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SpringerLink (Online service)
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(9)
Bertino, Elisa. editor. (orcid)0000-0002-4029-7051
(8)
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(8)
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13. 
Distributed Computing and Internet Technology 15th International Conference, ICDCIT 2019, Bhubaneswar, India, January 10–13, 2019, Proceedings için kapak resmi
Distributed Computing and Internet Technology 15th International Conference, ICDCIT 2019, Bhubaneswar, India, January 10–13, 2019, Proceedings
Yazar 
Fahrnberger, Günter. editor. (orcid)0000-0002-2606-3988 Gopinathan, Sapna. editor. Parida, Laxmi. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-030-05366-6
Format: 
Durum 
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14. 
Advances in Knowledge Discovery and Data Mining 23rd Pacific-Asia Conference, PAKDD 2019, Macau, China, April 14-17, 2019, Proceedings, Part III için kapak resmi
Advances in Knowledge Discovery and Data Mining 23rd Pacific-Asia Conference, PAKDD 2019, Macau, China, April 14-17, 2019, Proceedings, Part III
Yazar 
Yang, Qiang. editor. Zhou, Zhi-Hua. editor. Gong, Zhiguo. editor. Zhang, Min-Ling. editor. Huang, Sheng-Jun. editor.
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-030-16142-2
Format: 
Durum 
Çevrimiçi Kütüphane~1
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15. 
Computational Data and Social Networks 8th International Conference, CSoNet 2019, Ho Chi Minh City, Vietnam, November 18–20, 2019, Proceedings için kapak resmi
Computational Data and Social Networks 8th International Conference, CSoNet 2019, Ho Chi Minh City, Vietnam, November 18–20, 2019, Proceedings
Yazar 
Tagarelli, Andrea. editor. Tong, Hanghang. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-030-34980-6
Format: 
Durum 
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16. 
Recent Trends in Image Processing and Pattern Recognition Second International Conference, RTIP2R 2018, Solapur, India, December 21–22, 2018, Revised Selected Papers, Part III için kapak resmi
Recent Trends in Image Processing and Pattern Recognition Second International Conference, RTIP2R 2018, Solapur, India, December 21–22, 2018, Revised Selected Papers, Part III
Yazar 
Santosh, K. C. editor. Hegadi, Ravindra S. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-981-13-9187-3
Format: 
Durum 
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17. 
Smart Microgrids From Design to Laboratory-Scale Implementation için kapak resmi
Smart Microgrids From Design to Laboratory-Scale Implementation
Yazar 
Bahrami, Shahab. editor. Mohammadi, Ali. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-030-02656-1
Format: 
Durum 
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18. 
Advances in Computing and Data Sciences Third International Conference, ICACDS 2019, Ghaziabad, India, April 12–13, 2019, Revised Selected Papers, Part II için kapak resmi
Advances in Computing and Data Sciences Third International Conference, ICACDS 2019, Ghaziabad, India, April 12–13, 2019, Revised Selected Papers, Part II
Yazar 
Singh, Mayank. editor. Gupta, P.K. editor. Tyagi, Vipin. editor. Flusser, Jan. editor. Ören, Tuncer. editor.
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-981-13-9942-8
Format: 
Durum 
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19. 
Selected Areas in Cryptography – SAC 2018 25th International Conference, Calgary, AB, Canada, August 15–17, 2018, Revised Selected Papers için kapak resmi
Selected Areas in Cryptography – SAC 2018 25th International Conference, Calgary, AB, Canada, August 15–17, 2018, Revised Selected Papers
Yazar 
Cid, Carlos. editor. (orcid)0000-0001-5761-8694 Jacobson Jr., Michael J. editor. (orcid)0000-0002-4906-0544 SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-030-10970-7
Format: 
Durum 
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20. 
Security and Privacy in New Computing Environments Second EAI International Conference, SPNCE 2019, Tianjin, China, April 13–14, 2019, Proceedings için kapak resmi
Security and Privacy in New Computing Environments Second EAI International Conference, SPNCE 2019, Tianjin, China, April 13–14, 2019, Proceedings
Yazar 
Li, Jin. editor. Liu, Zheli. editor. Peng, Hao. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-030-21373-2
Format: 
Durum 
Çevrimiçi Kütüphane~1
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21. 
Database and Expert Systems Applications DEXA 2019 International Workshops BIOKDD, IWCFS, MLKgraphs and TIR, Linz, Austria, August 26–29, 2019, Proceedings için kapak resmi
Database and Expert Systems Applications DEXA 2019 International Workshops BIOKDD, IWCFS, MLKgraphs and TIR, Linz, Austria, August 26–29, 2019, Proceedings
Yazar 
Anderst-Kotsis, Gabriele. editor. Tjoa, A Min. editor. (orcid)0000-0002-8295-9252 Khalil, Ismail. editor. Elloumi, Mourad. editor. Mashkoor, Atif. editor.
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-030-27684-3
Format: 
Durum 
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22. 
Codes, Cryptology and Information Security Third International Conference, C2SI 2019, Rabat, Morocco, April 22–24, 2019, Proceedings - In Honor of Said El Hajji için kapak resmi
Codes, Cryptology and Information Security Third International Conference, C2SI 2019, Rabat, Morocco, April 22–24, 2019, Proceedings - In Honor of Said El Hajji
Yazar 
Carlet, Claude. editor. Guilley, Sylvain. editor. (orcid)0000-0002-5044-3534 Nitaj, Abderrahmane. editor. (orcid)0000-0002-0372-1757 Souidi, El Mamoun. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-030-16458-4
Format: 
Durum 
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23. 
Advances in Digital Forensics XV 15th IFIP WG 11.9 International Conference, Orlando, FL, USA, January 28–29, 2019, Revised Selected Papers için kapak resmi
Advances in Digital Forensics XV 15th IFIP WG 11.9 International Conference, Orlando, FL, USA, January 28–29, 2019, Revised Selected Papers
Yazar 
Peterson, Gilbert. editor. Shenoi, Sujeet. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-3-030-28752-8
Format: 
Durum 
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24. 
VLSI Design and Test for Systems Dependability için kapak resmi
VLSI Design and Test for Systems Dependability
Yazar 
Asai, Shojiro. editor. SpringerLink (Online service)
Yer Numarası 
ONLINE
Elektronik Erişim 
https://doi.org/10.1007/978-4-431-56594-9
Format: 
Durum 
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