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SpringerLink (Online service)

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Lee, Roger. editor.

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(7)

Balandin, Sergey. editor.

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Docter, Quentin, author.

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Gupta, Brij, 1982- editor.

(4)

IGI Global, publisher.

(4)

(4)

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(4)

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(3)

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Brooks, R. R. (Richard R.)

(3)

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Curado, Marília. editor.

(3)

Gao, Honghao. editor.

(3)

Hanzo, Lajos, 1952-

(3)

Hu, Fei, 1972- editor.

(3)

Iyengar, S. S. (Sundararaja S.)

(3)

Jain, Vishal, 1983- editor.

(3)

Jinmei, Tatuya, 1971-

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(3)

Lammle, Todd, author.

(3)

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Pont, Ana. editor.

(3)

(3)

Rehmani, Mubashir Husain, 1983- editor.

(3)

Schaar, Mihaela van der.

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Shima, Keiichi, 1970-

(3)

Shu, Lei. editor.

(3)

Stoica, Adrian. editor.

(3)

Sun, Songlin. editor.

(3)

Xiao, Yang, 1966-

(3)

Xiao, Yang. editor.

(3)

Yang, Laurence T. editor.

(3)

Zeng, Deze. editor.

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(3)

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(2)

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(2)

Agha, Khaldoun. editor.

(2)

Ahmed, Mohiuddin (Computer scientist), editor.

(2)

Akyildiz, Ian Fuat.

(2)

Andreev, Sergey. editor.

(2)

Aweya, James, author.

(2)

Balas, Valentina Emilia. editor.

(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

Debnath, N. C. (Narayan C.), editor.

(2)

Denko, Mieso K.

(2)

Denko, Mieso K. editor.

(2)

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(2)

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(2)

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(2)

(2)

Do, Dinh-Thuan. editor.

(2)

Domingo-Pascual, Jordi. editor.

(2)

Edwards, Jason (Cybersecurity expert), author.

(2)

Fang, Wai-chi. editor.

(2)

Farrel, Adrian.

(2)

Garg, Vijay Kumar, 1938-

(2)

Guibas, Leonidas J.

(2)

Guizani, Mohsen.

(2)

Gupta, Brij, 1982- author.

(2)

Gurtov, Andrei.

(2)

Harju, Jarmo. editor.

(2)

Hersent, Olivier.

(2)

Huo, Mengyao. editor.

(2)

Ilyas, Mohammad, 1953-

(2)

Imran, Muhammad Ali, editor.

(2)

Iniewski, Krzysztof, 1960- editor.

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Institute of Electrical and Electronics Engineers.

(2)

Iqbal, Muddesar. editor.

(2)

Janevski, Toni, author.

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Kaiwartya, Omprakash, 1981- editor.

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Khan, Shafiullah, editor.

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Li, Bo. editor.

(2)

Li, Li Erran. editor.

(2)

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(2)

Liu, K. J. Ray.

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Medhi, Deepankar.

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(2)

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937.

Windows security monitoring : scenarios and patterns için kapak resmi

Windows security monitoring : scenarios and patterns

Windows security monitoring : scenarios and patterns

Yazar

Miroshnikov, Andrei, author.

Yer Numarası

QA76.9 .A25

Elektronik Erişim

https://onlinelibrary.wiley.com/doi/book/10.1002/9781119390909

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938.

Insider threats için kapak resmi

Insider threats

Insider threats

Yazar

Arduin, Pierre-Emmanuel, author.

Yer Numarası

QA76.9 .A25

Elektronik Erişim

https://onlinelibrary.wiley.com/doi/book/10.1002/9781119419785

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939.

CompTIA cloud+ study guide : exam CV0-002 için kapak resmi

CompTIA cloud+ study guide : exam CV0-002

CompTIA cloud+ study guide : exam CV0-002

Yazar

Montgomery, Todd, 1943- author. Olson, Stephen, author.

Yer Numarası

QA76.585

Elektronik Erişim

https://onlinelibrary.wiley.com/doi/book/10.1002/9781119549543

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940.

Professional C# 7 and .NET Core 2.0 için kapak resmi

Professional C# 7 and .NET Core 2.0

Professional C# 7 and .NET Core 2.0

Yazar

Nagel, Christian, author.

Yer Numarası

QA76.73 .C154

Elektronik Erişim

https://onlinelibrary.wiley.com/doi/book/10.1002/9781119549147

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941.

CompTIA Network+ study guide, exam N10-007 için kapak resmi

CompTIA Network+ study guide, exam N10-007

CompTIA Network+ study guide, exam N10-007

Yazar

Lammle, Todd, author.

Yer Numarası

TK7887

Elektronik Erişim

https://onlinelibrary.wiley.com/doi/book/10.1002/9781119549444

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942.

CompTIA Network+ review guide, exam N10-007 için kapak resmi

CompTIA Network+ review guide, exam N10-007

CompTIA Network+ review guide, exam N10-007

Yazar

Buhagiar, Jon, author.

Yer Numarası

TK5105.5

Elektronik Erişim

https://onlinelibrary.wiley.com/doi/book/10.1002/9781119549468

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943.

(ISC)² CISSP certified information systems security professional official study guide için kapak resmi

(ISC)² CISSP certified information systems security professional official study guide

(ISC)² CISSP certified information systems security professional official study guide

Yazar

Chapple, Mike, author. Stewart, James Michael, author. Gibson, Darril, author.

Yer Numarası

QA76.3 .C4255 2018

Elektronik Erişim

https://onlinelibrary.wiley.com/doi/book/10.1002/9781119549567

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944.

Cybersecurity program development for business : the essential planning guide için kapak resmi

Cybersecurity program development for business : the essential planning guide

Cybersecurity program development for business : the essential planning guide

Yazar

Moschovitis, Christos J. P., author.

Yer Numarası

HD30.2

Elektronik Erişim

https://onlinelibrary.wiley.com/doi/book/10.1002/9781119430018

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945.

CompTIA security+ : practice tests : exam SY0-501 için kapak resmi

CompTIA security+ : practice tests : exam SY0-501

CompTIA security+ : practice tests : exam SY0-501

Yazar

Christy, S. Russell, author. Easttom, Chuck, author.

Yer Numarası

QA76.3 .C47 2018

Elektronik Erişim

https://onlinelibrary.wiley.com/doi/book/10.1002/9781119549413

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946.

5G networks : fundamental requirements, enabling technologies, and operations management için kapak resmi

5G networks : fundamental requirements, enabling technologies, and operations management

5G networks : fundamental requirements, enabling technologies, and operations management

Yazar

Al-Dulaimi, Anwer, 1974- author. Wang, Xianbin, author. I, Chih-Lin (Telecommunications engineer), author.

Yer Numarası

TK6570 .M6

Elektronik Erişim

https://onlinelibrary.wiley.com/doi/book/10.1002/9781119333142

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947.

Private equity firms : their role in the formation of strategic alliances için kapak resmi

Private equity firms : their role in the formation of strategic alliances

Private equity firms : their role in the formation of strategic alliances

Yazar

Burkhardt, Kirsten, author.

Yer Numarası

HG4751

Elektronik Erişim

https://onlinelibrary.wiley.com/doi/book/10.1002/9781119508748

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948.

Scientific Research As a Career. için kapak resmi

Scientific Research As a Career.

Scientific Research As a Career.

Yazar

MacRitchie, Finlay, author.

Yer Numarası

Q147

Elektronik Erişim

Taylor & Francis https://www.taylorfrancis.com/books/e/9781439869673
Taylor & Francis https://www.taylorfrancis.com/books/e/9780429105258
Taylor & Francis https://www.taylorfrancis.com/books/9780429105258
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf

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