Search Results for Atomic force microscopy.

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SpringerLink (Online service)

(6)

Wiley InterScience (Online service)

(3)

Afrin, R. (Rehana)

(1)

Baró, Arturo M.

(1)

Bier, Nathalie. editor.

(1)

Bizzarri, Anna Rita.

(1)

Bowen, W. Richard.

(1)

Cai, Jiye. editor.

(1)

Cannistraro, Salvatore.

(1)

Castillo-Len̤, Jaime.

(1)

Castro García, Ricardo.

(1)

Dimaki, Winnie.

(1)

Dufrn̊e, Yves.

(1)

Duwez, Anne-Sophie.

(1)

(1)

Feng, C. Y. author.

(1)

Fred, Ana. editor.

(1)

(1)

Gamboa, Hugo. editor.

(1)

Giessibl, Franz J. editor.

(1)

Gracanin, Denis. editor.

(1)

Haugstad, Greg, 1963-

(1)

(1)

(1)

International Union of Pure and Applied Chemistry.

(1)

Jafari, Seid Mahdi.

(1)

Kaupp, Gerd. author.

(1)

Khulbe, K. C. author.

(1)

LaBaer, Joshua.

(1)

(1)

Lorenz, Ronny. editor.

(1)

(1)

Lundstrom, Kenneth H.

(1)

Magonov, Sergei N.

(1)

Mansfeld, Florian.

(1)

Marcus, P. (Philippe), 1953-

(1)

Matsuura, Takeshi. author.

(1)

Morita, Seizo. editor.

(1)

Nicolini, Claudio A.

(1)

Onal, Cagdas. author.

(1)

Plieth, W. (Waldfried)

(1)

Reifenberger, Ronald G.

(1)

Reisner, David Evans.

(1)

Roque, Ana Cecília A. editor.

(1)

Régnier, Stéphane. author.

(1)

Sitti, Metin. author.

(1)

Svendsen, Winnie Edith.

(1)

Takeyasu, Kunio, 1950- editor.

(1)

Totten, George E.

(1)

Tsanas, Athanasios. editor.

(1)

Ushiki, Tatsuo, 1957-

(1)

(1)

Whangbo, Myung-Hwan.

(1)

Wiesendanger, Roland. editor.

(1)

Willet, Nicolas.

(1)

Xie, Hui. author.

(1)

Yang, Hongshun.

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Atomic force microscopy.

(10)

Nanotechnology.

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Scanning tunneling microscopy.

(2)

Amplitude modulation.

(1)

Analytical biochemistry.

(1)

Artificial intelligence.

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Atomic force microscopy -- Industrial applications.

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Biomedical engineering.

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Chemistry, Physical organic.

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Corrosion and anti-corrosives.

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Mechanical wear.

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Membrane proteins -- Conformation.

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Metals -- Surfaces -- Analysis.

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Molecular dynamics.

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Molecular recognition.

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Molecular spectroscopy.

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Nanostructures.

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Nanotechnology -- Research.

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Physical optics.

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Production engineering.

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Scanning probe microscopy.

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Semiconductors -- Testing.

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Surface chemistry.

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1.

Atomic force microscopy için kapak resmi

Atomic force microscopy

Atomic force microscopy

Yazar

Eaton, Peter. West, Paul.

Yer Numarası

ONLINE

Elektronik Erişim

Oxford scholarship online http://dx.doi.org/10.1093/acprof:oso/9780199570454.001.0001

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2.

Atomic force microscopy in nanobiology için kapak resmi

Atomic force microscopy in nanobiology

Atomic force microscopy in nanobiology

Yazar

Takeyasu, Kunio, 1950- editor.

Yer Numarası

ONLINE(342731.1)

Elektronik Erişim

Distributed by publisher. Purchase or institutional license may be required for access.

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3.

Molecular manipulation with atomic force microscopy için kapak resmi

Molecular manipulation with atomic force microscopy

Molecular manipulation with atomic force microscopy

Yazar

Duwez, Anne-Sophie. Willet, Nicolas.

Yer Numarası

ONLINE

Elektronik Erişim

Distributed by publisher. Purchase or institutional license may be required for access.

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4.

Amplitude modulation atomic force microscopy için kapak resmi

Amplitude modulation atomic force microscopy

Amplitude modulation atomic force microscopy

Yazar

Castro García, Ricardo. Wiley InterScience (Online service)

Yer Numarası

ONLINE

Elektronik Erişim

John Wiley http://dx.doi.org/10.1002/9783527632183
Books24x7 http://www.books24x7.com/marc.asp?bookid=43158

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5.

Noncontact Atomic Force Microscopy Volume 2 için kapak resmi

Noncontact Atomic Force Microscopy Volume 2

Noncontact Atomic Force Microscopy Volume 2

Yazar

Morita, Seizo. editor. Giessibl, Franz J. editor. Wiesendanger, Roland. editor. SpringerLink (Online service)

Yer Numarası

ONLINE

Elektronik Erişim

http://dx.doi.org/10.1007/978-3-642-01495-6

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6.

Atomic force microscopy in liquid biological applications için kapak resmi

Atomic force microscopy in liquid biological applications

Atomic force microscopy in liquid biological applications

Yazar

Baró, Arturo M. Reifenberger, Ronald G.

Yer Numarası

ONLINE

Elektronik Erişim

John Wiley http://dx.doi.org/10.1002/9783527649808

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7.

Atomic Force Microscopy in Molecular and Cell Biology için kapak resmi

Atomic Force Microscopy in Molecular and Cell Biology

Atomic Force Microscopy in Molecular and Cell Biology

Yazar

Cai, Jiye. editor. SpringerLink (Online service)

Yer Numarası

ONLINE

Elektronik Erişim

https://doi.org/10.1007/978-981-13-1510-7

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8.

Atomic Force Microscopy Based Nanorobotics Modelling, Simulation, Setup Building and Experiments için kapak resmi

Atomic Force Microscopy Based Nanorobotics Modelling, Simulation, Setup Building and Experiments

Atomic Force Microscopy Based Nanorobotics Modelling, Simulation, Setup Building and Experiments

Yazar

Xie, Hui. author. Onal, Cagdas. author. Régnier, Stéphane. author. Sitti, Metin. author. SpringerLink (Online service)

Yer Numarası

ONLINE

Elektronik Erişim

http://dx.doi.org/10.1007/978-3-642-20329-9

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9.

Atomic force microscopy exploring basic modes and advanced applications için kapak resmi

Atomic force microscopy exploring basic modes and advanced applications

Atomic force microscopy exploring basic modes and advanced applications

Yazar

Haugstad, Greg, 1963-

Yer Numarası

ONLINE

Elektronik Erişim

Wiley http://onlinelibrary.wiley.com/book/10.1002/9781118360668
ebrary http://site.ebrary.com/id/10606048
John Wiley http://dx.doi.org/10.1002/9781118360668

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10.

Life at the nanoscale atomic force microscopy of live cells için kapak resmi

Life at the nanoscale atomic force microscopy of live cells

Life at the nanoscale atomic force microscopy of live cells

Yazar

Dufrn̊e, Yves.

Yer Numarası

ONLINE

Elektronik Erişim

Distributed by publisher. Purchase or institutional license may be required for access.

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11.

Atomic force microscopy in process engineering introduction to AFM for improved processes and products için kapak resmi

Atomic force microscopy in process engineering introduction to AFM for improved processes and products

Atomic force microscopy in process engineering introduction to AFM for improved processes and products

Yazar

Bowen, W. Richard. Hilal, Nidal.

Yer Numarası

ONLINE

Elektronik Erişim

ScienceDirect http://www.sciencedirect.com/science/book/9781856175173

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12.

The world of nano-biomechanics mechanical imaging and measurement by atomic force microscopy için kapak resmi

The world of nano-biomechanics mechanical imaging and measurement by atomic force microscopy

The world of nano-biomechanics mechanical imaging and measurement by atomic force microscopy

Yazar

Ikai, Atsushi. Afrin, R. (Rehana)

Yer Numarası

ONLINE

Elektronik Erişim

ScienceDirect http://www.sciencedirect.com/science/book/9780444527776

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