Arama Sonuçlarını Sınırlandır
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Agrawal, Arun Prakash, editor.
(1)
Alhazmi, Omar H., editor.
(1)
Alvarado-Valiente, Jaime, author.
(1)
Anand, Adarsh, author.
(1)
Bagui, Sikha, 1964- author.
(1)
Yayın Yılı
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COMPUTERS / Programming / Software Development
(64)
COMPUTERS / Programming / Systems Analysis & Design
(9)
COMPUTERS / Information Technology
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COMPUTERS / Computer Engineering
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COMPUTERS / Management Information Systems
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1. 
Embedded software system testing : automatic testing solution based on formal method için kapak resmi
Embedded software system testing : automatic testing solution based on formal method
Yazar 
Yin, Yongfeng, 1978- author. Jiang, Bo, 1981- author. Su, Qingran, translator. Qiu, Ruinan, translator. Guo, Yang (Translator), translator.
Yer Numarası 
TK7895 .E42
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003390923
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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2. 
Intelligent systems of computing and informatics için kapak resmi
Intelligent systems of computing and informatics
Yazar 
Karim, Samsul Ariffin Abdul, editor.
Yer Numarası 
Q335
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003400387
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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3. 
MODEL-DRIVEN SOFTWARE SYSTEMS DEVELOPMENT USING THE META-ARTIFACT PROCESS için kapak resmi
MODEL-DRIVEN SOFTWARE SYSTEMS DEVELOPMENT USING THE META-ARTIFACT PROCESS
Yazar 
O'Brien, Wayne.
Yer Numarası 
QA76.76 .D47
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003448891
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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4. 
Internet of Things Applications and Technology için kapak resmi
Internet of Things Applications and Technology
Yazar 
Masoodi, Faheem. Bamhdi, Alwi. Manocha, Ankush. Teli, Tawseef Ahmed. Masoodi, Zubair Sayeed.
Yer Numarası 
TK5105.875 .I57
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003458401
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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5. 
Computational intelligence applications for software engineering problems için kapak resmi
Computational intelligence applications for software engineering problems
Yazar 
Nand, Parma (Computer scientist), editor. Nitin, Rakesh, editor. Agrawal, Arun Prakash, editor. Jain, Vishal, 1983- editor.
Yer Numarası 
QA76.758
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003283195
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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6. 
A Software Development Approach for Driving Competitiveness in Small Firms için kapak resmi
A Software Development Approach for Driving Competitiveness in Small Firms
Yazar 
Chevers, Delroy A., author.
Yer Numarası 
HD2341
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003388944
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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7. 
Agile Software Development için kapak resmi
Agile Software Development
Yazar 
Wlodarczak, Peter.
Yer Numarası 
QA76.76 .D47
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003301707
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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8. 
SOFTWARE ENGINEERING APPROACHES TO ENABLE DIGITAL TRANSFORMATION TECHNOLOGIES için kapak resmi
SOFTWARE ENGINEERING APPROACHES TO ENABLE DIGITAL TRANSFORMATION TECHNOLOGIES
Yazar 
Misra, Sanjay. Jain, Amit. Kaushik, Manju. Banerjee, Chitresh.
Yer Numarası 
QA76.758
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003441601
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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9. 
Confessions of an Enterprise Architect için kapak resmi
Confessions of an Enterprise Architect
Yazar 
Bowman, Charles F., author.
Yer Numarası 
QA76.9 .A73
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003414285
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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10. 
Multi-criteria decision models in software reliability : methods and applications için kapak resmi
Multi-criteria decision models in software reliability : methods and applications
Yazar 
Mishra, Ashish (Ashish Kumar), editor. Dieu Linh, Nguyen Thi, editor. Bhardwaj, Manish (Professor of computer science and engineering), editor. Pinto, Carla M. A. (Computer scientist), editor.
Yer Numarası 
QA76.76 .R44 M85 2023
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9780367816414
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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11. 
Software durability concepts and practices için kapak resmi
Software durability concepts and practices
Yazar 
Kumar, Rajeev, 1991- author. Khan, Suhel Ahmad, author. Khan, R. A. (Raees Ahmad), author.
Yer Numarası 
QA76.76 .Q35
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003322351
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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12. 
What every engineer should know about data-driven analytics için kapak resmi
What every engineer should know about data-driven analytics
Yazar 
Srinivasan, Satish Mahadevan, author. Laplante, Phillip A., author.
Yer Numarası 
Q325.5
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003278177
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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