaufmann, E. N., ed. Shenoy, G. K., ed.
Yer Numarası 
QC 762 N85 1981
Format: 
Durum 
Beytepe Kütüphanesi~1
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2. 
Scientific basis for nuclear waste management : proceedings of the ...November 1981, Boston,Mass için kapak resmi
Scientific basis for nuclear waste management : proceedings of the ...November 1981, Boston,Mass
Yazar 
Materials Research Society Annual Meeting (1881: Boston, Mass.)
Yer Numarası 
TD 898 M375 1981
Format: 
Durum 
Beytepe Kütüphanesi~1
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Kopya:
3. 
Amorphous and heterogeneous silicon thin films : Fundamentals to devices, 1999 : Symposium held April 5-9, 1999, San Francisco, California, U.S.A. için kapak resmi
Amorphous and heterogeneous silicon thin films : Fundamentals to devices, 1999 : Symposium held April 5-9, 1999, San Francisco, California, U.S.A.
Yazar 
Branz, Howard M., ed. Materials Research Society Symposium (1999 : San Francisco, Calif.)
Yer Numarası 
TK 7871.99.A45 A444 1999
Format: 
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Beytepe Kütüphanesi~1
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4. 
Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992 için kapak resmi
Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992
Yazar 
Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control (1992 : Strasbourg, France) Crean, G. M. Stuck, R. Woollam, John A. European Materials Research Society.
Yer Numarası 
ONLINE
Elektronik Erişim 
ScienceDirect http://www.sciencedirect.com/science/book/9780444899088
Format: 
Durum 
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5. 
High TC superconductor materials proceedings of Symposium A on High TC Superconductor Materials of the 1990 E-MRS spring conference, Strasbourg, France, 29 May-1 June 1990. Part A için kapak resmi
High TC superconductor materials proceedings of Symposium A on High TC Superconductor Materials of the 1990 E-MRS spring conference, Strasbourg, France, 29 May-1 June 1990. Part A
Yazar 
Symposium A on High Tc Superconductor Materials (1990 : Strasbourg, France) Habermeier, H.-U. Kaldis, Emanuel. Schoenes, J. European Materials Research Society.
Yer Numarası 
ONLINE
Elektronik Erişim 
ScienceDirect http://www.sciencedirect.com/science/book/9780444888846
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6. 
Superconducting and low-temperature particle detectors proceedings of Symposium C on Superconducting and Low-Temperature Particle Detectors of the 1988 E-MRS Fall Conference, Strasbourg, France, 8-10 November 1988 için kapak resmi
Superconducting and low-temperature particle detectors proceedings of Symposium C on Superconducting and Low-Temperature Particle Detectors of the 1988 E-MRS Fall Conference, Strasbourg, France, 8-10 November 1988
Yazar 
Symposium C on Superconducting and Low-Temperature Particle Detectors (1988 : Strasbourg, France) Waysand, G. Chardin, G. European Materials Research Society. Meeting (1988 : Strasbourg, France)
Yer Numarası 
ONLINE
Elektronik Erişim 
ScienceDirect http://www.sciencedirect.com/science/book/9780444874146
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Durum 
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7. 
CdTe and related compounds physics, defects, hetero- and nanostructures, crystal growth surfaces and applications için kapak resmi
CdTe and related compounds physics, defects, hetero- and nanostructures, crystal growth surfaces and applications
Yazar 
Triboulet, R. Siffert, P. (Paul)
Yer Numarası 
ONLINE
Elektronik Erişim 
ScienceDirect http://www.sciencedirect.com/science/book/9780080965130
Format: 
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8. 
CdTe and related compounds physics, defects, technology, hetero- and nanostructures and applications : physics, CdTe-based nanostructures, and semimagnetic semiconductors, defects için kapak resmi
CdTe and related compounds physics, defects, technology, hetero- and nanostructures and applications : physics, CdTe-based nanostructures, and semimagnetic semiconductors, defects
Yazar 
Triboulet, R. Siffert, P. (Paul)
Yer Numarası 
ONLINE
Elektronik Erişim 
ScienceDirect http://www.sciencedirect.com/science/book/9780080464091
Format: 
Durum 
Çevrimiçi Kütüphane~1
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9. 
Ion Beam Processing of Materials and Deposition Processes of Protective Coatings Proceedings of Symposium C, Symposium J and Symposium H of the 1995 E-Mrs Spring Conference, Strasbourg, France, May 22-26, 1995 için kapak resmi
Ion Beam Processing of Materials and Deposition Processes of Protective Coatings Proceedings of Symposium C, Symposium J and Symposium H of the 1995 E-Mrs Spring Conference, Strasbourg, France, May 22-26, 1995
Yazar 
Symposium J on Correlated Effects in Atomic and Cluster Ion Bombardment and Implantation (1995 : Strasbourg, France) Hemment, P. L. F. (Peter L. F.)
Yer Numarası 
ONLINE
Elektronik Erişim 
ScienceDirect http://www.sciencedirect.com/science/book/9780444824103
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Durum 
Çevrimiçi Kütüphane~1
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10. 
C, H, N and O in Si and Characterization and Simulation of Materials and Processes Proceedings of Symposium N and Symposium G of the 1995 E-Mrs Spring Conference, Held in Strasbourg, France, 22-26 May 1995 için kapak resmi
C, H, N and O in Si and Characterization and Simulation of Materials and Processes Proceedings of Symposium N and Symposium G of the 1995 E-Mrs Spring Conference, Held in Strasbourg, France, 22-26 May 1995
Yazar 
Symposium N on Carbon, Hydrogen, Nitrogen, and Oxygen in Silicon and Other Elemental Semiconductors (1995 : Strasbourg, France) Borghesi, A. Symposium G on Atomic Scale Characterization and Simulation of Materials and Processes (1995 : Strasbourg, France)
Yer Numarası 
ONLINE
Elektronik Erişim 
ScienceDirect http://www.sciencedirect.com/science/book/9780444824134
Format: 
Durum 
Çevrimiçi Kütüphane~1
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11. 
Small scale structures proceedings of Symposium A on Microstructuring and Microsystems, Symposium B on Materials for Sensors: Functional Nanoscaled Structures, and Symposium E on Structure and Properties of Metallic Thin Films and Multilayers of the 1995 E-MRS Spring Conference, Strasbourg, France, May 22-26, 1995 için kapak resmi
Small scale structures proceedings of Symposium A on Microstructuring and Microsystems, Symposium B on Materials for Sensors: Functional Nanoscaled Structures, and Symposium E on Structure and Properties of Metallic Thin Films and Multilayers of the 1995 E-MRS Spring Conference, Strasbourg, France, May 22-26, 1995
Yazar 
Symposium A on Microstructuring and Microsystems (1995 : Strasbourg, France) Rooij, N. F. de. Symposium B on Materials for Sensors: Functional Nanoscaled Structures (1995 : Strasbourg, France) Symposium E on Structure and Properties of Metallic Thin Films and Multilayers (1995 : Strasbourg, France)
Yer Numarası 
ONLINE
Elektronik Erişim 
ScienceDirect http://www.sciencedirect.com/science/book/9780444823120
Format: 
Durum 
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12. 
Nuclear materials for fission reactors proceedings of Symposium E on Nuclear Materials for Fission Reactors of the 1991 E-MRS Fall Conference, Strasbourg, France, November 4-7, 1991 için kapak resmi
Nuclear materials for fission reactors proceedings of Symposium E on Nuclear Materials for Fission Reactors of the 1991 E-MRS Fall Conference, Strasbourg, France, November 4-7, 1991
Yazar 
Symposium E on Nuclear Materials for Fission Reactors (1991 : Strasbourg, France) Matzke, Hj., 1936- Schumacher, G.
Yer Numarası 
ONLINE
Elektronik Erişim 
ScienceDirect http://www.sciencedirect.com/science/book/9780444895714
Format: 
Durum 
Çevrimiçi Kütüphane~1
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