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49. 
Computational intelligence and mathematical applications : proceedings of the International Conference on Computational Intelligence and Mathematical Applications için kapak resmi
Computational intelligence and mathematical applications : proceedings of the International Conference on Computational Intelligence and Mathematical Applications
Yazar 
International Conference on Computational Intelligence and Mathematical Applications (2023 : Panipat, India). Prasad, Devendra. Gupta, Suresh Chand. Gandhi, Anju Bhandari. Mehla, Stuti.
Yer Numarası 
Q342
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003534112
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50. 
International Conference on Sustainability in Digital Transformation Era : Driving Innovative and Growth (SIDTE 2023) için kapak resmi
International Conference on Sustainability in Digital Transformation Era : Driving Innovative and Growth (SIDTE 2023)
Yazar 
Agrawal, Rajeev, editor. Srivastava, Arun Pratap, editor. Sugiyama, Akihiko, editor.
Yer Numarası 
LC1100 .I584 2024 EB
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003534136
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51. 
Data science and machine learning for non-programmers : using SAS Enterprise Miner için kapak resmi
Data science and machine learning for non-programmers : using SAS Enterprise Miner
Yazar 
Truong, Dothang, author.
Yer Numarası 
Q325.5
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003162872
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52. 
Intelligent approaches to cyber security için kapak resmi
Intelligent approaches to cyber security
Yazar 
Shekokar, Narendra M., editor. Vasudevan, Hari, 1969- editor. Durbha, Surya Srinivas, editor. Michalas, Antonis, editor. Nagarhalli, Tatwadarshi P., editor.
Yer Numarası 
QA76.9 .A25
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003408307
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53. 
TECHNOLOGICAL INNOVATIONS & APPLICATIONS IN INDUSTRY 4.0 Proceedings of the International Conference on Technological Innovations & Applications in Industry 4.0: Challenges and Way Ahead, (ICTIA-2024), 24th to 25th April, 2024 Nagpur, India için kapak resmi
TECHNOLOGICAL INNOVATIONS & APPLICATIONS IN INDUSTRY 4.0 Proceedings of the International Conference on Technological Innovations & Applications in Industry 4.0: Challenges and Way Ahead, (ICTIA-2024), 24th to 25th April, 2024 Nagpur, India
Yazar 
International Conference on Technological Innovations & Applications in Industry 4.0 (2024 : Nagpur, India) Seth, Dinesh.
Yer Numarası 
T173.8
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003567653
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54. 
Multifaceted approaches for data acquisition processing and communication için kapak resmi
Multifaceted approaches for data acquisition processing and communication
Yazar 
Chakraborty, Chinmay, 1984- editor.
Yer Numarası 
QA76.9 .D32
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003470939
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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55. 
DEEP LEARNING FOR MULTIMEDIA PROCESSING APPLICATIONS. VOLUME ONE, Image security and intelligent systems for multimedia processing için kapak resmi
DEEP LEARNING FOR MULTIMEDIA PROCESSING APPLICATIONS. VOLUME ONE, Image security and intelligent systems for multimedia processing
Yazar 
Bhatti, Uzair Aslam. Mengxing, Huang. Li, Jingbing. Bazai, Sibghat Ullah. Aamir, Muhammad.
Yer Numarası 
QA76.575
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003427674
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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56. 
Artificial intelligence and large language models : an introduction to the technological future için kapak resmi
Artificial intelligence and large language models : an introduction to the technological future
Yazar 
Thakur, Kutub, author. Barker, Helen G., author. Pathan, Al-Sakib Khan, author.
Yer Numarası 
QA76.9 .N38
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003474173
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57. 
Advances in computational intelligence and its applications. için kapak resmi
Advances in computational intelligence and its applications.
Yazar 
International Conference on Advances in Computational Intelligence and its Applications (2023 : Hyderabad, India) Ahmad, Sheikh Fahad. Siddiqui, Shadab. Debnath, Rajib. Das, Kakali.
Yer Numarası 
Q335 .I58 2024
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003488682
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58. 
EMERGING TRENDS IN IOT AND COMPUTING TECHNOLOGIES proceedings of the International Conference on Emerging Trends in IoT and Computing Technologies-2023 (ICEICT-2023), Goel Institute of Technology & Management, Lucknow, India için kapak resmi
EMERGING TRENDS IN IOT AND COMPUTING TECHNOLOGIES proceedings of the International Conference on Emerging Trends in IoT and Computing Technologies-2023 (ICEICT-2023), Goel Institute of Technology & Management, Lucknow, India
Yazar 
International Conference on Emerging Trends in IoT and Computing Technologies (2023 : Lucknow, India), creator. Tripathi, Suman Lata, editor.
Yer Numarası 
TK5105.8857
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003535423
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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59. 
ADVANCEMENTS IN SCIENCE AND TECHNOLOGY FOR HEALTHCARE, AGRICULTURE, AND ENVIRONMENTAL SUSTAINABILITY a review of the latest research and innovations : proceedings of the International Analytics Conference (IAC) 2023, February 2& 3 2003, Hyderabad, India / virtual / world wide. için kapak resmi
ADVANCEMENTS IN SCIENCE AND TECHNOLOGY FOR HEALTHCARE, AGRICULTURE, AND ENVIRONMENTAL SUSTAINABILITY a review of the latest research and innovations : proceedings of the International Analytics Conference (IAC) 2023, February 2& 3 2003, Hyderabad, India / virtual / world wide.
Yazar 
International Analytics Conference : (2023 : Hyderabad, India). Karras, Dimitrios A. Thakur, Srinesh. Oruganti, Sai Kiran.
Yer Numarası 
R855.3
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781032708348
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60. 
Embedded software system testing : automatic testing solution based on formal method için kapak resmi
Embedded software system testing : automatic testing solution based on formal method
Yazar 
Yin, Yongfeng, 1978- author. Jiang, Bo, 1981- author. Su, Qingran, translator. Qiu, Ruinan, translator. Guo, Yang (Translator), translator.
Yer Numarası 
TK7895 .E42
Elektronik Erişim 
Taylor & Francis https://www.taylorfrancis.com/books/9781003390923
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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