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SpringerLink (Online service)

(482)

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(27)

Taylor and Francis.

(10)

Nakagawa, Toshio. author.

(9)

John Wiley & Sons.

(8)

Dhillon, B. S. (Balbir S.), 1947, author.

(6)

(5)

Ayyub, Bilal M., author.

(4)

Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121

(4)

Dhillon, B. S. (Balbir S.), 1947-

(4)

Pham, Hoang. author.

(4)

Pham, Hoang. editor.

(4)

Soares, C. Guedes.

(4)

Ushakov, I. A. (Igorʹ Alekseevich)

(4)

Willis, H. Lee, 1949, author.

(4)

(3)

Balakrishnan, N. editor.

(3)

Birolini, Alessandro. author.

(3)

Bitsch, Friedemann. editor.

(3)

(3)

Chen, Wai-Fah, 1936-

(3)

Dhillon, B. S. author.

(3)

Finkelstein, Maxim. author.

(3)

Ghiocel, Dan M.

(3)

Guiochet, Jérémie. editor.

(3)

Kabashkin, Igor. editor.

(3)

Licari, James J., 1930-

(3)

Nikolaidis, Efstratios.

(3)

Prentkovskis, Olegas. editor.

(3)

Romanovsky, Alexander. editor. (orcid)0000-0002-4076-3331

(3)

Singhal, Suren.

(3)

Sugier, Jarosław. editor.

(3)

(3)

Verma, Ajit Kumar. author.

(3)

Weippl, Edgar. editor.

(3)

Whitaker, Jerry C., author.

(3)

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(3)

Zamojski, Wojciech. editor.

(3)

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(3)

Adams, Kevin MacG. author.

(2)

Ajit, Srividya. author.

(2)

Alam, M. Shahria. editor.

(2)

Alampalli, Sreenivas.

(2)

American Institute of Chemical Engineers. Center for Chemical Process Safety.

(2)

Aven, Terje. author.

(2)

Azar, Ahmad Taher. editor.

(2)

Baggini, Angelo B.

(2)

Bedny, Gregory Z., author.

(2)

Blischke, W. R., 1934-

(2)

Blischke, Wallace R. author.

(2)

Bloch, Heinz P., 1933-

(2)

Bondavalli, Andrea. editor.

(2)

Cha, Ji Hwan. author.

(2)

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(2)

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(2)

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(2)

Collart-Dutilleul, Simon. editor.

(2)

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(2)

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(2)

Czaplicki, Jacek M., author.

(2)

Daniel, Peter. editor.

(2)

Davim, J. Paulo. editor. (orcid)0000-0002-5659-3111

(2)

De Doncker, Rik. author.

(2)

(2)

Dorf, Richard C.

(2)

Eerkens, Jeff W. author.

(2)

(2)

Fakhfakh, Mourad. editor.

(2)

Flammini, Francesco. editor.

(2)

Frangopol, Dan M., editor.

(2)

Frenkel, Ilia. author.

(2)

Frenkel, Ilia. editor.

(2)

Gallina, Barbara. editor. (orcid)0000-0002-6952-1053

(2)

Garau, Chiara. editor. (orcid)

(2)

Gertsbakh, Ilya. author.

(2)

Gervasi, Osvaldo. editor. (orcid)

(2)

Geurts, Bernard J. editor.

(2)

Gheorghe, Adrian V. author.

(2)

Gheorghe, Adrian V. editor.

(2)

Ghosh, Ankush. editor.

(2)

Gnedenko, B. V. (Boris Vladimirovich), 1912-1995.

(2)

Godwin, Grover Maurice.

(2)

Goodarzi, Ehsan. author.

(2)

Gopalaswamy, Venky.

(2)

Guedes Soares, Carlos.

(2)

Haddar, Mohamed. editor.

(2)

Hamrol, Adam. editor.

(2)

Harris, Gerald F.

(2)

Hausken, Kjell. editor.

(2)

Ho, Robert, author.

(2)

Hood, Ronald D.

(2)

Ilyas, Mohammad, 1953-

(2)

Katina, Polinpapilinho F. author.

(2)

Kim, Kuinam J. editor.

(2)

Klyatis, Lev M.

(2)

Koornneef, Floor. editor.

(2)

Koren, Israel, 1945-

(2)

Kurtoglu, Selahattin. author.

(2)

Lecomte, Thierry. editor.

(2)

Levitin, Gregory. editor.

(2)

Li, Jinwen. editor.

(2)

Li, Rita Yi Man. author.

(2)

Limnios, Nikolaos. author.

(2)

Liptak, Bela G.

(2)

Lisnianski, Anatoly. author.

(2)

Lisnianski, Anatoly. editor.

(2)

Liu, Yong. author.

(2)

Liu, Yu. author.

(2)

(2)

Lutz, Josef. author.

(2)

Marks, Richard M.

(2)

Mathew, Joseph. editor.

(2)

Matsagar, Vasant. editor.

(2)

Mazurkiewicz, Jacek. editor.

(2)

Mazzolani, Federico, editor.

(2)

McCuen, Richard H., 1941-

(2)

McPherson, J. W. author.

(2)

(2)

Merkow, Mark S., author.

(2)

Meyers, Johan. editor.

(2)

Misra, Krishna B., 1943-

(2)

Mobley, R. Keith, 1943-

(2)

Murgante, Beniamino. editor. (orcid)

(2)

Murthy, D. N. P.

(2)

Murthy, D. N. Prabhakar. author.

(2)

Natali, Arturo N.

(2)

Nelson, Wayne, 1936-

(2)

Ng, Kelvin Tsun Wai. editor.

(2)

Nikulin, M.S. editor.

(2)

Nwaoha, Chikezie, 1984-

(2)

O'Regan, Gerard. author.

(2)

Ohring, Milton, 1936-

(2)

Ortmeier, Frank. editor.

(2)

Papadrakakis, Manolis.

(2)

Papadrakakis, Manolis. editor.

(2)

Paprzycki, Marcin. editor.

(2)

Pecht, Michael, author.

(2)

Pluvinage, Guy. editor.

(2)

Prakash, Raghu V. editor.

(2)

(2)

Quirchmayr, Gerald. editor.

(2)

Raghavan, Lakshmikanth.

(2)

(2)

Rausand, Marvin.

(2)

Sagaut, Pierre. editor.

(2)

Sayed-Mouchaweh, Moamar. editor.

(2)

Scheuermann, Uwe. author.

(2)

Schlangenotto, Heinrich. author.

(2)

Schneidewind, Norman.

(2)

Schoitsch, Erwin. editor.

(2)

Schoitsch, Erwin. editor. (orcid)0000-0002-0335-5443

(2)

Schrieber, Randall R.

(2)

Shaw, Rabindra Nath. editor.

(2)

Shooman, Martin L.

(2)

Shoukri, M. M. (Mohamed M.), author.

(2)

Shpungin, Yoseph. author.

(2)

Siarry, Patrick. editor.

(2)

Skavhaug, Amund. editor.

(2)

Smith, Peter A., 1959-

(2)

(2)

Suhir, Ephraim.

(2)

Swanson, Dale W.

(2)

Tan, Cher Ming. author.

(2)

Tlelo-Cuautle, Esteban. editor.

(2)

Tonetta, Stefano. editor.

(2)

Troubitsyna, Elena. editor.

(2)

(2)

Varde, Prabhakar V. author.

(2)

Varde, Prabhakar V. editor.

(2)

Verma, Ajit Kumar. editor.

(2)

Vinnem, Jan Erik. author.

(2)

Vinnem, Jan-Erik. author.

(2)

Vittorini, Valeria. editor.

(2)

Walkowiak, Tomasz. editor.

(2)

Whitaker, Jerry C.

(2)

Wilpert, Bernhard, 1936-

(2)

Xiao, Liquan. editor.

(2)

Xie, Liquan, 1972- editor.

(2)

Xu, Weixia. editor.

(2)

Yadav, Sanjay. editor.

(2)

Yatskiv, Irina. editor.

(2)

You, Ilsun. editor.

(2)

Zhang, Chengyi. editor.

(2)

Zhuang, Jun. editor.

(2)

Ziaei, Mina. author.

(2)

van Aartsengel, Aristide. author.

(2)

van Gulijk, Coen. editor.

(2)

A Min, Tjoa. editor.

(1)

AITCHISON, JEAN, contributor.

(1)

Abbas, Nureddin Mohamed.

(1)

Abbas, Syed Mohsin. author.

(1)

Abdel-Hameed, Mohamed S.

(1)

Abrahamsson, Pekka. editor.

(1)

Acartürk, Cengiz, contributor.

(1)

Adams, Daniel. author.

(1)

Adimoolam, Boominathan. editor.

(1)

Adumene, Sidum. author.

(1)

(1)

Agarwal, Amit. editor.

(1)

Agarwal, Avinash Kumar. editor.

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Reliability (Engineering)

(87)

(76)

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(65)

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(52)

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(51)

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(45)

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(33)

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(33)

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(27)

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(26)

(23)

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(22)

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(22)

(21)

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(21)

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(20)

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(18)

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(17)

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(14)

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(13)

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(13)

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(13)

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(13)

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(13)

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(13)

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(12)

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(12)

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(12)

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(11)

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(11)

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(11)

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(10)

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(10)

(10)

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(10)

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(10)

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(10)

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(10)

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(9)

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(9)

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(9)

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(9)

(9)

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(8)

(8)

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(8)

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(8)

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(8)

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(8)

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(8)

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(8)

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(8)

(8)

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(7)

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(7)

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(7)

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(7)

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(7)

Information Systems.

(7)

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(7)

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(7)

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(7)

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(7)

(7)

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(7)

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(7)

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(7)

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(7)

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(6)

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(6)

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(6)

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(6)

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(6)

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(6)

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(6)

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(6)

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(6)

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(6)

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(6)

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(6)

(6)

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(6)

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(6)

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(6)

(6)

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(6)

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(6)

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(6)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

(5)

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(5)

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(4)

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(4)

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(4)

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(4)

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(4)

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(4)

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(4)

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(4)

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(4)

(4)

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(4)

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(4)

(4)

(4)

Data encryption (Computer science).

(4)

(4)

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(4)

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(4)

Electronic digital computers -- Reliability.

(4)

Embedded computer systems.

(4)

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(4)

(4)

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(4)

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(4)

Materials Engineering.

(4)

Materials science.

(4)

Mathematics -- Data processing.

(4)

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(4)

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(4)

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(4)

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(4)

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(4)

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(4)

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(4)

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(4)

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(4)

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(4)

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(4)

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(4)

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(4)

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(4)

Thermodynamics.

(4)

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(4)

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(3)

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829.

Implementing and developing cloud computing applications için kapak resmi

Implementing and developing cloud computing applications

Implementing and developing cloud computing applications

Yazar

Sarna, David E. Y., author.

Yer Numarası

QA76.585 .S37 2010

Elektronik Erişim

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830.

Geotechnical slope analysis için kapak resmi

Geotechnical slope analysis

Geotechnical slope analysis

Yazar

Chowdhury, Robin, author. Flentje, Phil. Bhattacharya, Gautam.

Yer Numarası

TA710 .C5466 2010

Elektronik Erişim

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831.

Software error detection through testing and analysis için kapak resmi

Software error detection through testing and analysis

Software error detection through testing and analysis

Yazar

Huang, J. C., 1935-

Yer Numarası

ONLINE

Elektronik Erişim

Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=456102
John Wiley http://dx.doi.org/10.1002/9780470464076
MyiLibrary, Table of contents http://www.myilibrary.com?id=227967&ref=toc
http://site.ebrary.com/lib/alltitles/Doc?id=10332960
http://swb.eblib.com/patron/FullRecord.aspx?p=456102

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832.

Systems and software engineering with applications için kapak resmi

Systems and software engineering with applications

Systems and software engineering with applications

Yazar

Schneidewind, Norman.

Yer Numarası

ONLINE

Elektronik Erişim

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769539
IEEE Xplore http://ieeexplore.ieee.org/servlet/opac?bknumber=5769539

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833.

Cross-cultural research methods için kapak resmi

Cross-cultural research methods

Cross-cultural research methods

Yazar

Ember, Carol R. Ember, Melvin.

Yer Numarası

GN345.7 E53 2009

Format:

Durum

Beytepe Kütüphanesi~1

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834.

ESD failure mechanisms and models için kapak resmi

ESD failure mechanisms and models

ESD failure mechanisms and models

Yazar

Voldman, Steven H. Wiley InterScience (Online service)

Yer Numarası

ONLINE

Elektronik Erişim

John Wiley http://dx.doi.org/10.1002/9780470747254
http://site.ebrary.com/lib/alltitles/Doc?id=10317806

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835.

Transient-induced latchup in CMOS integrated circuits için kapak resmi

Transient-induced latchup in CMOS integrated circuits

Transient-induced latchup in CMOS integrated circuits

Yazar

Ker, Ming-Dou. Hsu, Sheng-Fu.

Yer Numarası

ONLINE

Elektronik Erişim

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5453758

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836.

Practical guide to the packaging of electronics : thermal and mechanical design and analysis için kapak resmi

Practical guide to the packaging of electronics : thermal and mechanical design and analysis

Practical guide to the packaging of electronics : thermal and mechanical design and analysis

Yazar

Jamnia, Ali, 1961- author.

Yer Numarası

TK7870.15 .J36 2009

Elektronik Erişim

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837.

Geotechnical risk and safety : proceedings of the 2nd International Symposium on Geotechnical Safety and Risk, Gifu, Japan, 11-12 June, 2009 için kapak resmi

Geotechnical risk and safety : proceedings of the 2nd International Symposium on Geotechnical Safety and Risk, Gifu, Japan, 11-12 June, 2009

Geotechnical risk and safety : proceedings of the 2nd International Symposium on Geotechnical Safety and Risk, Gifu, Japan, 11-12 June, 2009

Yazar

International Symposium on Geotechnical Safety & Risk (2nd : 2009 : Gifu, Japan) Honjo, Y.

Yer Numarası

TD171.9 .G46 2009

Elektronik Erişim

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838.

Analysis and design of marine structures : Proceedings of Marstruct 2009, the 2nd International Conference on Marine Structures, Lisbon, Portugal, 16-18 March 2009 için kapak resmi

Analysis and design of marine structures : Proceedings of Marstruct 2009, the 2nd International Conference on Marine Structures, Lisbon, Portugal, 16-18 March 2009

Analysis and design of marine structures : Proceedings of Marstruct 2009, the 2nd International Conference on Marine Structures, Lisbon, Portugal, 16-18 March 2009

Yazar

Soares, C. Guedes. Das, P. K. International Conference on Marine Structures.

Yer Numarası

TC1665 .A53 2009

Elektronik Erişim

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Format:

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839.

Operations research applications için kapak resmi

Operations research applications

Operations research applications

Yazar

Ravindran, A., 1944-

Yer Numarası

T57.6 .O64 2009

Elektronik Erişim

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Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
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840.

Near-earth laser communications için kapak resmi

Near-earth laser communications

Near-earth laser communications

Yazar

Hemmati, Hamid, 1954-

Yer Numarası

TK5103.6 .N43 2009

Elektronik Erişim

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