Search Results for Metrology.

|

Kütüphane Hesabım

|

|

|

Remember to clear the cache and close the browser window.

Search Limit

Rooms Restriction Values

8

Search Field

Target Value

Limit Value

Restriction Value

Arama:

Gelişmiş Arama

Arama Sonuçlarını Sınırlandır

Yazar

SpringerLink (Online service)

(19)

Collège français de métrologie.

(2)

Gåsvik, Kjell J.

(2)

John Wiley & Sons.

(2)

(2)

Mills, David L.

(2)

Osten, Wolfgang. editor.

(2)

Whitehouse, D. J. (David J.)

(2)

Whitehouse, D. J. (David J.). Handbook of surface metrology.

(2)

Wiley InterScience (Online service)

(2)

Abran, Alain, 1949-

(1)

(1)

Bandyopadhyay, Sanghamitra. editor.

(1)

Berglund, Birgitta.

(1)

Boutier, A. (Alain)

(1)

Bowen, D. Keith (David Keith), 1940-

(1)

Brown, Christopher A. editor.

(1)

Brown, Robert. author.

(1)

Callegaro, Luca.

(1)

Cardoso, Jaime S. editor.

(1)

Ciaccio, Marcello. editor.

(1)

Czichos, Horst. editor.

(1)

Diebold, A. C. (Alain C.)

(1)

Diering, Magdalena. editor.

(1)

Donnerhacke, Karl-Heinz.

(1)

Emery, A. F. (Ashley Francis), 1934- author.

(1)

Engen, Glenn F.

(1)

(1)

Forbes, Alistair B. editor.

(1)

Franceschini, Fiorenzo. author.

(1)

Fujita, Daisuke, editor.

(1)

Galetto, Maurizio. author.

(1)

Galyer, J. F. W.

(1)

Gao, Wei. editor.

(1)

Gläser, Michael, 1942-

(1)

Gupta, S. V. author.

(1)

Harding, Kevin G.

(1)

Hebra, Alexius J. author.

(1)

Hocken, Robert J.

(1)

Horn, Alexander, PD Dr.

(1)

International Metrology Conference (13th : 2007 : French College of Metrology)

(1)

Kaiser, Debra L., editor.

(1)

Kaschke, Michael F.

(1)

Kaufmann, Guillermo H.

(1)

Kes, P. H. (Peter H.)

(1)

Kochsiek, Manfred.

(1)

Kramer, Thomas R. author.

(1)

Kryszkiewicz, Marzena. editor.

(1)

Kujawinska, Malgorzata. editor.

(1)

(1)

Liu, Zheng. editor.

(1)

Maisano, Domenico. author.

(1)

Mansfield, Elisabeth, editor.

(1)

Mark, William D.

(1)

Mastrogiacomo, Luca. author.

(1)

Meinrath, G. author.

(1)

Muralikrishnan, Bala. author.

(1)

Niel, Kurt. editor.

(1)

Osten, Wolfgang.

(1)

(1)

Padilla, J. Moisés (José Moisés), author.

(1)

Pal, Sankar K. editor.

(1)

Pardo, Xosé M. editor.

(1)

Paredes, Roberto. editor.

(1)

Pavese, Franco. editor.

(1)

Pereira, Paulo H.

(1)

Pralio, Barbara. author.

(1)

Proulx, Tom. editor.

(1)

Quinten, Michael.

(1)

Quiroga, J. Antonio (Juan Antonio), author.

(1)

Raja, Jay. author.

(1)

Ramuhalli, Pradeep. editor.

(1)

Raza, Hassan. editor.

(1)

Reingand, Nadya.

(1)

Rill, Michael Stefan.

(1)

Rogalla, H. (Horst)

(1)

Rybinski, Henryk. editor.

(1)

Saito, Tetsuya. editor.

(1)

Schaeffer, Ronald D.

(1)

Schneider, Petra. author.

(1)

Servín, Manuel, author.

(1)

Shotbolt, C. R., ort. yaz.

(1)

Silvani, Xavier. author.

(1)

Smith, Leslie. editor.

(1)

(1)

Tanner, B. K. (Brian Keith)

(1)

Tuchin, V. V. (Valeri? Viktorovich)

(1)

Ukida, Hiroyuki. editor.

(1)

Voorde, M. H. van de (Marcel H.), editor.

(1)

Vosk, Ted, author.

(1)

Wieczorowski, Michał. editor.

(1)

Wong, Terence K. S.

(1)

Xu, Xun. author.

(1)

Yoshizawa, T?ru, 1939-

(1)

Zhao, Yaoyao (Fiona). author.

(1)

Tümünü genişlet

Dil

(58)

(1)

Yayın Yılı

-

(11)

(8)

(7)

(6)

(5)

(4)

(3)

(3)

(2)

(2)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

Tümünü genişlet

Konu

(8)

(8)

Electronic books.

(7)

Nanotechnology.

(5)

Optical measurements.

(4)

(4)

Surfaces (Physics).

(4)

Computer aided design.

(3)

(3)

Computer vision.

(2)

Hydraulic engineering.

(2)

(2)

(2)

Microtechnology.

(2)

Optical measurements -- Handbooks, manuals, etc.

(2)

Physical measurements.

(2)

Quality control.

(2)

Speckle metrology.

(2)

Surfaces (Technology) -- Measurement.

(2)

(2)

Analytical biochemistry.

(1)

Ağırlıklar ve ölçüler -- Türkiye

(1)

COMPUTERS -- Software Development & Engineering -- Quality Assurance & Testing.

(1)

Chemical engineering.

(1)

(1)

(1)

Compound semiconductors -- Design and construction -- Materials.

(1)

Compound semiconductors.

(1)

Computer networks -- Management.

(1)

Computer networks.

(1)

Computer science -- Mathematics.

(1)

Control engineering systems.

(1)

Coordinate measuring machines.

(1)

Corrosion and anti-corrosives.

(1)

Diffraction patterns.

(1)

Dimensional analysis -- Handbooks, manuals, etc.

(1)

Dimensional analysis.

(1)

Distribution (Probability theory).

(1)

Electric network analyzers.

(1)

(1)

(1)

Engineering Fluid Dynamics.

(1)

Engineering Thermodynamics, Heat and Mass Transfer.

(1)

Engineering design.

(1)

Engineering mathematics.

(1)

Environmental toxicology.

(1)

(1)

Fluid mechanics -- Measurement.

(1)

(1)

Forensic sciences.

(1)

Gamma ray detectors -- Materials.

(1)

Gearing -- Vibration -- Mathematical models.

(1)

Gearing -- Vibration -- Measurement.

(1)

(1)

Holographic testing.

(1)

Human information processing -- Mathematical models.

(1)

Image processing.

(1)

Imaging systems in medicine -- Handbooks, manuals, etc.

(1)

Imaging systems.

(1)

Industrial engineering.

(1)

Industrial safety.

(1)

Integrated circuits -- Measurement.

(1)

Interferometry.

(1)

(1)

Lasers -- Industrial applications.

(1)

(1)

Mass (Physics) -- Measurement.

(1)

Mathematical statistics.

(1)

(1)

(1)

Measurement -- Congresses.

(1)

Measurement -- Handbooks, manuals, etc.

(1)

Measurement Science and Instrumentation.

(1)

(1)

Mechanical engineering.

(1)

Mechanics, applied.

(1)

(1)

(1)

Metrology -- Handbooks, manuals, etc.

(1)

(1)

Microelectromechanical systems -- Measurement.

(1)

Microelectronics -- Measurement.

(1)

Microwave circuits.

(1)

Microwave measurements.

(1)

Motor vehicles -- Transmission devices.

(1)

Motor vehicles -- Vibration -- Measurement.

(1)

Nanophotonics -- Handbooks, manuals, etc.

(1)

(1)

Nanotechnologie.

(1)

Network Time Protocol (Computer network protocol)

(1)

(1)

Oceanographic instruments.

(1)

Oceanography -- Measurement.

(1)

Ophthalmology -- Equipment and supplies.

(1)

Optical data processing.

(1)

Optometry -- Equipment and supplies.

(1)

Parameter estimation.

(1)

Perception -- Mathematical models.

(1)

Photobiology -- Handbooks, manuals, etc.

(1)

Photonics -- Handbooks, manuals, etc.

(1)

(1)

Phototherapy -- Handbooks, manuals, etc.

(1)

Physical measurements

(1)

(1)

(1)

Semiconductor wafers -- Inspection.

(1)

Semiconductors -- Design and construction -- Materials.

(1)

Semiconductors -- Design and construction -- Quality control.

(1)

Semiconductors -- Inspection.

(1)

Semiconductors -- Measurement.

(1)

Senses and sensation -- Mathematical models.

(1)

Signal processing.

(1)

Silicon-on-insulator technology.

(1)

Software measurement -- Design -- Case studies.

(1)

Software measurement -- Design.

(1)

Speckle-Interferometrie.

(1)

Speckle-Metrologie.

(1)

Speckle-Metrology.

(1)

Speech processing systems.

(1)

(1)

Structural control (Engineering).

(1)

Superconductors -- Industrial applications.

(1)

Superconductors -- Research -- History.

(1)

Synchronization.

(1)

Synchronous data transmission systems.

(1)

Thin films -- Optical properties.

(1)

(1)

Three-dimensional imaging.

(1)

Timing circuits -- Design and construction.

(1)

Waste disposal.

(1)

Weights and measures -- Turkey

(1)

Weights and measures.

(1)

X-ray diffractometer -- Materials.

(1)

X-rays -- Diffraction.

(1)

X-rays -- Measurement -- Materials.

(1)

(1)

(1)

Tümünü genişlet

Materyal Türü

Shelf Location

Beytepe Genel Koleksiyon

Elektronik Kütüphane

Kütüphane

Beytepe Kütüphanesi

Çevrimiçi Kütüphane

{sortLabel}

	{facetName}	{results}

	{displayName}	{count}
{error}

Liste görünümüne geç

Küçük resim görünümüne geç

Eylem Seç

Ayırt
Listelerime ekle
Eposta
Yazdır

60 sonuç bulundu

Arama sonuçlarına abone ol

1 2 3 4 5

000000000000DEFAULT_TR

Yazdır

Liste seç

Bunu varsayılan liste yap.

Öğeler başarıyla eklendi

Öğeler eklenirken hata oldu. Lütfen tekrar deneyiniz.

One or more items could not be added because you are not logged in.

49.

Electrical impedance principles, measurement, and applications için kapak resmi

Electrical impedance principles, measurement, and applications

Electrical impedance principles, measurement, and applications

Yazar

Callegaro, Luca.

Yer Numarası

ONLINE

Elektronik Erişim

Distributed by publisher. Purchase or institutional license may be required for access.

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

50.

Yasal metroloji için kapak resmi

Yasal metroloji

Yasal metroloji

Yer Numarası

QC89.T9 Y37 2013

Format:

Durum

Beytepe Kütüphanesi~1

Rafta:
Kopya:

51.

100 years of superconductivity için kapak resmi

100 years of superconductivity

100 years of superconductivity

Yazar

Rogalla, H. (Horst) Kes, P. H. (Peter H.)

Yer Numarası

ONLINE

Elektronik Erişim

Distributed by publisher. Purchase or institutional license may be required for access.

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

52.

Coordinate measuring machines and systems için kapak resmi

Coordinate measuring machines and systems

Coordinate measuring machines and systems

Yazar

Hocken, Robert J. Pereira, Paulo H.

Yer Numarası

ONLINE

Elektronik Erişim

Distributed by publisher. Purchase or institutional license may be required for access.

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

53.

Fundamentals of laser micromachining için kapak resmi

Fundamentals of laser micromachining

Fundamentals of laser micromachining

Yazar

Schaeffer, Ronald D.

Yer Numarası

ONLINE

Elektronik Erişim

Distributed by publisher. Purchase or institutional license may be required for access.

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

54.

Measurements with persons theory, methods, and implementation areas için kapak resmi

Measurements with persons theory, methods, and implementation areas

Measurements with persons theory, methods, and implementation areas

Yazar

Berglund, Birgitta.

Yer Numarası

ONLINE

Elektronik Erişim

Click here to view

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

55.

Compound semiconductor radiation detectors için kapak resmi

Compound semiconductor radiation detectors

Compound semiconductor radiation detectors

Yazar

Owens, Alan.

Yer Numarası

ONLINE

Elektronik Erişim

Distributed by publisher. Purchase or institutional license may be required for access.

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

56.

Computer network time synchronization the Network Time Protocol on Earth and in space için kapak resmi

Computer network time synchronization the Network Time Protocol on Earth and in space

Computer network time synchronization the Network Time Protocol on Earth and in space

Yazar

Mills, David L.

Yer Numarası

ONLINE

Elektronik Erişim

Distributed by publisher. Purchase or institutional license may be required for access.

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

57.

Fundamental principles of engineering nanometrology için kapak resmi

Fundamental principles of engineering nanometrology

Fundamental principles of engineering nanometrology

Yazar

Leach, R. K.

Yer Numarası

ONLINE

Elektronik Erişim

ScienceDirect http://www.sciencedirect.com/science/book/9780080964546

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

58.

Handbook of photonics for biomedical science için kapak resmi

Handbook of photonics for biomedical science

Handbook of photonics for biomedical science

Yazar

Tuchin, V. V. (Valeri? Viktorovich)

Yer Numarası

ONLINE

Elektronik Erişim

Distributed by publisher. Purchase or institutional license may be required for access.

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

59.

Fundamental principles of engineering nanometrology için kapak resmi

Fundamental principles of engineering nanometrology

Fundamental principles of engineering nanometrology

Yazar

Leach, R. K.

Yer Numarası

ONLINE(355774.1)

Elektronik Erişim

ScienceDirect http://www.sciencedirect.com/science/book/9781455777532
http://www.sciencedirect.com/science/book/9780080964546

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

60.

Computer network time synchronization the network time protocol için kapak resmi

Computer network time synchronization the network time protocol

Computer network time synchronization the network time protocol

Yazar

Mills, David L.

Yer Numarası

ONLINE

Elektronik Erişim

Distributed by publisher. Purchase or institutional license may be required for access.

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

Eylem Seç

Ayırt
Listelerime ekle
Eposta
Yazdır

1 2 3 4 5

Copyright 2011 Sirsi Corporation - Enterprise Version 5.0.0.11