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C, H, N and O in Si and Characterization and Simulation of Materials and Processes Proceedings of Symposium N and Symposium G of the 1995 E-Mrs Spring Conference, Held in Strasbourg, France, 22-26 May 1995 için kapak resmi
C, H, N and O in Si and Characterization and Simulation of Materials and Processes Proceedings of Symposium N and Symposium G of the 1995 E-Mrs Spring Conference, Held in Strasbourg, France, 22-26 May 1995
Yazar 
Symposium N on Carbon, Hydrogen, Nitrogen, and Oxygen in Silicon and Other Elemental Semiconductors (1995 : Strasbourg, France) Borghesi, A. Symposium G on Atomic Scale Characterization and Simulation of Materials and Processes (1995 : Strasbourg, France)
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ONLINE
Elektronik Erişim 
ScienceDirect http://www.sciencedirect.com/science/book/9780444824134
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2. 
Compound semiconductor radiation detectors için kapak resmi
Compound semiconductor radiation detectors
Yazar 
Owens, Alan.
Yer Numarası 
ONLINE
Elektronik Erişim 
Distributed by publisher. Purchase or institutional license may be required for access.
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