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SpringerLink (Online service)
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Abran, Alain. editor.
(3)
Braungarten, René. editor.
(3)
Cuadrado-Gallego, Juan J. editor.
(3)
Dumke, Reiner R. editor.
(3)
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13. 
Topics in Performance Evaluation, Measurement and Characterization Third TPC Technology Conference, TPCTC 2011, Seattle, WA, USA, August 29-September 3, 2011, Revised Selected Papers için kapak resmi
Topics in Performance Evaluation, Measurement and Characterization Third TPC Technology Conference, TPCTC 2011, Seattle, WA, USA, August 29-September 3, 2011, Revised Selected Papers
Yazar 
Nambiar, Raghunath. editor. Poess, Meikel. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
http://dx.doi.org/10.1007/978-3-642-32627-1
Format: 
Durum 
Çevrimiçi Kütüphane~1
Rafta:
Kopya:
14. 
Passive and Active Measurement 13th International Conference, PAM 2012, Vienna, Austria, March 12-14th, 2012. Proceedings için kapak resmi
Passive and Active Measurement 13th International Conference, PAM 2012, Vienna, Austria, March 12-14th, 2012. Proceedings
Yazar 
Taft, Nina. editor. Ricciato, Fabio. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
http://dx.doi.org/10.1007/978-3-642-28537-0
Format: 
Durum 
Çevrimiçi Kütüphane~1
Rafta:
Kopya:
15. 
Measurement, Modelling, and Evaluation of Computing Systems and Dependability and Fault Tolerance 16th International GI/ITG Conference, MMB & DFT 2012, Kaiserslautern, Germany, March 19-21, 2012. Proceedings için kapak resmi
Measurement, Modelling, and Evaluation of Computing Systems and Dependability and Fault Tolerance 16th International GI/ITG Conference, MMB & DFT 2012, Kaiserslautern, Germany, March 19-21, 2012. Proceedings
Yazar 
Schmitt, Jens B. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
http://dx.doi.org/10.1007/978-3-642-28540-0
Format: 
Durum 
Çevrimiçi Kütüphane~1
Rafta:
Kopya:
16. 
Performance Evaluation, Measurement and Characterization of Complex Systems Second TPC Technology Conference, TPCTC 2010, Singapore, September 13-17, 2010. Revised Selected Papers için kapak resmi
Performance Evaluation, Measurement and Characterization of Complex Systems Second TPC Technology Conference, TPCTC 2010, Singapore, September 13-17, 2010. Revised Selected Papers
Yazar 
Nambiar, Raghunath. editor. Poess, Meikel. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
http://dx.doi.org/10.1007/978-3-642-18206-8
Format: 
Durum 
Çevrimiçi Kütüphane~1
Rafta:
Kopya:
17. 
Passive and Active Measurement 12th International Conference, PAM 2011, Atlanta, GA, USA, March 20-22, 2011. Proceedings için kapak resmi
Passive and Active Measurement 12th International Conference, PAM 2011, Atlanta, GA, USA, March 20-22, 2011. Proceedings
Yazar 
Spring, Neil. editor. Riley, George F. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
http://dx.doi.org/10.1007/978-3-642-19260-9
Format: 
Durum 
Çevrimiçi Kütüphane~1
Rafta:
Kopya:
18. 
Passive and Active Measurement 11th International Conference, PAM 2010, Zurich, Switzerland, April 7-9, 2010. Proceedings için kapak resmi
Passive and Active Measurement 11th International Conference, PAM 2010, Zurich, Switzerland, April 7-9, 2010. Proceedings
Yazar 
Krishnamurthy, Arvind. editor. Plattner, Bernhard. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
http://dx.doi.org/10.1007/978-3-642-12334-4
Format: 
Durum 
Çevrimiçi Kütüphane~1
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19. 
Measurement, Modelling, and Evaluation of Computing Systems and Dependability and Fault Tolerance 15th International GI/ITG Conference, MMB&DFT 2010, Essen, Germany, March 15-17, 2010. Proceedings için kapak resmi
Measurement, Modelling, and Evaluation of Computing Systems and Dependability and Fault Tolerance 15th International GI/ITG Conference, MMB&DFT 2010, Essen, Germany, March 15-17, 2010. Proceedings
Yazar 
Müller-Clostermann, Bruno. editor. Echtle, Klaus. editor. Rathgeb, Erwin P. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
http://dx.doi.org/10.1007/978-3-642-12104-3
Format: 
Durum 
Çevrimiçi Kütüphane~1
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20. 
Passive and Active Network Measurement 10th International Conference, PAM 2009, Seoul, Korea, April 1-3, 2009. Proceedings için kapak resmi
Passive and Active Network Measurement 10th International Conference, PAM 2009, Seoul, Korea, April 1-3, 2009. Proceedings
Yazar 
Moon, Sue B. editor. Teixeira, Renata. editor. Uhlig, Steve. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
http://dx.doi.org/10.1007/978-3-642-00975-4
Format: 
Durum 
Çevrimiçi Kütüphane~1
Rafta:
Kopya:
21. 
Software Process and Product Measurement International Conferences IWSM 2009 and Mensura 2009 Amsterdam, The Netherlands, November 4-6, 2009. Proceedings için kapak resmi
Software Process and Product Measurement International Conferences IWSM 2009 and Mensura 2009 Amsterdam, The Netherlands, November 4-6, 2009. Proceedings
Yazar 
Abran, Alain. editor. Braungarten, René. editor. Dumke, Reiner R. editor. Cuadrado-Gallego, Juan J. editor. Brunekreef, Jacob. editor.
Yer Numarası 
ONLINE
Elektronik Erişim 
http://dx.doi.org/10.1007/978-3-642-05415-0
Format: 
Durum 
Çevrimiçi Kütüphane~1
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22. 
The IT Measurement Compendium Estimating and Benchmarking Success with Functional Size Measurement için kapak resmi
The IT Measurement Compendium Estimating and Benchmarking Success with Functional Size Measurement
Yazar 
Bundschuh, Manfred. author. Dekkers, Carol. author. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
http://dx.doi.org/10.1007/978-3-540-68188-5
Format: 
Durum 
Çevrimiçi Kütüphane~1
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23. 
Passive and Active Network Measurement 9th International Conference, PAM 2008, Cleveland, OH, USA, April 29-30, 2008. Proceedings için kapak resmi
Passive and Active Network Measurement 9th International Conference, PAM 2008, Cleveland, OH, USA, April 29-30, 2008. Proceedings
Yazar 
Claypool, Mark. editor. Uhlig, Steve. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
http://dx.doi.org/10.1007/978-3-540-79232-1
Format: 
Durum 
Çevrimiçi Kütüphane~1
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24. 
Software Process and Product Measurement International Conferences IWSM 2008, Metrikon 2008, and Mensura 2008 Munich, Germany, November 18-19, 2008. Proceedings için kapak resmi
Software Process and Product Measurement International Conferences IWSM 2008, Metrikon 2008, and Mensura 2008 Munich, Germany, November 18-19, 2008. Proceedings
Yazar 
Dumke, Reiner R. editor. Braungarten, René. editor. Büren, Günter. editor. Abran, Alain. editor. Cuadrado-Gallego, Juan J. editor.
Yer Numarası 
ONLINE
Elektronik Erişim 
http://dx.doi.org/10.1007/978-3-540-89403-2
Format: 
Durum 
Çevrimiçi Kütüphane~1
Rafta:
Kopya: