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SpringerLink (Online service)

(158)

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(14)

Dhillon, B. S. (Balbir S.), 1947, author.

(6)

(5)

John Wiley & Sons.

(3)

Liu, Honghai. editor.

(3)

Liu, Lianqing. editor. (orcid)

(3)

Ouyang, Xiaoping. editor.

(3)

Panigrahi, Bijaya Ketan. editor.

(3)

Taylor and Francis.

(3)

Wang, Zhiyong. editor.

(3)

Yang, Geng. editor.

(3)

Yang, Huayong. editor.

(3)

Yin, Zhouping. editor.

(3)

Zou, Jun. editor.

(3)

Ampadu, Paul. author.

(2)

Arefin, Mohammad Shamsul. editor.

(2)

Auwera, Johan van der, contributor.

(2)

Bevington, Philip R., 1933-

(2)

Biemer, Paul P.

(2)

Bourland, J. Daniel.

(2)

Chen, C. H. (Chi-hau), 1937-

(2)

Clyne, Michael, contributor.

(2)

Comrie, Bernard, contributor.

(2)

Damasio, Antonio R.

(2)

Das, Swagatam. editor.

(2)

Dhillon, B. S. author.

(2)

Dow, John O., 1941-

(2)

Duan, Nan. editor.

(2)

Duffy, Vincent G.

(2)

Harris, Don. editor.

(2)

Hollnagel, Erik, 1941-

(2)

Hong, Yu. editor.

(2)

Jacko, Julie A.

(2)

Kaiser, M. Shamim. editor.

(2)

Kartalopoulos, Stamatios V.

(2)

Karwowski, Waldemar, 1953-

(2)

Knapčíková, Lucia. editor. (orcid)0000-0003-1925-4038

(2)

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(2)

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(2)

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(2)

Moni, Mohammad Ali. editor.

(2)

Morelos-Zaragoza, Robert H.

(2)

Nakhleh, Raouf E. editor.

(2)

Nickel, Gerhard, contributor.

(2)

Pawlicki, Todd.

(2)

Peraković, Dragan. editor.

(2)

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(2)

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(2)

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(2)

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(2)

(2)

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(2)

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(2)

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(2)

Wilpert, Bernhard, 1936-

(2)

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(2)

Öztürk, Ergün

(2)

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(1)

A. Alzubi, Omar. author.

(1)

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(1)

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(1)

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(1)

Abboud, Peter, contributor.

(1)

Abraham, Werner, contributor.

(1)

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(1)

Abur, Ali, 1957, author.

(1)

Adámek, Jiří, ing.

(1)

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(1)

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(1)

Agustín Llach, María del Pilar, author.

(1)

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(1)

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(1)

(1)

Ainsworth, Mark, 1965-

(1)

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(1)

(1)

Alam, M. Shahria. editor.

(1)

Alexandre, Luís A. author.

(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

Alwin, Duane F. (Duane Francis), 1944-

(1)

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(1)

American Institute of Chemical Engineers. Center for Chemical Process Safety.

(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

Ay, Gülşen Demir.

(1)

Aydınalp, Sezai.

(1)

BIERWISCH, MANFRED, contributor.

(1)

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(1)

BROWN, GORDON D. A., contributor.

(1)

BUTTERWORTH, BRIAN, contributor.

(1)

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(1)

(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

Bańczerowski, Jerzy, contributor.

(1)

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(1)

Bednyi, G. Z. (Grigorii Zakharovich)

(1)

Bell, William R., 1943-

(1)

Bellanger, Maurice. Adaptive digital filters and signal analysis.

(1)

Bellanger, Maurice., author.

(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

Braun, Michael. author.

(1)

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(1)

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(1)

Brinton, Alan, contributor.

(1)

Broccias, Cristiano, contributor.

(1)

Broomfield, Eamon.

(1)

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(1)

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(1)

Bruen, Aiden A., 1941-

(1)

Bruthiaux, Paul, contributor.

(1)

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(1)

Brylinski, Ranee K.

(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

(1)

(1)

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(1)

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(1)

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(1)

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(1)

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1.

Error correction coding mathematical methods and algorithms için kapak resmi

Error correction coding mathematical methods and algorithms

Error correction coding mathematical methods and algorithms

Yazar

Moon, Todd K.

Yer Numarası

ONLINE

Elektronik Erişim

Click for information
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=232610
John Wiley http://dx.doi.org/10.1002/0471739219
John Wiley http://dx.doi.org/10.1002/9780471739210
http://www3.interscience.wiley.com/cgi-bin/bookhome/109921063

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2.

Optical bit error rate : an estimation methodology için kapak resmi

Optical bit error rate : an estimation methodology

Optical bit error rate : an estimation methodology

Yazar

Kartalopoulos, Stamatios V.

Yer Numarası

TK5103.59 K363 2004

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3.

Optical bit error rate an estimation methodology için kapak resmi

Optical bit error rate an estimation methodology

Optical bit error rate an estimation methodology

Yazar

Kartalopoulos, Stamatios V.

Yer Numarası

ONLINE

Elektronik Erişim

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263060

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4.

Radar interferometry : data interpretation and error analysis için kapak resmi

Radar interferometry : data interpretation and error analysis

Radar interferometry : data interpretation and error analysis

Yazar

Hanssen, Ramon F.

Yer Numarası

QB500.26.S67 H36 2001

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5.

Error control and adaptivity in scientific computing için kapak resmi

Error control and adaptivity in scientific computing

Error control and adaptivity in scientific computing

Yazar

Bulgak, Hayder, ed. Zenger, Christoph Wilhelm, 1940- ed.

Yer Numarası

QA 76.9.C65 E77 1999

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6.

Cognitive reliability and error analysis method CREAM için kapak resmi

Cognitive reliability and error analysis method CREAM

Cognitive reliability and error analysis method CREAM

Yazar

Hollnagel, Erik, 1941-

Yer Numarası

ONLINE

Elektronik Erişim

ScienceDirect http://www.sciencedirect.com/science/book/9780080428482

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7.

Data reconciliation & gross error detection an intelligent use of process data için kapak resmi

Data reconciliation & gross error detection an intelligent use of process data

Data reconciliation & gross error detection an intelligent use of process data

Yazar

Narasimhan, Shankar. Jordache, Cornelius.

Yer Numarası

ONLINE

Elektronik Erişim

ScienceDirect http://www.sciencedirect.com/science/book/9780884152552

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8.

A unified approach to the finite element method and error analysis procedures için kapak resmi

A unified approach to the finite element method and error analysis procedures

A unified approach to the finite element method and error analysis procedures

Yazar

Dow, John O., 1941-

Yer Numarası

ONLINE

Elektronik Erişim

ScienceDirect http://www.sciencedirect.com/science/book/9780122214400

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9.

Measurement error in nonlinear models : a modern perspective. için kapak resmi

Measurement error in nonlinear models : a modern perspective.

Measurement error in nonlinear models : a modern perspective.

Yazar

Carroll, Raymond J. Carroll, Raymond J. Measurement error in nonlinear models.

Yer Numarası

QA278.2 .C365 2006

Elektronik Erişim

Click here to view.

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10.

Karmaşık sayılarda kavram yanılgısı ve hata ile tutum arasındaki ilişki = The relationship between misconception and error with attitude in complex numbers için kapak resmi

Karmaşık sayılarda kavram yanılgısı ve hata ile tutum arasındaki ilişki = The relationship between misconception and error with attitude in complex numbers

Karmaşık sayılarda kavram yanılgısı ve hata ile tutum arasındaki ilişki = The relationship between misconception and error with attitude in complex numbers

Yazar

Keçeli, Vildan

Yer Numarası

TEZ/8260 .K434 2007

Format:

Durum

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11.

Error Logic: Paving Pathways for Intelligent Error Identification and Management için kapak resmi

Error Logic: Paving Pathways for Intelligent Error Identification and Management

Error Logic: Paving Pathways for Intelligent Error Identification and Management

Yazar

Liu, Shiyong. author. Guo, Kaizhong. author. SpringerLink (Online service)

Yer Numarası

ONLINE

Elektronik Erişim

https://doi.org/10.1007/978-3-031-00820-7

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12.

Advances in Human Error, Reliability, Resilience, and Performance Proceedings of the AHFE 2018 International Conference on Human Error, Reliability, Resilience, and Performance, July 21-25, 2018, Loews Sapphire Falls Resort at Universal Studios, Orlando, Florida, USA için kapak resmi

Advances in Human Error, Reliability, Resilience, and Performance Proceedings of the AHFE 2018 International Conference on Human Error, Reliability, Resilience, and Performance, July 21-25, 2018, Loews Sapphire Falls Resort at Universal Studios, Orlando, Florida, USA

Advances in Human Error, Reliability, Resilience, and Performance Proceedings of the AHFE 2018 International Conference on Human Error, Reliability, Resilience, and Performance, July 21-25, 2018, Loews Sapphire Falls Resort at Universal Studios, Orlando, Florida, USA

Yazar

Boring, Ronald L. editor. SpringerLink (Online service)

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ONLINE

Elektronik Erişim

https://doi.org/10.1007/978-3-319-94391-6

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Çevrimiçi Kütüphane~1

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