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SpringerLink (Online service)

(19)

Collège français de métrologie.

(2)

Gåsvik, Kjell J.

(2)

John Wiley & Sons.

(2)

(2)

Mills, David L.

(2)

Osten, Wolfgang. editor.

(2)

Whitehouse, D. J. (David J.)

(2)

Whitehouse, D. J. (David J.). Handbook of surface metrology.

(2)

Wiley InterScience (Online service)

(2)

Abran, Alain, 1949-

(1)

(1)

Bandyopadhyay, Sanghamitra. editor.

(1)

Berglund, Birgitta.

(1)

Boutier, A. (Alain)

(1)

Bowen, D. Keith (David Keith), 1940-

(1)

Brown, Christopher A. editor.

(1)

Brown, Robert. author.

(1)

Callegaro, Luca.

(1)

Cardoso, Jaime S. editor.

(1)

Ciaccio, Marcello. editor.

(1)

Czichos, Horst. editor.

(1)

Diebold, A. C. (Alain C.)

(1)

Diering, Magdalena. editor.

(1)

Donnerhacke, Karl-Heinz.

(1)

Emery, A. F. (Ashley Francis), 1934- author.

(1)

Engen, Glenn F.

(1)

(1)

Forbes, Alistair B. editor.

(1)

Franceschini, Fiorenzo. author.

(1)

Fujita, Daisuke, editor.

(1)

Galetto, Maurizio. author.

(1)

Galyer, J. F. W.

(1)

Gao, Wei. editor.

(1)

Gläser, Michael, 1942-

(1)

Gupta, S. V. author.

(1)

Harding, Kevin G.

(1)

Hebra, Alexius J. author.

(1)

Hocken, Robert J.

(1)

Horn, Alexander, PD Dr.

(1)

International Metrology Conference (13th : 2007 : French College of Metrology)

(1)

Kaiser, Debra L., editor.

(1)

Kaschke, Michael F.

(1)

Kaufmann, Guillermo H.

(1)

Kes, P. H. (Peter H.)

(1)

Kochsiek, Manfred.

(1)

Kramer, Thomas R. author.

(1)

Kryszkiewicz, Marzena. editor.

(1)

Kujawinska, Malgorzata. editor.

(1)

(1)

Liu, Zheng. editor.

(1)

Maisano, Domenico. author.

(1)

Mansfield, Elisabeth, editor.

(1)

Mark, William D.

(1)

Mastrogiacomo, Luca. author.

(1)

Meinrath, G. author.

(1)

Muralikrishnan, Bala. author.

(1)

Niel, Kurt. editor.

(1)

Osten, Wolfgang.

(1)

(1)

Padilla, J. Moisés (José Moisés), author.

(1)

Pal, Sankar K. editor.

(1)

Pardo, Xosé M. editor.

(1)

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(1)

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(1)

Pereira, Paulo H.

(1)

Pralio, Barbara. author.

(1)

Proulx, Tom. editor.

(1)

Quinten, Michael.

(1)

Quiroga, J. Antonio (Juan Antonio), author.

(1)

Raja, Jay. author.

(1)

Ramuhalli, Pradeep. editor.

(1)

Raza, Hassan. editor.

(1)

Reingand, Nadya.

(1)

Rill, Michael Stefan.

(1)

Rogalla, H. (Horst)

(1)

Rybinski, Henryk. editor.

(1)

Saito, Tetsuya. editor.

(1)

Schaeffer, Ronald D.

(1)

Schneider, Petra. author.

(1)

Servín, Manuel, author.

(1)

Shotbolt, C. R., ort. yaz.

(1)

Silvani, Xavier. author.

(1)

Smith, Leslie. editor.

(1)

(1)

Tanner, B. K. (Brian Keith)

(1)

Tuchin, V. V. (Valeri? Viktorovich)

(1)

Ukida, Hiroyuki. editor.

(1)

Voorde, M. H. van de (Marcel H.), editor.

(1)

Vosk, Ted, author.

(1)

Wieczorowski, Michał. editor.

(1)

Wong, Terence K. S.

(1)

Xu, Xun. author.

(1)

Yoshizawa, T?ru, 1939-

(1)

Zhao, Yaoyao (Fiona). author.

(1)

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(2)

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(2)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

Imaging systems in medicine -- Handbooks, manuals, etc.

(1)

Imaging systems.

(1)

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(1)

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(1)

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(1)

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(1)

(1)

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(1)

(1)

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(1)

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(1)

(1)

(1)

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(1)

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(1)

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(1)

(1)

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(1)

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(1)

(1)

(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

(1)

Nanotechnologie.

(1)

Network Time Protocol (Computer network protocol)

(1)

(1)

Oceanographic instruments.

(1)

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(1)

Ophthalmology -- Equipment and supplies.

(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

(1)

Phototherapy -- Handbooks, manuals, etc.

(1)

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(1)

(1)

(1)

Semiconductor wafers -- Inspection.

(1)

Semiconductors -- Design and construction -- Materials.

(1)

Semiconductors -- Design and construction -- Quality control.

(1)

Semiconductors -- Inspection.

(1)

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(1)

Senses and sensation -- Mathematical models.

(1)

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(1)

Silicon-on-insulator technology.

(1)

Software measurement -- Design -- Case studies.

(1)

Software measurement -- Design.

(1)

Speckle-Interferometrie.

(1)

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(1)

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(1)

Speech processing systems.

(1)

(1)

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(1)

Superconductors -- Industrial applications.

(1)

Superconductors -- Research -- History.

(1)

Synchronization.

(1)

Synchronous data transmission systems.

(1)

Thin films -- Optical properties.

(1)

(1)

Three-dimensional imaging.

(1)

Timing circuits -- Design and construction.

(1)

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(1)

Weights and measures -- Turkey

(1)

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(1)

X-ray diffractometer -- Materials.

(1)

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(1)

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(1)

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49.

Electrical impedance principles, measurement, and applications için kapak resmi

Electrical impedance principles, measurement, and applications

Electrical impedance principles, measurement, and applications

Yazar

Callegaro, Luca.

Yer Numarası

ONLINE

Elektronik Erişim

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50.

Yasal metroloji için kapak resmi

Yasal metroloji

Yasal metroloji

Yer Numarası

QC89.T9 Y37 2013

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51.

Measurements with persons theory, methods, and implementation areas için kapak resmi

Measurements with persons theory, methods, and implementation areas

Measurements with persons theory, methods, and implementation areas

Yazar

Berglund, Birgitta.

Yer Numarası

ONLINE

Elektronik Erişim

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52.

Fundamentals of laser micromachining için kapak resmi

Fundamentals of laser micromachining

Fundamentals of laser micromachining

Yazar

Schaeffer, Ronald D.

Yer Numarası

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Elektronik Erişim

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53.

100 years of superconductivity için kapak resmi

100 years of superconductivity

100 years of superconductivity

Yazar

Rogalla, H. (Horst) Kes, P. H. (Peter H.)

Yer Numarası

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Elektronik Erişim

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54.

Compound semiconductor radiation detectors için kapak resmi

Compound semiconductor radiation detectors

Compound semiconductor radiation detectors

Yazar

Owens, Alan.

Yer Numarası

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Elektronik Erişim

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55.

Coordinate measuring machines and systems için kapak resmi

Coordinate measuring machines and systems

Coordinate measuring machines and systems

Yazar

Hocken, Robert J. Pereira, Paulo H.

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Elektronik Erişim

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56.

Computer network time synchronization the Network Time Protocol on Earth and in space için kapak resmi

Computer network time synchronization the Network Time Protocol on Earth and in space

Computer network time synchronization the Network Time Protocol on Earth and in space

Yazar

Mills, David L.

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Elektronik Erişim

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57.

Fundamental principles of engineering nanometrology için kapak resmi

Fundamental principles of engineering nanometrology

Fundamental principles of engineering nanometrology

Yazar

Leach, R. K.

Yer Numarası

ONLINE

Elektronik Erişim

ScienceDirect http://www.sciencedirect.com/science/book/9780080964546

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58.

Fundamental principles of engineering nanometrology için kapak resmi

Fundamental principles of engineering nanometrology

Fundamental principles of engineering nanometrology

Yazar

Leach, R. K.

Yer Numarası

ONLINE(355774.1)

Elektronik Erişim

ScienceDirect http://www.sciencedirect.com/science/book/9781455777532
http://www.sciencedirect.com/science/book/9780080964546

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59.

Handbook of photonics for biomedical science için kapak resmi

Handbook of photonics for biomedical science

Handbook of photonics for biomedical science

Yazar

Tuchin, V. V. (Valeri? Viktorovich)

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Elektronik Erişim

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60.

Computer network time synchronization the network time protocol için kapak resmi

Computer network time synchronization the network time protocol

Computer network time synchronization the network time protocol

Yazar

Mills, David L.

Yer Numarası

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Elektronik Erişim

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