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SpringerLink (Online service)

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Wiley InterScience (Online service)

(27)

Dhillon, B. S. (Balbir S.), 1947-

(9)

John Wiley & Sons.

(8)

Nakagawa, Toshio. author.

(6)

(5)

Soares, C. Guedes.

(5)

Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121

(4)

Pham, Hoang. author.

(4)

Ushakov, I. A. (Igorʹ Alekseevich)

(4)

(3)

Ayyub, Bilal M.

(3)

Balakrishnan, N. editor.

(3)

Birolini, Alessandro. author.

(3)

Bitsch, Friedemann. editor.

(3)

(3)

Dhillon, B. S. author.

(3)

Finkelstein, Maxim. author.

(3)

Guiochet, Jérémie. editor.

(3)

Licari, James J., 1930-

(3)

Nikolaidis, Efstratios.

(3)

Romanovsky, Alexander. editor. (orcid)0000-0002-4076-3331

(3)

(3)

Weippl, Edgar. editor.

(3)

Willis, H. Lee, 1949-

(3)

Xu, Lida. editor.

(3)

Alampalli, Sreenivas.

(2)

American Institute of Chemical Engineers. Center for Chemical Process Safety.

(2)

Aven, Terje. author.

(2)

Ayyub, Bilal M., author.

(2)

Baggini, Angelo B.

(2)

Blischke, W. R., 1934-

(2)

Blischke, Wallace R. author.

(2)

Bloch, Heinz P., 1933-

(2)

Bondavalli, Andrea. editor.

(2)

Brown, Richard E., 1969-

(2)

Cha, Ji Hwan. author.

(2)

Chaari, Fakher. editor.

(2)

Collart-Dutilleul, Simon. editor.

(2)

Crespo Márquez, Adolfo. author.

(2)

Czaplicki, Jacek M.

(2)

Daniel, Peter. editor.

(2)

De Doncker, Rik. author.

(2)

(2)

Eerkens, Jeff W. author.

(2)

Ettouney, Mohammed.

(2)

(2)

Fakhfakh, Mourad. editor.

(2)

Flammini, Francesco. editor.

(2)

Frenkel, Ilia. author.

(2)

Frenkel, Ilia. editor.

(2)

Gallina, Barbara. editor. (orcid)0000-0002-6952-1053

(2)

Garau, Chiara. editor. (orcid)

(2)

Gertsbakh, Ilya. author.

(2)

Gervasi, Osvaldo. editor. (orcid)

(2)

Gheorghe, Adrian V. author.

(2)

Gheorghe, Adrian V. editor.

(2)

Ghiocel, Dan M.

(2)

Ghosh, Ankush. editor.

(2)

Gnedenko, B. V. (Boris Vladimirovich), 1912-1995.

(2)

Goodarzi, Ehsan. author.

(2)

Gopalaswamy, Venky.

(2)

Guedes Soares, Carlos.

(2)

Haddar, Mohamed. editor.

(2)

Hamrol, Adam. editor.

(2)

Justiniano, Jose M.

(2)

Kabashkin, Igor. editor.

(2)

Kaminskiy, Mark, 1946-

(2)

Katina, Polinpapilinho F. author.

(2)

Klyatis, Lev M.

(2)

Koornneef, Floor. editor.

(2)

Koren, Israel, 1945-

(2)

Kurtoglu, Selahattin. author.

(2)

Lecomte, Thierry. editor.

(2)

Levitin, Gregory. editor.

(2)

Li, Jinwen. editor.

(2)

Li, Rita Yi Man. author.

(2)

Limnios, Nikolaos. author.

(2)

Liptk̀, Bľa G.

(2)

Lisnianski, Anatoly. author.

(2)

Lisnianski, Anatoly. editor.

(2)

Lutz, Josef. author.

(2)

McCuen, Richard H., 1941-

(2)

McPherson, J. W. author.

(2)

(2)

Merkow, Mark S.

(2)

Meyers, Johan. editor.

(2)

Misra, Krishna B., 1943-

(2)

Mobley, R. Keith, 1943-

(2)

Murgante, Beniamino. editor. (orcid)

(2)

Murthy, D. N. P.

(2)

Murthy, D. N. Prabhakar. author.

(2)

Nelson, Wayne, 1936-

(2)

Nikulin, M.S. editor.

(2)

Nwaoha, Chikezie, 1984-

(2)

O'Regan, Gerard. author.

(2)

Ohring, Milton, 1936-

(2)

Ortmeier, Frank. editor.

(2)

Paprzycki, Marcin. editor.

(2)

Pham, Hoang. editor.

(2)

Pluvinage, Guy. editor.

(2)

Prentkovskis, Olegas. editor.

(2)

(2)

Quirchmayr, Gerald. editor.

(2)

Raghavan, Lakshmikanth.

(2)

(2)

Rausand, Marvin.

(2)

Sagaut, Pierre. editor.

(2)

Sayed-Mouchaweh, Moamar. editor.

(2)

Scheuermann, Uwe. author.

(2)

Schlangenotto, Heinrich. author.

(2)

Schneidewind, Norman.

(2)

Schoitsch, Erwin. editor.

(2)

Schoitsch, Erwin. editor. (orcid)0000-0002-0335-5443

(2)

Schrieber, Randall R.

(2)

Shaw, Rabindra Nath. editor.

(2)

Shooman, Martin L.

(2)

Shpungin, Yoseph. author.

(2)

Siarry, Patrick. editor.

(2)

Singhal, Suren.

(2)

Skavhaug, Amund. editor.

(2)

(2)

Suhir, Ephraim.

(2)

Swanson, Dale W.

(2)

Tan, Cher Ming. author.

(2)

Tlelo-Cuautle, Esteban. editor.

(2)

Tonetta, Stefano. editor.

(2)

Troubitsyna, Elena. editor.

(2)

(2)

Verma, Ajit Kumar. author.

(2)

Verma, Ajit Kumar. editor.

(2)

Vinnem, Jan Erik. author.

(2)

Vinnem, Jan-Erik. author.

(2)

Whitaker, Jerry C.

(2)

Wilson, John R.

(2)

Xiao, Liquan. editor.

(2)

Xu, Weixia. editor.

(2)

Yang, Guang-Hong.

(2)

You, Ilsun. editor.

(2)

Zhang, Chengyi. editor.

(2)

Ziaei, Mina. author.

(2)

van Aartsengel, Aristide. author.

(2)

van Gulijk, Coen. editor.

(2)

A Min, Tjoa. editor.

(1)

Abbas, Nureddin Mohamed.

(1)

Abbas, Syed Mohsin. author.

(1)

Abdel-Hameed, Mohamed S.

(1)

Aboul-Enein, Hassan Y.

(1)

Abrahamsson, Pekka. editor.

(1)

Adams, Daniel. author.

(1)

Adams, Kevin MacG. author.

(1)

(1)

Agarwal, Avinash Kumar. editor.

(1)

Agrawal, Abha. editor.

(1)

Aguilar, Jesús H. (Jesús Humberto), 1962-

(1)

Ahad, Mohd Abdul. editor.

(1)

(1)

Ait-Kadi, Daoud. editor.

(1)

Ajit, Srividya. author.

(1)

Akram, Raja Naeem. editor.

(1)

Akyildiz, Ian F. editor.

(1)

Al-Turki, Umar M. author.

(1)

Aldrin, John C. author.

(1)

Alford, Terry L. author.

(1)

Ali, Syed Riffat. author.

(1)

Alias, Nor Aziah, 1961-

(1)

Aliev, Telman. author.

(1)

Allen, Theodore T. author.

(1)

Allocco, Michael.

(1)

Alouini, Mohamed-Slim.

(1)

Alwin, Duane F. (Duane Francis), 1944-

(1)

Amalberti, René. author.

(1)

Amberti, Daniele, contributor.

(1)

Amendola, Aniello. editor.

(1)

(1)

Anders, George. editor.

(1)

Andersson, Cristina. author.

(1)

Antaki, G. A. (George A.)

(1)

Apduhan, Bernady O. editor.

(1)

Arezes, Pedro M. editor.

(1)

Arezes, Pedro Miguel Ferreira Martins. editor.

(1)

Asahi, Yumi. editor.

(1)

Asai, Shojiro. editor.

(1)

Ashar, Navin G. author.

(1)

Atik, Enver, author

(1)

Attard, Mario M., editor.

(1)

Augustin, Thomas, editor.

(1)

Australasian Conference on the Mechanics of Structures and Materials (22nd : 2012 : Sydney, Australia)

(1)

Awasthi, Amit K. editor.

(1)

Ayar, Tahir. author.

(1)

(1)

(1)

Aziz, Ahmed. editor. (orcid)

(1)

Babadağ, Kadir Korhan.

(1)

Badescu, Viorel. editor.

(1)

Baiulescu, George.

(1)

Balakrishnan, N. author.

(1)

Balakrishnan, N., 1956- editor.

(1)

Balasinki, Artur.

(1)

Balasinski, Artur. author.

(1)

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(148)

(136)

Reliability (Engineering)

(82)

(75)

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(64)

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(62)

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(51)

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(44)

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(44)

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(34)

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(33)

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(32)

(25)

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(22)

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(22)

(22)

(21)

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(20)

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(14)

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(13)

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(13)

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(13)

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(13)

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(13)

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(12)

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(12)

Data protection.

(12)

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(12)

(12)

(12)

Optical materials.

(11)

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(11)

(10)

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(10)

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(10)

(10)

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(10)

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(10)

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(9)

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(9)

(9)

(9)

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(9)

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(9)

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(8)

(8)

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(8)

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(8)

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(8)

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(8)

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(8)

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(8)

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(8)

(8)

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(7)

(7)

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(7)

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(7)

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(7)

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(7)

(7)

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(7)

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(7)

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(6)

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(6)

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(6)

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(6)

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(6)

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(6)

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(6)

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(6)

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(6)

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(6)

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(6)

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(6)

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(6)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

Nanotechnology.

(5)

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(5)

(5)

(5)

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(5)

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(5)

(5)

Telecommunication systems.

(5)

Transportation engineering.

(5)

Accelerated life testing.

(4)

Algorithm Analysis and Problem Complexity.

(4)

(4)

Buildings—Design and construction.

(4)

Building—Superintendence.

(4)

Characterization and Evaluation of Materials.

(4)

Circuits and Systems.

(4)

(4)

Computer software -- Development.

(4)

Construction industry—Management.

(4)

Construction superintendence.

(4)

(4)

(4)

Data encryption (Computer science).

(4)

Decision making.

(4)

Economic policy.

(4)

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(4)

Electric power systems.

(4)

Electronic digital computers -- Reliability.

(4)

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(4)

(4)

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(4)

Industrial and Production Engineering.

(4)

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(4)

Materials science.

(4)

Microelectronics.

(4)

Probability Theory and Stochastic Processes.

(4)

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(4)

Regional planning.

(4)

Renewable energy sources.

(4)

Technology -- Risk assessment.

(4)

User interfaces (Computer systems).

(4)

Application software.

(3)

Arithmetic and Logic Structures.

(3)

Biomedical engineering.

(3)

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(3)

Construction Management.

(3)

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(3)

(3)

Earth Sciences.

(3)

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(3)

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(3)

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(3)

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(3)

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(3)

(3)

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(3)

(3)

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(3)

Human engineering.

(3)

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(3)

Industrial organization (Economic theory).

(3)

Information storage and retrieval systems.

(3)

International economics.

(3)

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(3)

(3)

Mathematical optimization.

(3)

Medical instruments and apparatus -- Standards.

(3)

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(3)

Natural Hazards.

(3)

Nuclear engineering.

(3)

Processor Architectures.

(3)

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(3)

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(3)

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(3)

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(3)

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(3)

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(3)

Semiconductors.

(3)

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(3)

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(3)

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(3)

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(3)

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(3)

(3)

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(3)

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(3)

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(3)

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(3)

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Cloud computing.

(2)

Communications software.

(2)

Compressors -- Maintenance and repair.

(2)

Computational Intelligence.

(2)

Computational Science and Engineering.

(2)

Computer System Implementation.

(2)

Computer communication systems.

(2)

Computer engineering.

(2)

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85.

Maintainability, maintenance, and reliability for engineers için kapak resmi

Maintainability, maintenance, and reliability for engineers

Maintainability, maintenance, and reliability for engineers

Yazar

Dhillon, B. S. (Balbir S.), 1947-

Yer Numarası

ONLINE

Elektronik Erişim

Distributed by publisher. Purchase or institutional license may be required for access.

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Çevrimiçi Kütüphane~1

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86.

Reliability and risk a Bayesian perspective için kapak resmi

Reliability and risk a Bayesian perspective

Reliability and risk a Bayesian perspective

Yazar

Singpurwalla, Nozer D. Wiley InterScience (Online service)

Yer Numarası

ONLINE

Elektronik Erişim

John Wiley http://dx.doi.org/10.1002/9780470060346

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87.

System reliability : concepts and applications için kapak resmi

System reliability : concepts and applications

System reliability : concepts and applications

Yazar

Klaassen, Klaas B., 1941- Peppen, Jack C. L. van.

Yer Numarası

QA76.5 K53 2006

Format:

Durum

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88.

Reliability, quality, and safety for engineers için kapak resmi

Reliability, quality, and safety for engineers

Reliability, quality, and safety for engineers

Yazar

Dhillon, B. S. (Balbir S.), 1947-

Yer Numarası

ONLINE

Elektronik Erişim

Distributed by publisher. Purchase or institutional license may be required for access.

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89.

Reliability, quality, and safety for engineers için kapak resmi

Reliability, quality, and safety for engineers

Reliability, quality, and safety for engineers

Yazar

Dhillon, B. S.

Yer Numarası

TS173 .D45 2005

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Durum

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90.

Case studies in reliability and maintenance için kapak resmi

Case studies in reliability and maintenance

Case studies in reliability and maintenance

Yazar

Blischke, W. R., 1934- Murthy, D. N. P. John Wiley & Sons.

Yer Numarası

ONLINE

Elektronik Erişim

John Wiley http://dx.doi.org/10.1002/0471393002
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley042/2002191075.html

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91.

Quality and reliability in analytical chemistry için kapak resmi

Quality and reliability in analytical chemistry

Quality and reliability in analytical chemistry

Yazar

Aboul-Enein, Hassan Y. Stefan, Raluca-Ioana. Baiulescu, George.

Yer Numarası

ONLINE

Elektronik Erişim

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92.

Ceramics processing, reliability, tribology and wear. için kapak resmi

Ceramics processing, reliability, tribology and wear.

Ceramics processing, reliability, tribology and wear.

Yazar

Müller, G. John Wiley & Sons.

Yer Numarası

ONLINE

Elektronik Erişim

John Wiley http://dx.doi.org/10.1002/3527607293

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93.

Medical device reliability and associated areas için kapak resmi

Medical device reliability and associated areas

Medical device reliability and associated areas

Yazar

Dhillon, B. S. (Balbir S.), 1947-

Yer Numarası

ONLINE

Elektronik Erişim

Distributed by publisher. Purchase or institutional license may be required for access.

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94.

Reliability modeling, prediction, and optimization için kapak resmi

Reliability modeling, prediction, and optimization

Reliability modeling, prediction, and optimization

Yazar

Blischke, W. R., 1934- Murthy, D. N. P. Wiley InterScience (Online service)

Yer Numarası

ONLINE

Elektronik Erişim

Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Ebook Library Click here to view book
Available by subscription from Safari Books Online
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley043/99053029.html
HathiTrust Digital Library, Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/42708105.html

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95.

Design reliability fundamentals and applications için kapak resmi

Design reliability fundamentals and applications

Design reliability fundamentals and applications

Yazar

Dhillon, B. S. (Balbir S.), 1947-

Yer Numarası

ONLINE

Elektronik Erişim

Distributed by publisher. Purchase or institutional license may be required for access.

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Çevrimiçi Kütüphane~1

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96.

Reliability modelling : A statistical approach için kapak resmi

Reliability modelling : A statistical approach

Reliability modelling : A statistical approach

Yazar

Wolstenholme, Linda C.

Yer Numarası

TA 169 W65 1999

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