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Konu: Electronic books.

Yazar

Wiley InterScience (Online service)

(9)

(4)

(2)

Schneidewind, Norman.

(2)

Alouini, Mohamed-Slim.

(1)

Augustin, Thomas, editor.

(1)

(1)

Bergman, Bo, 1943-

(1)

Bernstein, Lawrence, 1940-

(1)

Blischke, W. R., 1934-

(1)

Carlson, Carl (Carl Seymour)

(1)

Castet, Jean-François.

(1)

Chan, H. Anthony, 1952-

(1)

Chowdhury, Ali A.

(1)

Connally, Eric.

(1)

Curtis, Peter M.

(1)

Curtis, Peter M., author.

(1)

Dodson, Bryan, 1962- author.

(1)

Englert, Paul J, 1960-

(1)

(1)

Fuller, Edwin R.

(1)

Gullo, Louis J.

(1)

Hammett, Patrick C., author.

(1)

(1)

Huang, J. C., 1935-

(1)

IEEE Solid-State Circuits Council.

(1)

International Conference on Advanced Ceramics and Composites (32nd : 2008 : Daytona Beach, Fla.)

(1)

Jackson, Scott.

(1)

Kanoun, Karama.

(1)

Kartalopoulos, Stamatios V.

(1)

(1)

Kimber, Douglas A.

(1)

Klerx, Rene, author.

(1)

Klyatis, Lev M.

(1)

Koval, D. O. (Don Orest)

(1)

Kuo, Way, 1951-

(1)

Lemaire, Maurice.

(1)

Li, Wenyuan, 1946- author.

(1)

(1)

McCool, John, 1936-

(1)

Mobley, R. Keith, 1943-

(1)

Murthy, D. N. P.

(1)

Natvig, Bent, 1946-

(1)

Ohji, T. (Tatsuki)

(1)

Pascoe, Norman.

(1)

Pukite, Jan, 1928-

(1)

(1)

(1)

Saleh, Joseph H., 1971-

(1)

Salem, J. A. (Jonathan A.), 1960-

(1)

Sharma, Ashok K.

(1)

Simon, Marvin Kenneth, 1939-

(1)

Smith, David John, 1943-

(1)

(1)

Spainhower, Lisa.

(1)

Strong, Alvin Wayne, 1946-

(1)

Suhir, Ephraim.

(1)

Temple, L. Parker.

(1)

Ushakov, I. A. (Igorʹ Alekseevich)

(1)

Voldman, Steven H.

(1)

Walker, N. Edward.

(1)

Wereszczak, Andrew.

(1)

Yu, T. X. (Tongxi), 1941-

(1)

(1)

(1)

(1)

Tümünü genişlet

Dil

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Yayın Yılı

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(4)

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(3)

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(1)

(1)

(1)

Tümünü genişlet

Konu

Reliability (Engineering)

(15)

Computer software -- Reliability.

(5)

Electronic apparatus and appliances -- Reliability.

(3)

Software engineering.

(3)

COMPUTERS -- Software Development & Engineering -- General.

(2)

Electric power systems -- Reliability -- Mathematical models.

(2)

Engineering design.

(2)

Metal oxide semiconductors, Complementary -- Reliability.

(2)

Monte Carlo method.

(2)

(2)

Reliability (Engineering) -- Mathematical models.

(2)

Systems engineering.

(2)

TECHNOLOGY & ENGINEERING -- Electrical.

(2)

TECHNOLOGY & ENGINEERING / Quality Control

(2)

Accelerated life testing.

(1)

Benchmarking (Management)

(1)

CMOS-Schaltung.

(1)

COMPUTERS -- Data Transmission Systems -- General.

(1)

COMPUTERS -- Networking -- Vendor Specific.

(1)

COMPUTERS -- Software Development & Engineering -- Systems Analysis & Design.

(1)

COMPUTERS / Logic Design

(1)

Ceramic materials -- Corrosion -- Congresses.

(1)

Cloud computing.

(1)

Communication Technology.

(1)

Computer engineering.

(1)

Computer input-output equipment -- Reliability.

(1)

Computer networks -- Reliability.

(1)

Computer security.

(1)

Computer software -- Quality control.

(1)

Computer software -- Testing.

(1)

Computer systems -- Reliability.

(1)

Debugging in computer science.

(1)

Digital communications -- Reliability -- Mathematics.

(1)

Electric discharges.

(1)

Electric power failures -- Risk assessment.

(1)

Electric power systems -- Reliability.

(1)

Electronic apparatus and appliances -- Testing.

(1)

Electronic circuit design.

(1)

Electronic digital computers -- Reliability.

(1)

Electronics -- United States -- History -- 20th century.

(1)

Electronics in military engineering -- United States -- History -- 20th century.

(1)

Electrostatics.

(1)

Environmental testing.

(1)

Failure mode and effects analysis.

(1)

Fault location (Engineering)

(1)

Fault tolerance (Engineering)

(1)

Fault-tolerant computing.

(1)

Fiabilité -- Modèles mathématiques.

(1)

(1)

Industrial design -- Statistical methods.

(1)

Industrial design.

(1)

Industrial priorities.

(1)

Industrial safety.

(1)

Integrated circuits -- Protection.

(1)

Integrated circuits -- Reliability.

(1)

Integrated circuits -- Testing.

(1)

Maintainability (Engineering)

(1)

Manufacturing processes -- Quality control.

(1)

Metal oxide semiconductors, Complementary -- Defects.

(1)

Microstructure.

(1)

Optical communications.

(1)

Optoelectronic devices -- Reliability.

(1)

Ordinateurs -- Fiabilité.

(1)

Probabilities -- Textbooks.

(1)

Quality control.

(1)

Quality of products.

(1)

Radio -- Transmitters and transmission -- Fading.

(1)

Redundancy (Engineering)

(1)

(1)

Risk assessment.

(1)

Robust statistics.

(1)

Schaltungsentwurf.

(1)

Semiconductor storage devices.

(1)

Semiconductors -- Failures.

(1)

Signal processing -- Digital techniques.

(1)

Six sigma (Quality control standard)

(1)

Space vehicles -- Reliability.

(1)

Stochastic systems.

(1)

Structural dynamics.

(1)

Structural engineering -- Mathematics.

(1)

Structural failures.

(1)

System failures (Engineering)

(1)

System failures (Engineering) -- Prevention.

(1)

(1)

Systems availability.

(1)

Systems engineering -- Management.

(1)

TECHNOLOGY & ENGINEERING -- Electronics -- Digital.

(1)

TECHNOLOGY & ENGINEERING -- Electronics -- Microelectronics.

(1)

TECHNOLOGY & ENGINEERING -- Quality Control.

(1)

TECHNOLOGY & ENGINEERING -- Telecommunications.

(1)

TECHNOLOGY & ENGINEERING / Electronics / Circuits / Logic

(1)

TECHNOLOGY & ENGINEERING / Electronics / Circuits / VLSI & ULSI

(1)

TECHNOLOGY & ENGINEERING / Electronics / General.

(1)

TECHNOLOGY & ENGINEERING / Quality Control.

(1)

TECHNOLOGY & ENGINEERING / Telecommunications

(1)

Telecommunication systems.

(1)

Tolérance aux fautes (informatique)

(1)

Wavelength division multiplexing.

(1)

Weibull distribution -- Textbooks.

(1)

Tümünü genişlet

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37.

ESD failure mechanisms and models için kapak resmi

ESD failure mechanisms and models

ESD failure mechanisms and models

Yazar

Voldman, Steven H. Wiley InterScience (Online service)

Yer Numarası

ONLINE

Elektronik Erişim

John Wiley http://dx.doi.org/10.1002/9780470747254
http://site.ebrary.com/lib/alltitles/Doc?id=10317806

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38.

Dependability benchmarking for computer systems için kapak resmi

Dependability benchmarking for computer systems

Dependability benchmarking for computer systems

Yazar

Kanoun, Karama. Spainhower, Lisa.

Yer Numarası

ONLINE

Elektronik Erişim

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6129686

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39.

Maintaining mission critical systems in a 24/7 environment için kapak resmi

Maintaining mission critical systems in a 24/7 environment

Maintaining mission critical systems in a 24/7 environment

Yazar

Curtis, Peter M.

Yer Numarası

ONLINE

Elektronik Erişim

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5236749

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40.

Digital communication over fading channels için kapak resmi

Digital communication over fading channels

Digital communication over fading channels

Yazar

Simon, Marvin Kenneth, 1939- Alouini, Mohamed-Slim.

Yer Numarası

ONLINE

Elektronik Erişim

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5238261

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41.

Risk assessment of power systems models, methods, and applications için kapak resmi

Risk assessment of power systems models, methods, and applications

Risk assessment of power systems models, methods, and applications

Yazar

Li, Wenyuan.

Yer Numarası

ONLINE

Elektronik Erişim

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5238312

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42.

Trustworthy systems through quantitative software engineering için kapak resmi

Trustworthy systems through quantitative software engineering

Trustworthy systems through quantitative software engineering

Yazar

Bernstein, Lawrence, 1940- Yuhas, C. M. Wiley InterScience (Online service)

Yer Numarası

ONLINE

Elektronik Erişim

IEEE Xplore http://ieeexplore.ieee.org/servlet/opac?bknumber=5988898

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43.

Accelerated stress testing handbook guide for achieving quality products için kapak resmi

Accelerated stress testing handbook guide for achieving quality products

Accelerated stress testing handbook guide for achieving quality products

Yazar

Chan, H. Anthony, 1952- Englert, Paul J, 1960-

Yer Numarası

ONLINE

Elektronik Erişim

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5270476

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44.

The design analysis handbook a practical guide to design validation için kapak resmi

The design analysis handbook a practical guide to design validation

The design analysis handbook a practical guide to design validation

Yazar

Walker, N. Edward.

Yer Numarası

ONLINE

Elektronik Erişim

ScienceDirect http://www.sciencedirect.com/science/book/9780750690881

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