Search Results for Neural Networks (Computer).

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13.

Formal Methods 25th International Symposium, FM 2023, Lübeck, Germany, March 6-10, 2023, Proceedings

Yazar

Chechik, Marsha. editor. Katoen, Joost-Pieter. editor. Leucker, Martin. editor. SpringerLink (Online service)

Yer Numarası

XX(520889.1)

Elektronik Erişim

https://doi.org/10.1007/978-3-031-27481-7

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14.

AIxIA 2022 - Advances in Artificial Intelligence XXIst International Conference of the Italian Association for Artificial Intelligence, AIxIA 2022, Udine, Italy, November 28 - December 2, 2022, Proceedings

Yazar

Dovier, Agostino. editor. Montanari, Angelo. editor. Orlandini, Andrea. editor. SpringerLink (Online service)

Yer Numarası

XX(520898.1)

Elektronik Erişim

https://doi.org/10.1007/978-3-031-27181-6

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15.

Computer Science and Education in Computer Science 19th EAI International Conference, CSECS 2023, Boston, MA, USA, June 28-29, 2023, Proceedings

Yazar

Zlateva, Tanya. editor. Tuparov, Georgi. editor. SpringerLink (Online service)

Yer Numarası

XX(520698.1)

Elektronik Erişim

https://doi.org/10.1007/978-3-031-44668-9

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16.

Multi-disciplinary Trends in Artificial Intelligence 16th International Conference, MIWAI 2023, Hyderabad, India, July 21-22, 2023, Proceedings

Yazar

Morusupalli, Raghava. editor. Dandibhotla, Teja Santosh. editor. Atluri, Vani Vathsala. editor. Windridge, David. editor. Lingras, Pawan. editor.

Yer Numarası

XX(521001.1)

Elektronik Erişim

https://doi.org/10.1007/978-3-031-36402-0

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17.

Pattern Recognition and Image Analysis 11th Iberian Conference, IbPRIA 2023, Alicante, Spain, June 27-30, 2023, Proceedings

Yazar

Pertusa, Antonio. editor. Gallego, Antonio Javier. editor. Sánchez, Joan Andreu. editor. Domingues, Inês. editor. SpringerLink (Online service)

Yer Numarası

XX(521002.1)

Elektronik Erişim

https://doi.org/10.1007/978-3-031-36616-1

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18.

Pattern Recognition 7th Asian Conference, ACPR 2023, Kitakyushu, Japan, November 5-8, 2023, Proceedings, Part I

Yazar

Lu, Huimin. editor. Blumenstein, Michael. editor. Cho, Sung-Bae. editor. Liu, Cheng-Lin. editor. Yagi, Yasushi. editor.

Yer Numarası

XX(521317.1)

Elektronik Erişim

https://doi.org/10.1007/978-3-031-47634-1

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19.

Pattern Recognition 7th Asian Conference, ACPR 2023, Kitakyushu, Japan, November 5-8, 2023, Proceedings, Part II

Yazar

Lu, Huimin. editor. Blumenstein, Michael. editor. Cho, Sung-Bae. editor. Liu, Cheng-Lin. editor. Yagi, Yasushi. editor.

Yer Numarası

XX(521318.1)

Elektronik Erişim

https://doi.org/10.1007/978-3-031-47637-2

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20.

Pattern Recognition 7th Asian Conference, ACPR 2023, Kitakyushu, Japan, November 5-8, 2023, Proceedings, Part III

Yazar

Lu, Huimin. editor. Blumenstein, Michael. editor. Cho, Sung-Bae. editor. Liu, Cheng-Lin. editor. Yagi, Yasushi. editor.

Yer Numarası

XX(521319.1)

Elektronik Erişim

https://doi.org/10.1007/978-3-031-47665-5

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21.

Formal Methods and Software Engineering 24th International Conference on Formal Engineering Methods, ICFEM 2023, Brisbane, QLD, Australia, November 21-24, 2023, Proceedings

Yazar

Li, Yi. editor. Tahar, Sofiène. editor. SpringerLink (Online service)

Yer Numarası

XX(521324.1)

Elektronik Erişim

https://doi.org/10.1007/978-981-99-7584-6

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22.

Recent Challenges in Intelligent Information and Database Systems 15th Asian Conference, ACIIDS 2023, Phuket, Thailand, July 24-26, 2023, Proceedings

Yazar

Nguyen, Ngoc Thanh. editor. Boonsang, Siridech. editor. Fujita, Hamido. editor. (orcid) Hnatkowska, Bogumiła. editor. Hong, Tzung-Pei. editor. (orcid)

Yer Numarası

XX(520782.1)

Elektronik Erişim

https://doi.org/10.1007/978-3-031-42430-4

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23.

Artificial Intelligence and Soft Computing 21st International Conference, ICAISC 2022, Zakopane, Poland, June 19-23, 2022, Proceedings, Part II

Yazar

Rutkowski, Leszek. editor. Scherer, Rafał. editor. Korytkowski, Marcin. editor. Pedrycz, Witold. editor. Tadeusiewicz, Ryszard. editor.

Yer Numarası

XX(520799.1)

Elektronik Erişim

https://doi.org/10.1007/978-3-031-23480-4

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24.

Computer Safety, Reliability, and Security. SAFECOMP 2023 Workshops ASSURE, DECSoS, SASSUR, SENSEI, SRToITS, and WAISE, Toulouse, France, September 19, 2023, Proceedings

Yazar

Guiochet, Jérémie. editor. Tonetta, Stefano. editor. Schoitsch, Erwin. editor. Roy, Matthieu. editor. Bitsch, Friedemann. editor.

Yer Numarası

XX(521137.1)

Elektronik Erişim

https://doi.org/10.1007/978-3-031-40953-0

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