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Subject: Database management.

Yazar

SpringerLink (Online service)

(6)

Biggio, Battista. editor.

(1)

Domingo-Ferrer, Josep. editor. (orcid)0000-0001-7213-4962

(1)

Escolano, Francisco. editor.

(1)

Garn, Wolfgang, author.

(1)

Giusti, Antonio. editor.

(1)

Honda, Katsuhiro. editor. (orcid)0000-0001-9080-5942

(1)

Huynh, Hieu T. editor. (orcid)0000-0002-2097-0704

(1)

Huynh, Van-Nam. editor. (orcid)0000-0002-3860-7815

(1)

Inuiguchi, Masahiro. editor. (orcid)0000-0001-9970-1621

(1)

Lawrence, Neil. editor.

(1)

Le, Bac. editor. (orcid)0000-0002-4306-6945

(1)

Loog, Marco. editor.

(1)

Niranjan, Mahesan. editor.

(1)

Ritter, Gunter. editor.

(1)

Robles-Kelly, Antonio. editor.

(1)

Shekhar, Shashi. editor.

(1)

Vichi, Maurizio. editor.

(1)

Wilson, Richard. editor.

(1)

Winkler, Joab. editor.

(1)

Wubbel, John, 1954- author.

(1)

Xiong, Hui. editor.

(1)

Zhou, Xun. editor.

(1)

Önen, Melek. editor. (orcid)0000-0003-0269-9495

(1)

Tümünü genişlet

Dil

(9)

Yayın Yılı

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(2)

(2)

(1)

(1)

(1)

(1)

(1)

Tümünü genişlet

Konu

Artificial intelligence.

(3)

Data Mining and Knowledge Discovery.

(3)

(3)

(2)

Information storage and retrieval systems.

(2)

Management -- Data processing.

(2)

Management -- Statistical methods.

(2)

Application software.

(1)

Automated Pattern Recognition.

(1)

BUSINESS & ECONOMICS -- Industrial Management.

(1)

BUSINESS & ECONOMICS -- Management Science.

(1)

BUSINESS & ECONOMICS -- Management.

(1)

BUSINESS & ECONOMICS -- Organizational Behavior.

(1)

BUSINESS & ECONOMICS / Management

(1)

BUSINESS & ECONOMICS / Management Science

(1)

Bases de données -- Gestion.

(1)

Business -- Data processing

(1)

Business -- Data processing.

(1)

Computer Communication Networks.

(1)

Computer and Information Systems Applications.

(1)

Computer networks .

(1)

Computer science -- Mathematics.

(1)

Computer science.

(1)

Computer vision.

(1)

Computers and Society.

(1)

Computers and civilization.

(1)

Data and Information Security.

(1)

Data protection.

(1)

Database Management System.

(1)

Database management

(1)

Design and Analysis of Algorithms.

(1)

Earth sciences.

(1)

Environmental sciences -- Mathematics.

(1)

Geographic information systems.

(1)

Geographical Information System.

(1)

Gestion -- Informatique.

(1)

Gestion -- Méthodes statistiques.

(1)

Information Storage and Retrieval.

(1)

JMP (Computer file)

(1)

Machine learning.

(1)

Management -- Data processing

(1)

Management -- Statistical methods

(1)

Mathematical Applications in Environmental Science.

(1)

Mathematical statistics.

(1)

Mathematics of Computing.

(1)

Optical pattern recognition.

(1)

Pattern recognition systems.

(1)

Social sciences -- Statistical methods.

(1)

Statistical Theory and Methods.

(1)

Statistics -- Methodology.

(1)

Statistics in Social Sciences, Humanities, Law, Education, Behavorial Sciences, Public Policy.

(1)

(1)

Tümünü genişlet

Materyal Türü

Shelf Location

Elektronik Kütüphane

Taylor Francis E-Kitap Koleksiyonu

Wiley E-Kitap Koleksiyonu

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1.

Deterministic and Statistical Methods in Machine Learning First International Workshop, Sheffield, UK, September 7-10, 2004. Revised Lectures için kapak resmi

Deterministic and Statistical Methods in Machine Learning First International Workshop, Sheffield, UK, September 7-10, 2004. Revised Lectures

Deterministic and Statistical Methods in Machine Learning First International Workshop, Sheffield, UK, September 7-10, 2004. Revised Lectures

Yazar

Winkler, Joab. editor. Niranjan, Mahesan. editor. Lawrence, Neil. editor. SpringerLink (Online service)

Yer Numarası

ONLINE

Elektronik Erişim

http://dx.doi.org/10.1007/11559887

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

2.

STATISTICAL METHODS AND APPLICATIONS IN SYSTEMS ASSURANCE AND QUALITY için kapak resmi

STATISTICAL METHODS AND APPLICATIONS IN SYSTEMS ASSURANCE AND QUALITY

STATISTICAL METHODS AND APPLICATIONS IN SYSTEMS ASSURANCE AND QUALITY

Yer Numarası

QA76.9 .D3

Elektronik Erişim

Taylor & Francis https://www.taylorfrancis.com/books/9781032664330
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf

Format:

Durum

Çevrimiçi Kütüphane~1

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3.

Integrated Uncertainty in Knowledge Modelling and Decision Making 11th International Symposium, IUKM 2025, Ho Chi Minh City, Vietnam, March 17-19, 2025, Proceedings, Part I için kapak resmi

Integrated Uncertainty in Knowledge Modelling and Decision Making 11th International Symposium, IUKM 2025, Ho Chi Minh City, Vietnam, March 17-19, 2025, Proceedings, Part I

Integrated Uncertainty in Knowledge Modelling and Decision Making 11th International Symposium, IUKM 2025, Ho Chi Minh City, Vietnam, March 17-19, 2025, Proceedings, Part I

Yazar

Huynh, Van-Nam. editor. (orcid)0000-0002-3860-7815 Honda, Katsuhiro. editor. (orcid)0000-0001-9080-5942 Le, Bac. editor. (orcid)0000-0002-4306-6945 Inuiguchi, Masahiro. editor. (orcid)0000-0001-9970-1621 Huynh, Hieu T. editor. (orcid)0000-0002-2097-0704

Yer Numarası

ONLINE

Elektronik Erişim

https://doi.org/10.1007/978-981-96-4606-7

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

4.

Data analytics for business AI, ML, PBI, SQL, R için kapak resmi

Data analytics for business AI, ML, PBI, SQL, R

Data analytics for business AI, ML, PBI, SQL, R

Yazar

Garn, Wolfgang, author.

Yer Numarası

HD30.215

Elektronik Erişim

Taylor & Francis https://www.taylorfrancis.com/books/9781003336099
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf

Format:

Durum

Çevrimiçi Kütüphane~1

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Kopya:

5.

Privacy in Statistical Databases International Conference, PSD 2024, Antibes Juan-les-Pins, France, September 25-27, 2024, Proceedings için kapak resmi

Privacy in Statistical Databases International Conference, PSD 2024, Antibes Juan-les-Pins, France, September 25-27, 2024, Proceedings

Privacy in Statistical Databases International Conference, PSD 2024, Antibes Juan-les-Pins, France, September 25-27, 2024, Proceedings

Yazar

Domingo-Ferrer, Josep. editor. (orcid)0000-0001-7213-4962 Önen, Melek. editor. (orcid)0000-0003-0269-9495 SpringerLink (Online service)

Yer Numarası

ONLINE

Elektronik Erişim

https://doi.org/10.1007/978-3-031-69651-0

Format:

Durum

Çevrimiçi Kütüphane~1

Rafta:
Kopya:

6.

JMP connections için kapak resmi

JMP connections

JMP connections

Yazar

Wubbel, John, 1954- author.

Yer Numarası

HD30.215

Elektronik Erişim

https://onlinelibrary.wiley.com/doi/book/10.1002/9781119453680

Format:

Durum

Çevrimiçi Kütüphane~1

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7.

Encyclopedia of GIS için kapak resmi

Encyclopedia of GIS

Encyclopedia of GIS

Yazar

Shekhar, Shashi. editor. Xiong, Hui. editor. Zhou, Xun. editor. SpringerLink (Online service)

Yer Numarası

ONLINE

Elektronik Erişim

https://doi.org/10.1007/978-3-319-17885-1

Format:

Durum

Çevrimiçi Kütüphane~1

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Kopya:

8.

Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshop, S+SSPR 2016, Mérida, Mexico, November 29 - December 2, 2016, Proceedings için kapak resmi

Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshop, S+SSPR 2016, Mérida, Mexico, November 29 - December 2, 2016, Proceedings

Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshop, S+SSPR 2016, Mérida, Mexico, November 29 - December 2, 2016, Proceedings

Yazar

Robles-Kelly, Antonio. editor. Loog, Marco. editor. Biggio, Battista. editor. Escolano, Francisco. editor. Wilson, Richard. editor.

Yer Numarası

ONLINE

Elektronik Erişim

https://doi.org/10.1007/978-3-319-49055-7

Format:

Durum

Çevrimiçi Kütüphane~1

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Kopya:

9.

Classification and Data Mining için kapak resmi

Classification and Data Mining

Classification and Data Mining

Yazar

Giusti, Antonio. editor. Ritter, Gunter. editor. Vichi, Maurizio. editor. SpringerLink (Online service)

Yer Numarası

ONLINE(333210.1)

Elektronik Erişim

http://dx.doi.org/10.1007/978-3-642-28894-4

Format:

Durum

Çevrimiçi Kütüphane~1

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1

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