Search Results for Reliability.

|

Kütüphane Hesabım

|

|

|

Remember to clear the cache and close the browser window.

Search Limit

Rooms Restriction Values

8

Search Field

Target Value

Limit Value

Restriction Value

Arama:

Gelişmiş Arama

Arama Sonuçlarını Sınırlandır

Daraltılmış:

+

Konu: Electronic books.

Yazar

Wiley InterScience (Online service)

(9)

(4)

(2)

Schneidewind, Norman.

(2)

Alouini, Mohamed-Slim.

(1)

Augustin, Thomas, editor.

(1)

(1)

Bergman, Bo, 1943-

(1)

Bernstein, Lawrence, 1940-

(1)

Blischke, W. R., 1934-

(1)

Carlson, Carl (Carl Seymour)

(1)

Castet, Jean-François.

(1)

Chan, H. Anthony, 1952-

(1)

Chowdhury, Ali A.

(1)

Connally, Eric.

(1)

Curtis, Peter M.

(1)

Curtis, Peter M., author.

(1)

Dodson, Bryan, 1962- author.

(1)

Englert, Paul J, 1960-

(1)

(1)

Fuller, Edwin R.

(1)

Gullo, Louis J.

(1)

Hammett, Patrick C., author.

(1)

(1)

Huang, J. C., 1935-

(1)

IEEE Solid-State Circuits Council.

(1)

International Conference on Advanced Ceramics and Composites (32nd : 2008 : Daytona Beach, Fla.)

(1)

Jackson, Scott.

(1)

Kanoun, Karama.

(1)

Kartalopoulos, Stamatios V.

(1)

(1)

Kimber, Douglas A.

(1)

Klerx, Rene, author.

(1)

Klyatis, Lev M.

(1)

Koval, D. O. (Don Orest)

(1)

Kuo, Way, 1951-

(1)

Lemaire, Maurice.

(1)

Li, Wenyuan, 1946- author.

(1)

(1)

McCool, John, 1936-

(1)

Mobley, R. Keith, 1943-

(1)

Murthy, D. N. P.

(1)

Natvig, Bent, 1946-

(1)

Ohji, T. (Tatsuki)

(1)

Pascoe, Norman.

(1)

Pukite, Jan, 1928-

(1)

(1)

(1)

Saleh, Joseph H., 1971-

(1)

Salem, J. A. (Jonathan A.), 1960-

(1)

Sharma, Ashok K.

(1)

Simon, Marvin Kenneth, 1939-

(1)

Smith, David John, 1943-

(1)

(1)

Spainhower, Lisa.

(1)

Strong, Alvin Wayne, 1946-

(1)

Suhir, Ephraim.

(1)

Temple, L. Parker.

(1)

Ushakov, I. A. (Igorʹ Alekseevich)

(1)

Voldman, Steven H.

(1)

Walker, N. Edward.

(1)

Wereszczak, Andrew.

(1)

Yu, T. X. (Tongxi), 1941-

(1)

(1)

(1)

(1)

Tümünü genişlet

Dil

(23)

Yayın Yılı

-

(10)

(9)

(4)

(4)

(3)

(3)

(3)

(2)

(2)

(1)

(1)

(1)

Tümünü genişlet

Konu

Reliability (Engineering)

(15)

Computer software -- Reliability.

(5)

Electronic apparatus and appliances -- Reliability.

(3)

Software engineering.

(3)

COMPUTERS -- Software Development & Engineering -- General.

(2)

Electric power systems -- Reliability -- Mathematical models.

(2)

Engineering design.

(2)

Metal oxide semiconductors, Complementary -- Reliability.

(2)

Monte Carlo method.

(2)

(2)

Reliability (Engineering) -- Mathematical models.

(2)

Systems engineering.

(2)

TECHNOLOGY & ENGINEERING -- Electrical.

(2)

TECHNOLOGY & ENGINEERING / Quality Control

(2)

Accelerated life testing.

(1)

Benchmarking (Management)

(1)

CMOS-Schaltung.

(1)

COMPUTERS -- Data Transmission Systems -- General.

(1)

COMPUTERS -- Networking -- Vendor Specific.

(1)

COMPUTERS -- Software Development & Engineering -- Systems Analysis & Design.

(1)

COMPUTERS / Logic Design

(1)

Ceramic materials -- Corrosion -- Congresses.

(1)

Cloud computing.

(1)

Communication Technology.

(1)

Computer engineering.

(1)

Computer input-output equipment -- Reliability.

(1)

Computer networks -- Reliability.

(1)

Computer security.

(1)

Computer software -- Quality control.

(1)

Computer software -- Testing.

(1)

Computer systems -- Reliability.

(1)

Debugging in computer science.

(1)

Digital communications -- Reliability -- Mathematics.

(1)

Electric discharges.

(1)

Electric power failures -- Risk assessment.

(1)

Electric power systems -- Reliability.

(1)

Electronic apparatus and appliances -- Testing.

(1)

Electronic circuit design.

(1)

Electronic digital computers -- Reliability.

(1)

Electronics -- United States -- History -- 20th century.

(1)

Electronics in military engineering -- United States -- History -- 20th century.

(1)

Electrostatics.

(1)

Environmental testing.

(1)

Failure mode and effects analysis.

(1)

Fault location (Engineering)

(1)

Fault tolerance (Engineering)

(1)

Fault-tolerant computing.

(1)

Fiabilité -- Modèles mathématiques.

(1)

(1)

Industrial design -- Statistical methods.

(1)

Industrial design.

(1)

Industrial priorities.

(1)

Industrial safety.

(1)

Integrated circuits -- Protection.

(1)

Integrated circuits -- Reliability.

(1)

Integrated circuits -- Testing.

(1)

Maintainability (Engineering)

(1)

Manufacturing processes -- Quality control.

(1)

Metal oxide semiconductors, Complementary -- Defects.

(1)

Microstructure.

(1)

Optical communications.

(1)

Optoelectronic devices -- Reliability.

(1)

Ordinateurs -- Fiabilité.

(1)

Probabilities -- Textbooks.

(1)

Quality control.

(1)

Quality of products.

(1)

Radio -- Transmitters and transmission -- Fading.

(1)

Redundancy (Engineering)

(1)

(1)

Risk assessment.

(1)

Robust statistics.

(1)

Schaltungsentwurf.

(1)

Semiconductor storage devices.

(1)

Semiconductors -- Failures.

(1)

Signal processing -- Digital techniques.

(1)

Six sigma (Quality control standard)

(1)

Space vehicles -- Reliability.

(1)

Stochastic systems.

(1)

Structural dynamics.

(1)

Structural engineering -- Mathematics.

(1)

Structural failures.

(1)

System failures (Engineering)

(1)

System failures (Engineering) -- Prevention.

(1)

(1)

Systems availability.

(1)

Systems engineering -- Management.

(1)

TECHNOLOGY & ENGINEERING -- Electronics -- Digital.

(1)

TECHNOLOGY & ENGINEERING -- Electronics -- Microelectronics.

(1)

TECHNOLOGY & ENGINEERING -- Quality Control.

(1)

TECHNOLOGY & ENGINEERING -- Telecommunications.

(1)

TECHNOLOGY & ENGINEERING / Electronics / Circuits / Logic

(1)

TECHNOLOGY & ENGINEERING / Electronics / Circuits / VLSI & ULSI

(1)

TECHNOLOGY & ENGINEERING / Electronics / General.

(1)

TECHNOLOGY & ENGINEERING / Quality Control.

(1)

TECHNOLOGY & ENGINEERING / Telecommunications

(1)

Telecommunication systems.

(1)

Tolérance aux fautes (informatique)

(1)

Wavelength division multiplexing.

(1)

Weibull distribution -- Textbooks.

(1)

Tümünü genişlet

Materyal Türü

Shelf Location

Elektronik Kütüphane

Kütüphane

Çevrimiçi Kütüphane

{sortLabel}

	{facetName}	{results}

	{displayName}	{count}
{error}

Liste görünümüne geç

Küçük resim görünümüne geç

Eylem Seç

Ayırt
Listelerime ekle
Eposta
Yazdır

44 sonuç bulundu

Arama sonuçlarına abone ol

1 2 3 4

000000000000DEFAULT_TR

Yazdır

Liste seç

Bunu varsayılan liste yap.

Öğeler başarıyla eklendi

Öğeler eklenirken hata oldu. Lütfen tekrar deneyiniz.

One or more items could not be added because you are not logged in.

25.

Modeling for reliability analysis Markov modeling for reliability, maintainability, safety, and supportability analyses of complex computer systems için kapak resmi

Modeling for reliability analysis Markov modeling for reliability, maintainability, safety, and supportability analyses of complex computer systems

Modeling for reliability analysis Markov modeling for reliability, maintainability, safety, and supportability analyses of complex computer systems

Yazar

Pukite, Jan, 1928- Pukite, Paul.

Yer Numarası

ONLINE

Elektronik Erişim

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263338

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

26.

Implosion : lessons from national security, high reliability spacecraft, electronics, and the forces which changed them için kapak resmi

Implosion : lessons from national security, high reliability spacecraft, electronics, and the forces which changed them

Implosion : lessons from national security, high reliability spacecraft, electronics, and the forces which changed them

Yazar

Temple, L. Parker.

Yer Numarası

ONLINE

Elektronik Erişim

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6480472

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

27.

Effective FMEAs achieving safe, reliable, and economical products and processes using failure mode and effects analysis için kapak resmi

Effective FMEAs achieving safe, reliable, and economical products and processes using failure mode and effects analysis

Effective FMEAs achieving safe, reliable, and economical products and processes using failure mode and effects analysis

Yazar

Carlson, Carl (Carl Seymour)

Yer Numarası

ONLINE

Elektronik Erişim

Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=827069
John Wiley http://dx.doi.org/10.1002/9781118312575
Books24x7 http://www.books24x7.com/marc.asp?bookid=46749
http://site.ebrary.com/lib/alltitles/Doc?id=10558143
ebrary http://site.ebrary.com/id/10558143

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

28.

Introduction to imprecise probabilities için kapak resmi

Introduction to imprecise probabilities

Introduction to imprecise probabilities

Yazar

Augustin, Thomas, editor.

Yer Numarası

ONLINE(341745.1)

Elektronik Erişim

Cover image http://catalogimages.wiley.com/images/db/jimages/9780470973813.jpg
Ebook Library http://public.eblib.com/choice/publicfullrecord.aspx?p=1662760
ebrary http://site.ebrary.com/id/10856859
John Wiley http://dx.doi.org/10.1002/9781118763117
MyiLibrary http://www.myilibrary.com?id=595066

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

29.

Probabilistic design for optimization and robustness for engineers için kapak resmi

Probabilistic design for optimization and robustness for engineers

Probabilistic design for optimization and robustness for engineers

Yazar

Dodson, Bryan, 1962- author. Hammett, Patrick C., author. Klerx, Rene, author.

Yer Numarası

ONLINE(341796.1)

Elektronik Erişim

Available by subscription from Safari Books Online
ebrary http://alltitles.ebrary.com/Doc?id=10896040
John Wiley http://dx.doi.org/10.1002/9781118796245
Volltext http://proquest.tech.safaribooksonline.de/9781118796306

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

30.

Risk assessment of power systems : models, methods, and applications için kapak resmi

Risk assessment of power systems : models, methods, and applications

Risk assessment of power systems : models, methods, and applications

Yazar

Li, Wenyuan, 1946- author.

Yer Numarası

ONLINE(341888.1)

Elektronik Erişim

CLICK HERE for online access
Ebook Library http://public.eblib.com/choice/publicfullrecord.aspx?p=1638154
ebrary http://site.ebrary.com/id/10842316
John Wiley http://dx.doi.org/10.1002/9781118849972

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

31.

Maintaining Mission Critical Systems in a 24/7 Environment için kapak resmi

Maintaining Mission Critical Systems in a 24/7 Environment

Maintaining Mission Critical Systems in a 24/7 Environment

Yazar

Curtis, Peter M., author. Wiley InterScience (Online service)

Yer Numarası

ONLINE

Elektronik Erişim

IEEE Xplore http://ieeexplore.ieee.org/servlet/opac?bknumber=6047593

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

32.

Structural dynamics of electronic and photonic systems için kapak resmi

Structural dynamics of electronic and photonic systems

Structural dynamics of electronic and photonic systems

Yazar

Suhir, Ephraim. Yu, T. X. (Tongxi), 1941- Connally, Eric. Wiley InterScience (Online service)

Yer Numarası

ONLINE

Elektronik Erişim

Wiley InterScience An electronic book accessible through the World Wide Web; click for information
$uhttp://onlinelibrary.wiley.com/book/10.1002/9780470950012

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

33.

Architecting resilient systems accident avoidance and survival and recovery from disruptions için kapak resmi

Architecting resilient systems accident avoidance and survival and recovery from disruptions

Architecting resilient systems accident avoidance and survival and recovery from disruptions

Yazar

Jackson, Scott.

Yer Numarası

ONLINE

Elektronik Erişim

Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469532
John Wiley http://dx.doi.org/10.1002/9780470544013
http://site.ebrary.com/lib/alltitles/Doc?id=10355233

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

34.

ESD failure mechanisms and models için kapak resmi

ESD failure mechanisms and models

ESD failure mechanisms and models

Yazar

Voldman, Steven H. Wiley InterScience (Online service)

Yer Numarası

ONLINE

Elektronik Erişim

John Wiley http://dx.doi.org/10.1002/9780470747254
http://site.ebrary.com/lib/alltitles/Doc?id=10317806

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

35.

Transient-induced latchup in CMOS integrated circuits için kapak resmi

Transient-induced latchup in CMOS integrated circuits

Transient-induced latchup in CMOS integrated circuits

Yazar

Ker, Ming-Dou. Hsu, Sheng-Fu.

Yer Numarası

ONLINE

Elektronik Erişim

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5453758

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

36.

Systems and software engineering with applications için kapak resmi

Systems and software engineering with applications

Systems and software engineering with applications

Yazar

Schneidewind, Norman.

Yer Numarası

ONLINE

Elektronik Erişim

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769539
IEEE Xplore http://ieeexplore.ieee.org/servlet/opac?bknumber=5769539

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

Eylem Seç

Ayırt
Listelerime ekle
Eposta
Yazdır

1 2 3 4

Copyright 2011 Sirsi Corporation - Enterprise Version 5.0.0.11