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(8)
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(8)
Coppens, Bart. editor. (orcid)0000-0002-7628-9264
(4)
Volckaert, Bruno. editor. (orcid)0000-0003-0575-5894
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1. 
Reliability Engineering for Industrial Processes An Analytics Perspective için kapak resmi
Reliability Engineering for Industrial Processes An Analytics Perspective
Yazar 
Kapur, P. K. editor. (orcid)0000-0001-8006-5952 Pham, Hoang. editor. Singh, Gurinder. editor. (orcid)0000-0002-7827-1578 Kumar, Vivek. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-031-55048-5
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2. 
Applied OSS Reliability Assessment Modeling, AI and Tools Mathematics and AI for OSS Reliability Assessment için kapak resmi
Applied OSS Reliability Assessment Modeling, AI and Tools Mathematics and AI for OSS Reliability Assessment
Yazar 
Tamura, Yoshinobu. author. (orcid)0000-0001-7665-5765 Yamada, Shigeru. author. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-031-64803-8
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Durum 
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3. 
Availability, Reliability and Security ARES 2025 International Workshops, Ghent, Belgium, August 11-14, 2025, Proceedings, Part II için kapak resmi
Availability, Reliability and Security ARES 2025 International Workshops, Ghent, Belgium, August 11-14, 2025, Proceedings, Part II
Yazar 
Coppens, Bart. editor. (orcid)0000-0002-7628-9264 Volckaert, Bruno. editor. (orcid)0000-0003-0575-5894 Naessens, Vincent. editor. (orcid)0000-0002-9255-4902 De Sutter, Bjorn. editor. (orcid)0000-0003-0317-2089 SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-032-00633-2
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Durum 
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4. 
Availability, Reliability and Security ARES 2025 EU Projects Symposium Workshops, Ghent, Belgium, August 11-14, 2025, Proceedings, Part II için kapak resmi
Availability, Reliability and Security ARES 2025 EU Projects Symposium Workshops, Ghent, Belgium, August 11-14, 2025, Proceedings, Part II
Yazar 
Skopik, Florian. editor. (orcid)0000-0002-1922-7892 Naessens, Vincent. editor. (orcid)0000-0002-9255-4902 De Sutter, Bjorn. editor. (orcid)0000-0003-0317-2089 SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-032-00644-8
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5. 
Availability, Reliability and Security 20th International Conference, ARES 2025, Ghent, Belgium, August 11-14, 2025, Proceedings, Part II için kapak resmi
Availability, Reliability and Security 20th International Conference, ARES 2025, Ghent, Belgium, August 11-14, 2025, Proceedings, Part II
Yazar 
Dalla Preda, Mila. editor. (orcid)0000-0003-2761-4347 Schrittwieser, Sebastian. editor. (orcid)0000-0003-2115-2022 Naessens, Vincent. editor. (orcid)0000-0002-9255-4902 De Sutter, Bjorn. editor. (orcid)0000-0003-0317-2089 SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-032-00627-1
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6. 
Availability, Reliability and Security ARES 2025 International Workshops, Ghent, Belgium, August 11-14, 2025, Proceedings, Part I için kapak resmi
Availability, Reliability and Security ARES 2025 International Workshops, Ghent, Belgium, August 11-14, 2025, Proceedings, Part I
Yazar 
Coppens, Bart. editor. (orcid)0000-0002-7628-9264 Volckaert, Bruno. editor. (orcid)0000-0003-0575-5894 Naessens, Vincent. editor. (orcid)0000-0002-9255-4902 De Sutter, Bjorn. editor. (orcid)0000-0003-0317-2089 SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-032-00630-1
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7. 
Availability, Reliability and Security ARES 2025 International Workshops, Ghent, Belgium, August 11-14, 2025, Proceedings, Part III için kapak resmi
Availability, Reliability and Security ARES 2025 International Workshops, Ghent, Belgium, August 11-14, 2025, Proceedings, Part III
Yazar 
Coppens, Bart. editor. (orcid)0000-0002-7628-9264 Volckaert, Bruno. editor. (orcid)0000-0003-0575-5894 Naessens, Vincent. editor. (orcid)0000-0002-9255-4902 De Sutter, Bjorn. editor. (orcid)0000-0003-0317-2089 SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-032-00635-6
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8. 
Availability, Reliability and Security ARES 2025 International Workshops, Ghent, Belgium, August 11-14, 2025, Proceedings, Part IV için kapak resmi
Availability, Reliability and Security ARES 2025 International Workshops, Ghent, Belgium, August 11-14, 2025, Proceedings, Part IV
Yazar 
Coppens, Bart. editor. (orcid)0000-0002-7628-9264 Volckaert, Bruno. editor. (orcid)0000-0003-0575-5894 Naessens, Vincent. editor. (orcid)0000-0002-9255-4902 De Sutter, Bjorn. editor. (orcid)0000-0003-0317-2089 SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-032-00639-4
Format: 
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9. 
Availability, Reliability and Security ARES 2025 EU Projects Symposium Workshops, Ghent, Belgium, August 11-14, 2025, Proceedings, Part I için kapak resmi
Availability, Reliability and Security ARES 2025 EU Projects Symposium Workshops, Ghent, Belgium, August 11-14, 2025, Proceedings, Part I
Yazar 
Skopik, Florian. editor. (orcid)0000-0002-1922-7892 Naessens, Vincent. editor. (orcid)0000-0002-9255-4902 De Sutter, Bjorn. editor. (orcid)0000-0003-0317-2089 SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-032-00642-4
Format: 
Durum 
Çevrimiçi Kütüphane~1
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Kopya:
10. 
Availability, Reliability and Security 20th International Conference, ARES 2025, Ghent, Belgium, August 11-14, 2025, Proceedings, Part I için kapak resmi
Availability, Reliability and Security 20th International Conference, ARES 2025, Ghent, Belgium, August 11-14, 2025, Proceedings, Part I
Yazar 
Dalla Preda, Mila. editor. (orcid)0000-0003-2761-4347 Schrittwieser, Sebastian. editor. (orcid)0000-0003-2115-2022 Naessens, Vincent. editor. (orcid)0000-0002-9255-4902 De Sutter, Bjorn. editor. (orcid)0000-0003-0317-2089 SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-032-00624-0
Format: 
Durum 
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11. 
Quality, Reliability, Security and Robustness in Heterogeneous Systems 19th EAI International Conference, QShine 2023, Shenzhen, China, October 8 - 9, 2023, Proceedings, Part II için kapak resmi
Quality, Reliability, Security and Robustness in Heterogeneous Systems 19th EAI International Conference, QShine 2023, Shenzhen, China, October 8 - 9, 2023, Proceedings, Part II
Yazar 
Leung, Victor C.M. editor. Li, Hezhang. editor. Hu, Xiping. editor. Ning, Zhaolong. editor. (orcid)0000-0002-7870-5524 SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-031-65123-6
Format: 
Durum 
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12. 
Quality, Reliability, Security and Robustness in Heterogeneous Systems 19th EAI International Conference, QShine 2023, Shenzhen, China, October 8 - 9, 2023, Proceedings, Part I için kapak resmi
Quality, Reliability, Security and Robustness in Heterogeneous Systems 19th EAI International Conference, QShine 2023, Shenzhen, China, October 8 - 9, 2023, Proceedings, Part I
Yazar 
Leung, Victor C.M. editor. Li, Hezhang. editor. Hu, Xiping. editor. Ning, Zhaolong. editor. (orcid)0000-0002-7870-5524 SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-031-65126-7
Format: 
Durum 
Çevrimiçi Kütüphane~1
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