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Wiley InterScience (Online service)

(3)

Joglekar, Anand M.

(2)

American Institute of Chemical Engineers. Center for Chemical Process Safety.

(1)

Amiri, Amirhossein, 1979-

(1)

Ayeni, Babatunde J.

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Badiru, Adedeji Bodunde, 1952-

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Box, George E. P.

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Colosimo, Bianca M.

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Del Castillo, Enrique.

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Ge, Zhiqiang. author.

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Ibidapo-Obe, Oye.

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Kang, Chang W. (Chang Wok), 1957- author.

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Kayihan, Ferhan, 1948-

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Keller, Paul A. (Paul Andrew)

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Koronacki, Jacek.

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Kvam, Paul H., 1962- author.

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Luceño, Alberto.

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Moen, Ronald D.

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Muir, Alastair K. S. (Alastair Kerr S.), 1957-

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Nolan, Thomas W.

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Noorossana, Rassoul, 1959-

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Oakland, John S.

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Palazo?lu, Ahmet.

(1)

Paniagua-Quiñones, María del Carmen.

(1)

Provost, Lloyd P.

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Ryan, Thomas P., 1945-

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Saghaei, Abbas, 1972-

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Song, Zhihuan. author.

(1)

Spanos, Costas J.

(1)

SpringerLink (Online service)

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Stapenhurst, Tim.

(1)

Stephens, Larry J.

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Thompson, James R., 1938-

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Process control -- Statistical methods.

(15)

Quality control -- Statistical methods.

(7)

Electronic books.

(5)

Chemical process control -- Statistical methods.

(2)

Experimental design.

(2)

Six sigma (Quality control standard)

(2)

Acceptance sampling.

(1)

Bayesian statistical decision theory.

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Chemical industry -- Quality control -- Statistical methods.

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Distribution (Probability theory) -- Outlines, syllabi, etc.

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Engineering -- Statistical methods -- Outlines, syllabi, etc.

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Feedback control systems.

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Integrated circuits -- Design and construction.

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Measuring instruments.

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Probabilities -- Outlines, syllabi, etc.

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Process control -- Mathematical models.

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Process control -- Statistical methods -- Outlines, syllabi, etc.

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Production management -- Quality control.

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Quality control -- Planning.

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Quality control.

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Regression analysis.

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Reliability (Engineering) -- Statistical methods.

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Sampling (Statistics)

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Semiconductors -- Design and construction.

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Statistics -- Computer programs -- Outlines, syllabi, etc.

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Statistics -- Outlines, syllabi, etc.

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TECHNOLOGY & ENGINEERING -- Electronics -- Semiconductors.

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TECHNOLOGY & ENGINEERING -- Electronics -- Solid State.

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Variational principles.

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13.

Bayesian process monitoring, control and optimization için kapak resmi

Bayesian process monitoring, control and optimization

Bayesian process monitoring, control and optimization

Yazar

Colosimo, Bianca M. Del Castillo, Enrique.

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Elektronik Erişim

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Chemical process performance evaluation için kapak resmi

Chemical process performance evaluation

Chemical process performance evaluation

Yazar

Cinar, Ali. Palazo?lu, Ahmet. Kayihan, Ferhan, 1948-

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15.

Fundamentals of semiconductor manufacturing and process control için kapak resmi

Fundamentals of semiconductor manufacturing and process control

Fundamentals of semiconductor manufacturing and process control

Yazar

May, Gary S. Spanos, Costas J.

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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201952

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16.

Mastering statistical process control a handbook for performance improvement using cases için kapak resmi

Mastering statistical process control a handbook for performance improvement using cases

Mastering statistical process control a handbook for performance improvement using cases

Yazar

Stapenhurst, Tim.

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ScienceDirect http://www.sciencedirect.com/science/book/9780750665292

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17.

Statistical methods for six sigma in R & D and manufacturing için kapak resmi

Statistical methods for six sigma in R & D and manufacturing

Statistical methods for six sigma in R & D and manufacturing

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Joglekar, Anand M.

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Elektronik Erişim

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John Wiley http://dx.doi.org/10.1002/0471721212
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley044/2003003583.html

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18.

Statistical process control the Deming paradigm and beyond için kapak resmi

Statistical process control the Deming paradigm and beyond

Statistical process control the Deming paradigm and beyond

Yazar

Thompson, James R., 1938- Koronacki, Jacek.

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19.

Guidelines for improving plant reliability through data collection and analysis için kapak resmi

Guidelines for improving plant reliability through data collection and analysis

Guidelines for improving plant reliability through data collection and analysis

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American Institute of Chemical Engineers. Center for Chemical Process Safety. Wiley InterScience (Online service)

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Elektronik Erişim

John Wiley http://dx.doi.org/10.1002/9780470935262

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