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SpringerLink (Online service)

(4)

Malacara, Daniel, 1937-

(3)

Burgess, C. (Christopher)

(2)

Council for Optical Radiation Measurements (U.S.)

(2)

Gåsvik, Kjell J.

(2)

Ultraviolet Spectrometry Group (Great Britain)

(2)

Bellini, Marco, 1967-

(1)

Budker, Dmitry.

(1)

Bukshtab, Michael. author.

(1)

(1)

Cremers, Daniel. editor.

(1)

De Natale, Paolo.

(1)

Donlon, Craig J., editor of compilation.

(1)

Dufrn̊e, Yves.

(1)

(1)

Hack, Erwin, editor.

(1)

(1)

Harding, Kevin G.

(1)

Jackson Kimball, Derek F.

(1)

(1)

John Wiley & Sons.

(1)

Johnsen, Sönke, author.

(1)

Jones, D. G. (Dianna G.)

(1)

Lay-Ekuakille, Aimé. author.

(1)

Maddaloni, Pasquale.

(1)

Malacara, Zacarias, 1948-

(1)

Marcuse, Dietrich, 1929-

(1)

(1)

(1)

Osten, Wolfgang.

(1)

Padilla, J. Moisés (José Moisés), author.

(1)

Parr, A. C. (Albert C.), editor of compilation.

(1)

Peiponen, K.-E (Kai-Erik), 1954-

(1)

Prasankumar, Rohit P.

(1)

Proulx, Tom. editor.

(1)

Quiroga, J. Antonio (Juan Antonio), author.

(1)

Rastogi, P. K. (Pramod K.)

(1)

Rastogi, Pramod K., 1951- editor.

(1)

Reid, Ian. editor.

(1)

Reingand, Nadya.

(1)

Rodriguez, Vincent.

(1)

Saito, Hideo. editor.

(1)

Servn̕, Manuel.

(1)

Servín, Manuel, author.

(1)

Silvennoinen, Raimo.

(1)

(1)

Sutton, Michael Albert, 1950-

(1)

Taylor, Antoinette J., 1956-

(1)

Tuchin, V. V. (Valeri? Viktorovich)

(1)

Tyson, Robert K., 1948-

(1)

Vaezi-Nejad, S. M., ed.

(1)

Verbiest, Thierry.

(1)

Wiley InterScience (Online service)

(1)

Yang, Ming-Hsuan. editor.

(1)

Yoshizawa, T?ru, 1939-

(1)

Zibordi, Giuseppe, editor of compilation.

(1)

Tümünü genişlet

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(33)

Yayın Yılı

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(6)

(4)

(4)

(3)

(2)

(2)

(2)

(2)

(2)

(2)

(2)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

Tümünü genişlet

Konu

Optical measurements.

(18)

Interferometry.

(3)

(2)

Image analysis.

(2)

Interferometers.

(2)

(2)

Optical measurements -- Handbooks, manuals, etc.

(2)

(2)

Solids -- Optical properties.

(2)

Spectrophotometry -- Congresses.

(2)

Spectrum analysis.

(2)

Atmosphere -- Laser observations.

(1)

(1)

Blood sugar monitoring -- Handbooks, manuals, etc.

(1)

Chemical detectors.

(1)

Climatology -- Measurement.

(1)

(1)

Colorimetry -- Congresses.

(1)

(1)

Computer vision.

(1)

Conducting polymers.

(1)

(1)

Diagnosis, Noninvasive -- Handbooks, manuals, etc.

(1)

Diffraction patterns -- Data processing.

(1)

Diffraction patterns.

(1)

Dimensional analysis -- Handbooks, manuals, etc.

(1)

Electronic books.

(1)

Electrophoretic deposition.

(1)

Engineering mathematics.

(1)

Frequencies of oscillating systems -- Measurement.

(1)

(1)

Image processing -- Digital techniques.

(1)

Interferometry -- Mathematics.

(1)

(1)

Lasers -- Scientific applications.

(1)

(1)

Luminescence -- Measurement -- Congresses.

(1)

Magnetic fields -- Measurement.

(1)

Magnetic instruments.

(1)

Materials -- Analysis -- Technique.

(1)

Materials -- Optical properties.

(1)

Measurement -- Handbooks, manuals, etc.

(1)

(1)

Metrology -- Handbooks, manuals, etc.

(1)

(1)

(1)

Microwaves, RF and Optical Engineering.

(1)

Molecular structure -- Optical aspects.

(1)

(1)

Nanotechnology and Microengineering.

(1)

Near infrared spectroscopy -- Handbooks, manuals, etc.

(1)

Nonlinear optics.

(1)

Numerical and Computational Physics.

(1)

Oceanography -- Measurement.

(1)

Optical Phenomena.

(1)

Optical and Electronic Materials.

(1)

Optical data processing.

(1)

Optical detectors -- Handbooks, manuals, etc.

(1)

Optical detectors.

(1)

Optical fiber detectors.

(1)

Optical materials.

(1)

Optical measurements -- Technique.

(1)

Optical radiometry -- Congresses.

(1)

Optical radiometry.

(1)

Optical tomography.

(1)

Optical wave guides -- Measurement.

(1)

Optics, Adaptive.

(1)

Optics, Optoelectronics, Plasmonics and Optical Devices.

(1)

Organic compounds.

(1)

(1)

Photoelectricity.

(1)

Physical optics.

(1)

Physiological optics.

(1)

Polarization (Light)

(1)

Radiation -- Measurement.

(1)

Second harmonic generation.

(1)

Solids -- Mechanical properties.

(1)

Specular reflectance -- Measurement.

(1)

Specular reflectance.

(1)

Surfaces (Physics).

(1)

Surfaces (Technology) -- Analysis -- Technique.

(1)

Thin film devices.

(1)

Time measurements.

(1)

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13.

Handbook of optical dimensional metrology için kapak resmi

Handbook of optical dimensional metrology

Handbook of optical dimensional metrology

Yazar

Harding, Kevin G.

Yer Numarası

ONLINE

Elektronik Erişim

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14.

Laser-based measurements for time and frequency domain applications a handbook için kapak resmi

Laser-based measurements for time and frequency domain applications a handbook

Laser-based measurements for time and frequency domain applications a handbook

Yazar

Maddaloni, Pasquale. Bellini, Marco, 1967- De Natale, Paolo.

Yer Numarası

ONLINE

Elektronik Erişim

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15.

The Optics of Life : a Biologist's Guide to Light in Nature için kapak resmi

The Optics of Life : a Biologist's Guide to Light in Nature

The Optics of Life : a Biologist's Guide to Light in Nature

Yazar

Johnsen, Sönke, author.

Yer Numarası

ONLINE

Elektronik Erişim

http://www.jstor.org/stable/10.2307/j.ctt7s4q4

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16.

Optical methods for solid mechanics : a full-field approach için kapak resmi

Optical methods for solid mechanics : a full-field approach

Optical methods for solid mechanics : a full-field approach

Yazar

Rastogi, P. K. (Pramod K.) Hack, Erwin.

Yer Numarası

QC367 O68 2012

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17.

Optical imaging and metrology advanced technologies için kapak resmi

Optical imaging and metrology advanced technologies

Optical imaging and metrology advanced technologies

Yazar

Osten, Wolfgang. Reingand, Nadya.

Yer Numarası

ONLINE

Elektronik Erişim

Connect to MyiLibrary resource.
http://public.eblib.com/EBLPublic/PublicView.do?ptiID=947916
Wiley http://dx.doi.org/10.1002/9783527648443
http://site.ebrary.com/lib/alltitles/Doc?id=10575536

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18.

Optical techniques for solid-state materials characterization için kapak resmi

Optical techniques for solid-state materials characterization

Optical techniques for solid-state materials characterization

Yazar

Prasankumar, Rohit P. Taylor, Antoinette J., 1956-

Yer Numarası

ONLINE

Elektronik Erişim

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19.

Diffuse optical tomography principles and applications için kapak resmi

Diffuse optical tomography principles and applications

Diffuse optical tomography principles and applications

Yazar

Jiang, Huabei.

Yer Numarası

ONLINE

Elektronik Erişim

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20.

Life at the nanoscale atomic force microscopy of live cells için kapak resmi

Life at the nanoscale atomic force microscopy of live cells

Life at the nanoscale atomic force microscopy of live cells

Yazar

Dufrn̊e, Yves.

Yer Numarası

ONLINE

Elektronik Erişim

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21.

Optical methods of measurement wholefield techniques için kapak resmi

Optical methods of measurement wholefield techniques

Optical methods of measurement wholefield techniques

Yazar

Sirohi, R. S.

Yer Numarası

ONLINE

Elektronik Erişim

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22.

Second-order nonlinear optical characterization techniques an introduction için kapak resmi

Second-order nonlinear optical characterization techniques an introduction

Second-order nonlinear optical characterization techniques an introduction

Yazar

Verbiest, Thierry. Clays, Koen. Rodriguez, Vincent.

Yer Numarası

ONLINE

Elektronik Erişim

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23.

Handbook of optical metrology principles and applications için kapak resmi

Handbook of optical metrology principles and applications

Handbook of optical metrology principles and applications

Yazar

Yoshizawa, T?ru, 1939-

Yer Numarası

ONLINE

Elektronik Erişim

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24.

Image correlation for shape, motion and deformation measurements : basic concepts, theory and applications için kapak resmi

Image correlation for shape, motion and deformation measurements : basic concepts, theory and applications

Image correlation for shape, motion and deformation measurements : basic concepts, theory and applications

Yazar

Sutton, Michael Albert, 1950-

Yer Numarası

TA1637 S88 2009

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