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SpringerLink (Online service)

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Abbene, Leonardo. editor.

(1)

Alkauskas, Audrius.

(1)

Busnaina, A. A.

(1)

Buyanova, Irina, editor.

(1)

Chen, Weimin, editor.

(1)

Chu, Liu (Materials scientist), author.

(1)

Deysine, M Oaximo.

(1)

Dharmadasa, I. M., author.

(1)

Fang, Tsang-Tse, 1955- author.

(1)

Fleetwood, D. M. (Dan M.)

(1)

Ghosh, S. K. (Swadhin Kumar)

(1)

(1)

Gladysz, Gary M., author.

(1)

Green, Peter F., author.

(1)

Heslehurst, Rikard Benton, author.

(1)

Houssa, Michel.

(1)

Hu, Deqing. author.

(1)

Iniewski, Krzysztof (Kris). editor.

(1)

International Conference on Materials Processing Defects (3rd : 1997 : Cachan, France)

(1)

International Conference on the Science and Technology of Defect Control in Semiconductors (1989 : Yokohama-shi, Japan)

(1)

Kissinger, Gudrun, editor.

(1)

(1)

Li, Meicheng, editor.

(1)

Li, Quan. editor.

(1)

Li, Zhigang R., 1958-

(1)

Lin, Jian. author.

(1)

Liu, G. R. (Gui-Rong)

(1)

MacKenzie, D. Scott.

(1)

Pantelides, Sokrates T.

(1)

Perkins, Philip Harold., author.

(1)

Pizzini, Sergio, editor.

(1)

Quere, Y., ort. yaz.

(1)

Reddy, A. Venugopal., author.

(1)

Schrimpf, Ronald Donald.

(1)

Srivastava, Avanish Kumar, editor.

(1)

Stehr, Jan, editor.

(1)

Sumino, K. (Kōji), 1931-

(1)

(1)

Totten, George E.

(1)

Wang, Jianli. author.

(1)

Wood, Roger M., author.

(1)

(1)

Xu, Yongqing. author.

(1)

Zhang, Tianhao. author.

(1)

Zhou, Kun. editor.

(1)

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Tümünü genişlet

Konu

Materials -- Defects -- Congresses.

(2)

Materials science.

(2)

(2)

Nanostructured materials.

(2)

TECHNOLOGY / Engineering / Chemical & Biochemical

(2)

Aerospace engineering -- Materials -- Defects.

(1)

Airplanes -- Parts -- Defects.

(1)

Aluminum -- Analysis.

(1)

Ceramic materials.

(1)

(1)

Composite materials -- Defects.

(1)

Composite materials.

(1)

Concrete coatings.

(1)

Concrete construction -- Maintenance and repair.

(1)

Crystals -- Defects.

(1)

Crystals -- Structure.

(1)

Dielectric devices.

(1)

Dielectrics -- Research.

(1)

(1)

Electron microscopy -- Industrial applications.

(1)

Electronic Circuits and Systems.

(1)

Electronic circuits.

(1)

Gate array circuits -- Materials.

(1)

Germanium alloys.

(1)

Heat resistant alloys -- Analysis.

(1)

Hernia -- Surgery.

(1)

Industrial and Production Engineering.

(1)

Industrial engineering.

(1)

Integrated circuits -- Defects.

(1)

(1)

Laminated materials.

(1)

(1)

Manufactures -- Defects -- Congresses.

(1)

Manufactures -- Defects.

(1)

Materials -- Analysis.

(1)

Materials -- Defects.

(1)

Materials -- Mathematical models.

(1)

Materials -- Microscopy.

(1)

Materials -- Testing -- Mathematical models.

(1)

Materials for Devices.

(1)

Metal oxide semiconductor field-effect transistors -- Testing.

(1)

Metal oxide semiconductors -- Materials.

(1)

Metal oxide semiconductors, Complementary -- Materials.

(1)

(1)

Metals -- Defects.

(1)

Metals -- Fracture.

(1)

Microelectronics -- Materials -- Testing.

(1)

Microwaves, RF Engineering and Optical Communications.

(1)

(1)

(1)

(1)

Nanostructured materials -- Defects.

(1)

Nanotechnology.

(1)

Nondestructive testing.

(1)

Optical materials -- Defects.

(1)

Optical materials -- Effect of radiation on.

(1)

(1)

Perovskite materials -- Defects.

(1)

Perovskite solar cells -- Design and construction.

(1)

Perovskite solar cells.

(1)

Physical chemistry.

(1)

Process Engineering.

(1)

Production engineering.

(1)

Quantitative research.

(1)

RADYOAKTİV MADDELER, RADYASYON ETKİSİ.

(1)

SCIENCE / Energy

(1)

Semiconductors -- Defects -- Congresses.

(1)

Semiconductors -- Materials -- Testing.

(1)

Silicon alloys.

(1)

Smart materials -- Defects.

(1)

Soft and Granular Matter.

(1)

Soft condensed matter.

(1)

(1)

Steel -- Analysis.

(1)

Stochastic processes.

(1)

Strength of materials.

(1)

Surface and Interface and Thin Film.

(1)

Surfaces (Physics).

(1)

System failures (Engineering)

(1)

TECHNOLOGY / Engineering / Civil

(1)

TECHNOLOGY / Engineering / Mechanical

(1)

TECHNOLOGY / Manufacturing

(1)

TECHNOLOGY / Material Science

(1)

Telecommunication.

(1)

Transport theory.

(1)

(1)

Tümünü genişlet

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1.

High-Z Materials for X-ray Detection Material Properties and Characterization Techniques için kapak resmi

High-Z Materials for X-ray Detection Material Properties and Characterization Techniques

High-Z Materials for X-ray Detection Material Properties and Characterization Techniques

Yazar

Abbene, Leonardo. editor. Iniewski, Krzysztof (Kris). editor. SpringerLink (Online service)

Yer Numarası

ONLINE

Elektronik Erişim

https://doi.org/10.1007/978-3-031-20955-0

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2.

Additive Manufacturing Materials, Functionalities and Applications için kapak resmi

Additive Manufacturing Materials, Functionalities and Applications

Additive Manufacturing Materials, Functionalities and Applications

Yazar

Zhou, Kun. editor. SpringerLink (Online service)

Yer Numarası

ONLINE

Elektronik Erişim

https://doi.org/10.1007/978-3-031-04721-3

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3.

Silicon, germanium, and their alloys : growth, defects, impurities, and nanocrystals için kapak resmi

Silicon, germanium, and their alloys : growth, defects, impurities, and nanocrystals

Silicon, germanium, and their alloys : growth, defects, impurities, and nanocrystals

Yazar

Kissinger, Gudrun, editor. Pizzini, Sergio, editor.

Yer Numarası

TA480 .G4 S545 2015

Elektronik Erişim

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4.

Nanoscience with Liquid Crystals From Self-Organized Nanostructures to Applications için kapak resmi

Nanoscience with Liquid Crystals From Self-Organized Nanostructures to Applications

Nanoscience with Liquid Crystals From Self-Organized Nanostructures to Applications

Yazar

Li, Quan. editor. SpringerLink (Online service)

Yer Numarası

ONLINE

Elektronik Erişim

https://doi.org/10.1007/978-3-319-04867-3

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5.

Advances in thin-film solar cells için kapak resmi

Advances in thin-film solar cells

Advances in thin-film solar cells

Yazar

Dharmadasa, I. M., author.

Yer Numarası

TK2960 .D43 2013

Elektronik Erişim

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6.

Oxide nanostructures : growth, microstructures, and properties için kapak resmi

Oxide nanostructures : growth, microstructures, and properties

Oxide nanostructures : growth, microstructures, and properties

Yazar

Srivastava, Avanish Kumar, editor.

Yer Numarası

QD381 .O95 2013

Elektronik Erişim

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7.

Nanomanufacturing handbook için kapak resmi

Nanomanufacturing handbook

Nanomanufacturing handbook

Yazar

Busnaina, A. A.

Yer Numarası

T174.7 .N36 2007

Elektronik Erişim

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8.

Analytical characterization of aluminum, steel, and superalloys için kapak resmi

Analytical characterization of aluminum, steel, and superalloys

Analytical characterization of aluminum, steel, and superalloys

Yazar

MacKenzie, D. Scott. Totten, George E.

Yer Numarası

TA480 .A6 A65 2006

Elektronik Erişim

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9.

Kinetics, transport, and structure in hard and soft materials için kapak resmi

Kinetics, transport, and structure in hard and soft materials

Kinetics, transport, and structure in hard and soft materials

Yazar

Green, Peter F., author.

Yer Numarası

TA403 .G675 2005

Elektronik Erişim

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10.

High-K gate dielectrics için kapak resmi

High-K gate dielectrics

High-K gate dielectrics

Yazar

Houssa, Michel.

Yer Numarası

TK7871.99 .M44 H49 2004

Elektronik Erişim

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11.

Investigation of aeronautical and engineering component failures için kapak resmi

Investigation of aeronautical and engineering component failures

Investigation of aeronautical and engineering component failures

Yazar

Reddy, A. Venugopal., author.

Yer Numarası

TL672 .R44 2004

Elektronik Erişim

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12.

Hernia infections : pathophysiology, diagnosis, treatment, prevention için kapak resmi

Hernia infections : pathophysiology, diagnosis, treatment, prevention

Hernia infections : pathophysiology, diagnosis, treatment, prevention

Yazar

Deysine, M Oaximo.

Yer Numarası

RD621 .H476 2004

Elektronik Erişim

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