part, SECTION I: Fabrication and Technology -- chapter 1 Trends and Projections for the Future of Scaling and Future Integration -- chapter 2 CMOS Circuits -- chapter 3 High-Speed, Low-Power Emitter Coupled Logic Circuits -- chapter 4 Price-Performance of Computer Technology -- part, SECTION II: Memory and Storage -- chapter 5 Semiconductor Memory Circuits -- chapter 6 Semiconductor Storage Devices in Computing and Consumer -- part, SECTION III: Design Techniques -- chapter 7 Timing and Clocking -- chapter 8 Multiple-Valued Logic Circuits -- chapter 9 FPGAs for Rapid Prototyping -- chapter 10 Issues in High-Frequency Processor Design -- chapter 11 Computer Arithmetic -- part, SECTION IV: Design for Low Power -- chapter 12 Design for Low Power -- chapter 13 Low-Power Circuit Technologies -- chapter 14 Techniques for Leakage Power Reduction -- chapter 15 Dynamic Voltage Scaling -- chapter 16 Lightweight Embedded Systems -- chapter 17 Low-Power Design of Systems on Chip -- chapter 18 Implementation-Level Impact on Low-Power Design -- chapter 19 Accurate Power Estimation of Combinational CMOS Digital Circuits -- chapter 20 Clock-Powered CMOS for Energy-Efficient Computing -- part, SECTION V: Testing and Design for Testability -- chapter 21 System-on-Chip (SoC) Testing: Current Practices and Challenges -- chapter 22 Test Technology for Sequential Circuits -- chapter 23 Scan Testing -- chapter 24 Computer-Aided Analysis and Forecast of Integrated Circuit Yield.