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SpringerLink (Online service)

(145)

Taylor and Francis.

(4)

Kunkel, Julian M. editor.

(3)

Pasricha, Sudeep. editor.

(3)

Schagaev, Igor. author.

(3)

Schoitsch, Erwin. editor.

(3)

Shafique, Muhammad. editor.

(3)

Vishnevskiy, Vladimir M. editor. (orcid)0000-0001-7373-4847

(3)

Abu-Mahfouz, Adnan M. editor. (orcid)0000-0002-6413-3924

(2)

Amadi-Echendu, Joe. editor.

(2)

Balaji, Pavan. editor.

(2)

Ball, Andrew D. editor. (orcid)0000-0001-7540-8965

(2)

Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121

(2)

Duong, Trung Q., editor.

(2)

Fahim, Muhammad. editor. (orcid)0000-0001-6259-5458

(2)

Fakhfakh, Mourad. editor.

(2)

Guiochet, Jérémie. editor.

(2)

Ilyas, Mohammad, 1953-

(2)

Khan, Samee U. editor.

(2)

Khatir, Samir. editor.

(2)

Kozyrev, Dmitry V. editor.

(2)

Li, Jinwen. editor.

(2)

Maciel, Paulo Romero Martins, author.

(2)

Malyshkin, Victor. editor.

(2)

Milani, Gabriele. editor. (orcid)0000-0001-5462-3420

(2)

Nakagawa, Toshio. author.

(2)

Ouyang, Huajiang. editor. (orcid)0000-0003-0312-0326

(2)

Perez, Robert X., editor.

(2)

Rasheed, Jawad. editor. (orcid)0000-0003-3761-1641

(2)

Samouylov, Konstantin E. editor.

(2)

Siarry, Patrick. editor.

(2)

Singh, Chandan Deep, editor.

(2)

Sinha, Jyoti K. editor. (orcid)0000-0001-9202-1789

(2)

Tlelo-Cuautle, Esteban. editor.

(2)

Tonetta, Stefano. editor.

(2)

Wang, Zuolu. editor.

(2)

Xiao, Liquan. editor.

(2)

Xu, Weixia. editor.

(2)

Zhang, Chengyi. editor.

(2)

Zhao, Xufeng. author.

(2)

Zomaya, Albert Y. editor.

(2)

Abbas, Assad. editor.

(1)

Abbasi, Qammer H., editor.

(1)

Abdul-Nour, Georges. editor.

(1)

Abeyratne, Athula I., author.

(1)

Adimoolam, Boominathan. editor.

(1)

Agarwal, R. K. (Ramesh K.), author.

(1)

Agarwal, Rakish, author.

(1)

Agrawal, Pratibha (Pratibha S.), author.

(1)

Agrawal, Yash. editor. (orcid)0000-0001-9736-9581

(1)

Ahmed, Hosameldin, 1976- author.

(1)

(1)

Aiken, Alex. author.

(1)

Al-Begain, Khalid. editor.

(1)

American Institute of Chemical Engineers. Center for Chemical Process Safety, author.

(1)

An, Jianpin, author.

(1)

Ananthan, Sundaravaradan Navalpakkam, author.

(1)

Ang, Alfredo Hua-Sing, 1930-

(1)

Anisimov, V. I. (Vladimir Ilʹich)

(1)

Annual Congress on Advanced Engineering and Technology (CAET) (2014 : Hong Kong). author.

(1)

Ansari, Farhad. editor.

(1)

Antonopoulos, Nick. editor.

(1)

Ao, Sio-Iong. editor.

(1)

Apduhan, Bernady O. editor.

(1)

Bandyopadhyay, Sandipan. editor.

(1)

Banerjee, Utpal. author.

(1)

Bargiela, Andrzej. editor.

(1)

Barolli, Admir. editor.

(1)

Barolli, Leonard. editor.

(1)

Barrios Hernández, Carlos Jaime. editor.

(1)

Basarkar, Sunil S. editor.

(1)

Bath, Jasbir, editor.

(1)

Baxter, Walt. editor.

(1)

Bedny, Gregory Z., author.

(1)

Bedny, Inna, author.

(1)

Belkhode, Pramod, author.

(1)

Benaissa, Brahim. editor.

(1)

Bender, Emmanuel (Carl), author.

(1)

Bennis, Mehdi, editor.

(1)

Bensoussan, Alain A., author.

(1)

Bernard, E. Stefan (Erik Stefan)

(1)

Bernstein, Joseph B., author.

(1)

Bhatia, Jitendra. editor.

(1)

Bhattacharya, Gautam.

(1)

Bhattacharyya, Dhruba K. author.

(1)

Bhuyan, Monowar H. author.

(1)

Bianchi, Filippo Maria. author.

(1)

Bieńkowska, Agnieszka, author.

(1)

Bitsch, Friedemann. editor.

(1)

Bittencourt, Marco. editor. (orcid)0000-0002-5490-297X

(1)

Bloch, Heinz P., 1933- author.

(1)

Bokan Bosiljkov, Violeta. editor.

(1)

Boring, Ronald L. editor.

(1)

Boring, Ronald Laurids. editor.

(1)

(1)

Braga, Ana Cristina. editor.

(1)

Brinkmann, Steffen. editor.

(1)

Brown, Richard E., 1969- author.

(1)

Brunstrom, Anna. editor.

(1)

Buchmann, Johannes. author.

(1)

Budris, Allan R., author.

(1)

Buhr, Peter A. author.

(1)

C. C. Lourenço, Nuno. author.

(1)

(1)

Calafate, Carlos. editor.

(1)

Campbell, Roy Harold, editor.

(1)

Capozucca, Roberto. editor.

(1)

Cardoni, Alessandro. editor.

(1)

Cardoso, João M.P. editor.

(1)

Chakraborty, Rajdeep, editor.

(1)

Chandramouli, Devaki, editor.

(1)

Chapple, Mike, 1975- author.

(1)

Chatterjee, Bijoy Chand. author.

(1)

Chatterjee, Prasenjit, 1982- editor.

(1)

Chatterjee, Prasenjit, editor.

(1)

Chaturvedi, Sanjay K., editor.

(1)

Chemuturi, Murali. author.

(1)

Chen, Andrea., author.

(1)

Chen, Fengjuan. editor.

(1)

Chen, Ran, Dr., editor.

(1)

Chen, Shi-Shuenn.

(1)

Chen, Wai-Fah, 1936-

(1)

Chen, Zhiwen. author.

(1)

Cheptsov, Alexey. editor.

(1)

Chmaj, Grzegorz. editor.

(1)

Choi, Jaeseok, author.

(1)

Choudhary, Meenakshi. editor.

(1)

Choudhury, Tanupriya, editor.

(1)

Chowdhury, Robin, author.

(1)

Chu, Xiaoli, editor.

(1)

Cimellaro, Gian Paolo. editor.

(1)

Cimellaro, Gian Paolo. editor. (orcid)0000-0001-6474-3493

(1)

Cioboată, Daniela Doina. editor.

(1)

Cisnal de la Rica, Ana. author. (orcid)0000-0002-1556-7179

(1)

Clinton, David, author.

(1)

Cook, Robert F.

(1)

Cotroneo, Domenico. editor.

(1)

Crespo Márquez, Adolfo. editor.

(1)

Crespo Márquez, Adolfo. editor. (orcid)0000-0002-2027-7096

(1)

Cressler, John D.

(1)

Das, Swagata, author.

(1)

Dash, Subhransu Sekhar. editor.

(1)

Davim, J. Paulo. editor. (orcid)0000-0002-5659-3111

(1)

Delaux, David, editor.

(1)

(1)

Demirel, Denise. author.

(1)

Deng, Lvxiang. editor.

(1)

Deng, Zhidong. editor.

(1)

Deodatis, George, editor.

(1)

Di Martino, Beniamino. editor.

(1)

Di Pompeo, Daniele. editor. (orcid)0000-0003-2041-7375

(1)

Dijon, Jean. editor.

(1)

Dillinger, Markus, editor.

(1)

Dishongh, Terrance J., author.

(1)

Doncel, Josu. editor. (orcid)0000-0002-5552-9134

(1)

Dongarra, Jack. editor.

(1)

Dorf, Richard C.

(1)

Duan, Baoyan, author.

(1)

Dubrova, Elena. author.

(1)

Duffuaa, Salih O. author.

(1)

Dwivedi, Vivek K. author. (orcid)0000-0003-4980-8011

(1)

Easttom, Chuck. author.

(1)

Eid, Mohamed, author.

(1)

El Hami, Abdelkhalak, author.

(1)

El Hami, Abdelkhalak, editor.

(1)

El Hami, Abdelkhalak.

(1)

El Hami, Abdelkhalak. editor.

(1)

Elleithy, Khaled. editor.

(1)

Ellingwood, Bruce R., editor.

(1)

Energy Institute (Great Britain)

(1)

Estampe, Dominique.

(1)

Fallgren, Mikael, editor.

(1)

Faltin, Frederick W., editor.

(1)

Fan, Dandan. author.

(1)

Fattahi, Ahmad, author.

(1)

Feng, Wu-chun, 1966- editor.

(1)

Ferreira, Kurt. author.

(1)

Fey, Dietmar. editor. (orcid)0000-0002-6077-4732

(1)

Fiondella, Lance. editor.

(1)

Fiore, Marco. editor.

(1)

(1)

Flores, Marcel. editor.

(1)

Frangopol, Dan M.

(1)

Frangopol, Dan M., editor.

(1)

Freundlich, Alexandre, editor.

(1)

Fu, Shaojing. editor.

(1)

Galván, Blas. editor.

(1)

Gan, Chong Leong,. author.

(1)

Gao, Huijun. author. (orcid)0000-0001-5554-5452

(1)

Garau, Chiara. editor. (orcid)

(1)

Gargama, Heeralal, editor.

(1)

Gauger, Nicolas. editor.

(1)

Gelman, Len. editor.

(1)

Gen, Mitsuo. editor.

(1)

Gervasi, Osvaldo. editor. (orcid)

(1)

Ghannam, Rami, editor.

(1)

Ghosh, Ankush. editor.

(1)

Ghosh, Anupam, editor.

(1)

Ghoshal, Sanjoy K. editor. (orcid)0000-0001-6477-3174

(1)

Giannakoglou, Kyriakos. editor.

(1)

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Electronic books.

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(21)

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(17)

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(16)

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(16)

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(15)

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(15)

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(15)

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(15)

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(14)

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(14)

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(14)

Security systems.

(14)

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(13)

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(12)

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(11)

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(10)

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(10)

(10)

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(10)

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(10)

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(10)

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(9)

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(9)

(9)

(9)

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(8)

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(7)

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(7)

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(7)

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(7)

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(7)

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(7)

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(7)

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(6)

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(6)

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(6)

(6)

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(6)

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(6)

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(6)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

(5)

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(5)

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(5)

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(5)

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(5)

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(4)

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(4)

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(4)

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(4)

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(4)

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(4)

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(4)

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(4)

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(4)

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(4)

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(4)

(4)

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(4)

(4)

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(3)

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(3)

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(3)

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(3)

(3)

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(3)

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(3)

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(3)

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(3)

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(3)

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(3)

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(3)

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(3)

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(3)

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(3)

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(3)

(3)

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(3)

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(3)

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(3)

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(3)

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(3)

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(3)

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(3)

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(3)

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(3)

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(3)

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(3)

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(3)

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(3)

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(3)

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(3)

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(3)

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(3)

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(3)

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(3)

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(3)

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(3)

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(3)

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(3)

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(2)

Aerospace Technology and Astronautics.

(2)

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(2)

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(2)

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(2)

(2)

(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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1.

CompTIA DataSys+ study guide : exam DSO-001 için kapak resmi

CompTIA DataSys+ study guide : exam DSO-001

CompTIA DataSys+ study guide : exam DSO-001

Yazar

Chapple, Mike, 1975- author. Nijim, Sharif, author.

Yer Numarası

QA76.3 .C43 2024

Elektronik Erişim

https://onlinelibrary.wiley.com/doi/book/10.1002/9781394277094

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2.

Interconnect Technologies for Integrated Circuits and Flexible Electronics için kapak resmi

Interconnect Technologies for Integrated Circuits and Flexible Electronics

Interconnect Technologies for Integrated Circuits and Flexible Electronics

Yazar

Agrawal, Yash. editor. (orcid)0000-0001-9736-9581 Mummaneni, Kavicharan. editor. Sathyakam, P. Uma. editor. (orcid)0000-0002-6203-0956 SpringerLink (Online service)

Yer Numarası

ONLINE

Elektronik Erişim

https://doi.org/10.1007/978-981-99-4476-7

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3.

Proceedings of the International Conference of Steel and Composite for Engineering Structures ICSCES 2023 için kapak resmi

Proceedings of the International Conference of Steel and Composite for Engineering Structures ICSCES 2023

Proceedings of the International Conference of Steel and Composite for Engineering Structures ICSCES 2023

Yazar

Benaissa, Brahim. editor. Capozucca, Roberto. editor. Khatir, Samir. editor. Milani, Gabriele. editor. (orcid)0000-0001-5462-3420 SpringerLink (Online service)

Yer Numarası

ONLINE

Elektronik Erişim

https://doi.org/10.1007/978-3-031-57224-1

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4.

Proceedings of the 8th International Symposium on Solid Mechanics Mecsol 2022 için kapak resmi

Proceedings of the 8th International Symposium on Solid Mechanics Mecsol 2022

Proceedings of the 8th International Symposium on Solid Mechanics Mecsol 2022

Yazar

Bittencourt, Marco. editor. (orcid)0000-0002-5490-297X Labaki, Josue. editor. SpringerLink (Online service)

Yer Numarası

ONLINE

Elektronik Erişim

https://doi.org/10.1007/978-3-031-59804-3

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5.

Measuring the Physiologic Use Conditions of Medical Devices için kapak resmi

Measuring the Physiologic Use Conditions of Medical Devices

Measuring the Physiologic Use Conditions of Medical Devices

Yazar

Baxter, Walt. editor. Lahm, Ryan. editor. SpringerLink (Online service)

Yer Numarası

ONLINE

Elektronik Erişim

https://doi.org/10.1007/978-3-031-62764-4

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6.

Applied OSS Reliability Assessment Modeling, AI and Tools Mathematics and AI for OSS Reliability Assessment için kapak resmi

Applied OSS Reliability Assessment Modeling, AI and Tools Mathematics and AI for OSS Reliability Assessment

Applied OSS Reliability Assessment Modeling, AI and Tools Mathematics and AI for OSS Reliability Assessment

Yazar

Tamura, Yoshinobu. author. (orcid)0000-0001-7665-5765 Yamada, Shigeru. author. SpringerLink (Online service)

Yer Numarası

ONLINE

Elektronik Erişim

https://doi.org/10.1007/978-3-031-64803-8

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7.

Thermal management materials for electronic packaging : preparation, characterization, and devices için kapak resmi

Thermal management materials for electronic packaging : preparation, characterization, and devices

Thermal management materials for electronic packaging : preparation, characterization, and devices

Yazar

Tian, Xingyou, editor.

Yer Numarası

TK7870.15

Elektronik Erişim

https://onlinelibrary.wiley.com/doi/book/10.1002/9783527843121

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8.

The UFAW handbook on the care and management of laboratory and other research animals için kapak resmi

The UFAW handbook on the care and management of laboratory and other research animals

The UFAW handbook on the care and management of laboratory and other research animals

Yazar

Golledge, Huw, editor. Richardson, Claire, editor.

Yer Numarası

SF406 .U55 2024

Elektronik Erişim

https://onlinelibrary.wiley.com/doi/book/10.1002/9781119555278

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9.

Reliability prediction for microelectronics için kapak resmi

Reliability prediction for microelectronics

Reliability prediction for microelectronics

Yazar

Bernstein, Joseph B., author. Bensoussan, Alain A., author. Bender, Emmanuel (Carl), author.

Yer Numarası

TK7874

Elektronik Erişim

https://onlinelibrary.wiley.com/doi/book/10.1002/9781394210961

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10.

Embedded Machine Learning for Cyber-Physical, IoT, and Edge Computing Use Cases and Emerging Challenges için kapak resmi

Embedded Machine Learning for Cyber-Physical, IoT, and Edge Computing Use Cases and Emerging Challenges

Embedded Machine Learning for Cyber-Physical, IoT, and Edge Computing Use Cases and Emerging Challenges

Yazar

Pasricha, Sudeep. editor. Shafique, Muhammad. editor. SpringerLink (Online service)

Yer Numarası

ONLINE

Elektronik Erişim

https://doi.org/10.1007/978-3-031-40677-5

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11.

Embedded Machine Learning for Cyber-Physical, IoT, and Edge Computing Software Optimizations and Hardware/Software Codesign için kapak resmi

Embedded Machine Learning for Cyber-Physical, IoT, and Edge Computing Software Optimizations and Hardware/Software Codesign

Embedded Machine Learning for Cyber-Physical, IoT, and Edge Computing Software Optimizations and Hardware/Software Codesign

Yazar

Pasricha, Sudeep. editor. Shafique, Muhammad. editor. SpringerLink (Online service)

Yer Numarası

ONLINE

Elektronik Erişim

https://doi.org/10.1007/978-3-031-39932-9

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Durum

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12.

Robust Environmental Perception and Reliability Control for Intelligent Vehicles için kapak resmi

Robust Environmental Perception and Reliability Control for Intelligent Vehicles

Robust Environmental Perception and Reliability Control for Intelligent Vehicles

Yazar

Pan, Huihui. author. Wang, Jue. author. Yu, Xinghu. author. Sun, Weichao. author. Gao, Huijun. author. (orcid)0000-0001-5554-5452

Yer Numarası

ONLINE

Elektronik Erişim

https://doi.org/10.1007/978-981-99-7790-1

Format:

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Çevrimiçi Kütüphane~1

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