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SpringerLink (Online service)

(482)

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(27)

Taylor and Francis.

(10)

Nakagawa, Toshio. author.

(9)

John Wiley & Sons.

(8)

Dhillon, B. S. (Balbir S.), 1947, author.

(6)

(5)

Ayyub, Bilal M., author.

(4)

Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121

(4)

Dhillon, B. S. (Balbir S.), 1947-

(4)

Pham, Hoang. author.

(4)

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(4)

Soares, C. Guedes.

(4)

Ushakov, I. A. (Igorʹ Alekseevich)

(4)

Willis, H. Lee, 1949, author.

(4)

(3)

Balakrishnan, N. editor.

(3)

Birolini, Alessandro. author.

(3)

Bitsch, Friedemann. editor.

(3)

(3)

Chen, Wai-Fah, 1936-

(3)

Dhillon, B. S. author.

(3)

Finkelstein, Maxim. author.

(3)

Ghiocel, Dan M.

(3)

Guiochet, Jérémie. editor.

(3)

Kabashkin, Igor. editor.

(3)

Licari, James J., 1930-

(3)

Nikolaidis, Efstratios.

(3)

Prentkovskis, Olegas. editor.

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(3)

Singhal, Suren.

(3)

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Verma, Ajit Kumar. author.

(3)

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(3)

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Alampalli, Sreenivas.

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American Institute of Chemical Engineers. Center for Chemical Process Safety.

(2)

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(2)

Azar, Ahmad Taher. editor.

(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

(2)

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(2)

Eerkens, Jeff W. author.

(2)

(2)

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(2)

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(2)

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(2)

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(2)

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(2)

Gallina, Barbara. editor. (orcid)0000-0002-6952-1053

(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

Gnedenko, B. V. (Boris Vladimirovich), 1912-1995.

(2)

Godwin, Grover Maurice.

(2)

Goodarzi, Ehsan. author.

(2)

Gopalaswamy, Venky.

(2)

Guedes Soares, Carlos.

(2)

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(2)

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(2)

Harris, Gerald F.

(2)

Hausken, Kjell. editor.

(2)

Ho, Robert, author.

(2)

Hood, Ronald D.

(2)

Ilyas, Mohammad, 1953-

(2)

Katina, Polinpapilinho F. author.

(2)

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(2)

Klyatis, Lev M.

(2)

Koornneef, Floor. editor.

(2)

Koren, Israel, 1945-

(2)

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(2)

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(2)

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(2)

Li, Jinwen. editor.

(2)

Li, Rita Yi Man. author.

(2)

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(2)

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(2)

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(2)

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Liu, Yu. author.

(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

Nelson, Wayne, 1936-

(2)

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(2)

Nikulin, M.S. editor.

(2)

Nwaoha, Chikezie, 1984-

(2)

O'Regan, Gerard. author.

(2)

Ohring, Milton, 1936-

(2)

Ortmeier, Frank. editor.

(2)

Papadrakakis, Manolis.

(2)

Papadrakakis, Manolis. editor.

(2)

Paprzycki, Marcin. editor.

(2)

Pecht, Michael, author.

(2)

Pluvinage, Guy. editor.

(2)

Prakash, Raghu V. editor.

(2)

(2)

Quirchmayr, Gerald. editor.

(2)

Raghavan, Lakshmikanth.

(2)

(2)

Rausand, Marvin.

(2)

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(2)

Sayed-Mouchaweh, Moamar. editor.

(2)

Scheuermann, Uwe. author.

(2)

Schlangenotto, Heinrich. author.

(2)

Schneidewind, Norman.

(2)

Schoitsch, Erwin. editor.

(2)

Schoitsch, Erwin. editor. (orcid)0000-0002-0335-5443

(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

Smith, Peter A., 1959-

(2)

(2)

Suhir, Ephraim.

(2)

Swanson, Dale W.

(2)

Tan, Cher Ming. author.

(2)

Tlelo-Cuautle, Esteban. editor.

(2)

Tonetta, Stefano. editor.

(2)

Troubitsyna, Elena. editor.

(2)

(2)

Varde, Prabhakar V. author.

(2)

Varde, Prabhakar V. editor.

(2)

Verma, Ajit Kumar. editor.

(2)

Vinnem, Jan Erik. author.

(2)

Vinnem, Jan-Erik. author.

(2)

Vittorini, Valeria. editor.

(2)

Walkowiak, Tomasz. editor.

(2)

Whitaker, Jerry C.

(2)

Wilpert, Bernhard, 1936-

(2)

Xiao, Liquan. editor.

(2)

Xie, Liquan, 1972- editor.

(2)

Xu, Weixia. editor.

(2)

Yadav, Sanjay. editor.

(2)

Yatskiv, Irina. editor.

(2)

You, Ilsun. editor.

(2)

Zhang, Chengyi. editor.

(2)

Zhuang, Jun. editor.

(2)

Ziaei, Mina. author.

(2)

van Aartsengel, Aristide. author.

(2)

van Gulijk, Coen. editor.

(2)

A Min, Tjoa. editor.

(1)

AITCHISON, JEAN, contributor.

(1)

Abbas, Nureddin Mohamed.

(1)

Abbas, Syed Mohsin. author.

(1)

Abdel-Hameed, Mohamed S.

(1)

Abrahamsson, Pekka. editor.

(1)

Acartürk, Cengiz, contributor.

(1)

Adams, Daniel. author.

(1)

Adimoolam, Boominathan. editor.

(1)

Adumene, Sidum. author.

(1)

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(1)

Agarwal, Avinash Kumar. editor.

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Reliability (Engineering)

(87)

(76)

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(65)

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(65)

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(51)

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(45)

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(14)

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(14)

(13)

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(13)

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(13)

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(13)

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(13)

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(13)

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(13)

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(10)

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(10)

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(7)

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(7)

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(7)

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(7)

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(7)

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(7)

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(7)

(7)

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(7)

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(7)

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(7)

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(7)

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(6)

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(6)

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(6)

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(6)

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(6)

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(6)

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(6)

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(6)

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(6)

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(6)

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(6)

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(6)

(6)

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(6)

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(6)

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(6)

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(6)

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(6)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

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(5)

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(4)

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(4)

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(4)

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(4)

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(4)

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(4)

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(4)

(4)

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(4)

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(4)

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(4)

Materials science.

(4)

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(4)

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(4)

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(4)

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(4)

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(4)

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(4)

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(4)

Semiconductors.

(4)

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(4)

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(4)

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(4)

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(4)

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Thermodynamics.

(4)

User interfaces (Computer systems).

(4)

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(3)

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889.

Handbook of exponential and related distributions for engineers and scientists için kapak resmi

Handbook of exponential and related distributions for engineers and scientists

Handbook of exponential and related distributions for engineers and scientists

Yazar

Pal, Nabendu., author. Jin, Chun. Lim, Wooi K.

Yer Numarası

QA273.6 .P35 2006

Elektronik Erişim

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890.

Geotechnical risk in rock tunnels : selected papers from a course on Geotechnical Risk in Rock Tunnels, Aveiro, Portugal, 16-17 April 2004 için kapak resmi

Geotechnical risk in rock tunnels : selected papers from a course on Geotechnical Risk in Rock Tunnels, Aveiro, Portugal, 16-17 April 2004

Geotechnical risk in rock tunnels : selected papers from a course on Geotechnical Risk in Rock Tunnels, Aveiro, Portugal, 16-17 April 2004

Yazar

Matos, Antonio Campos e.

Yer Numarası

TA815 .G46 2006

Elektronik Erişim

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891.

The electrical engineering handbook. Sensors, nanoscience, biomedical engineering, and instruments için kapak resmi

The electrical engineering handbook. Sensors, nanoscience, biomedical engineering, and instruments

The electrical engineering handbook. Sensors, nanoscience, biomedical engineering, and instruments

Yazar

Dorf, Richard C.

Yer Numarası

R857 .B54 E44 2006

Elektronik Erişim

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892.

Handbook on Neurovascular Ultrasound için kapak resmi

Handbook on Neurovascular Ultrasound

Handbook on Neurovascular Ultrasound

Yazar

Baumgartner, R.W., editor.

Yer Numarası

XX(548874.1)

Elektronik Erişim

https://karger.com/book/doi/10.1159/isbn.978-3-318-01284-2

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893.

New technological solutions in underground mining : International Mining Forum 2006 için kapak resmi

New technological solutions in underground mining : International Mining Forum 2006

New technological solutions in underground mining : International Mining Forum 2006

Yazar

International Mining Forum (2006) Kicki, Jerzy. Sobczyk, Eugeniusz J.

Yer Numarası

TN5 .I58 2006

Elektronik Erişim

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894.

Sosyal ve davranışsal ölçümlerde güvenilirlik ve geçerlilik için kapak resmi

Sosyal ve davranışsal ölçümlerde güvenilirlik ve geçerlilik

Sosyal ve davranışsal ölçümlerde güvenilirlik ve geçerlilik

Yazar

Şencan, Hüner.

Yer Numarası

BF176 .S463 2005

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895.

Risk assessment of power systems models, methods, and applications için kapak resmi

Risk assessment of power systems models, methods, and applications

Risk assessment of power systems models, methods, and applications

Yazar

Li, Wenyuan.

Yer Numarası

ONLINE

Elektronik Erişim

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5238312

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896.

Trustworthy systems through quantitative software engineering için kapak resmi

Trustworthy systems through quantitative software engineering

Trustworthy systems through quantitative software engineering

Yazar

Bernstein, Lawrence, 1940- Yuhas, C. M. Wiley InterScience (Online service)

Yer Numarası

ONLINE

Elektronik Erişim

IEEE Xplore http://ieeexplore.ieee.org/servlet/opac?bknumber=5988898

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897.

Digital communication over fading channels için kapak resmi

Digital communication over fading channels

Digital communication over fading channels

Yazar

Simon, Marvin Kenneth, 1939- Alouini, Mohamed-Slim.

Yer Numarası

ONLINE

Elektronik Erişim

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5238261

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898.

Plant and machinery failure prevention için kapak resmi

Plant and machinery failure prevention

Plant and machinery failure prevention

Yazar

Hattangadi, A. A.

Yer Numarası

ONLINE

Elektronik Erişim

Subscription required

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899.

Flowgraph models for multistate time-to-event data için kapak resmi

Flowgraph models for multistate time-to-event data

Flowgraph models for multistate time-to-event data

Yazar

Huzurbazar, Aparna V., 1966- John Wiley & Sons.

Yer Numarası

ONLINE

Elektronik Erişim

John Wiley http://dx.doi.org/10.1002/0471686565

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900.

Computers, Software Engineering, and Digital Devices için kapak resmi

Computers, Software Engineering, and Digital Devices

Computers, Software Engineering, and Digital Devices

Yazar

Dorf, Richard C., author. Taylor and Francis.

Yer Numarası

TK7885

Elektronik Erişim

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