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1. 
Cover image for Lifetime Reliability-aware Design of Integrated Circuits
Lifetime Reliability-aware Design of Integrated Circuits
Author 
Raji, Mohsen. author. Ghavami, Behnam. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-15345-7
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2. 
Cover image for Emerging Electronic Devices, Circuits and Systems Select Proceedings of EEDCS Workshop Held in Conjunction with ISDCS 2022
Emerging Electronic Devices, Circuits and Systems Select Proceedings of EEDCS Workshop Held in Conjunction with ISDCS 2022
Author 
Giri, Chandan. editor. Iizuka, Takahiro. editor. Rahaman, Hafizur. editor. Bhattacharya, Bhargab B. editor. SpringerLink (Online service)
Preferred Shelf Number 
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Electronic Access 
https://doi.org/10.1007/978-981-99-0055-8
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3. 
Cover image for The Electrical Engineering Handbook - Six Volume Set
The Electrical Engineering Handbook - Six Volume Set
Author 
Dorf, Richard C., editor. Taylor and Francis.
Preferred Shelf Number 
R857 .B54
Electronic Access 
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4. 
Cover image for Micro-Relay Technology for Energy-Efficient Integrated Circuits
Micro-Relay Technology for Energy-Efficient Integrated Circuits
Author 
Kam, Hei. author. Chen, Fred. author. SpringerLink (Online service)
Preferred Shelf Number 
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Electronic Access 
https://doi.org/10.1007/978-1-4939-2128-7
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5. 
Cover image for Computational Intelligence in Analog and Mixed-Signal (AMS) and Radio-Frequency (RF) Circuit Design
Computational Intelligence in Analog and Mixed-Signal (AMS) and Radio-Frequency (RF) Circuit Design
Author 
Fakhfakh, Mourad. editor. Tlelo-Cuautle, Esteban. editor. Siarry, Patrick. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-19872-9
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6. 
Cover image for Terrestrial radiation effects in ULSI devices and electronic systems
Terrestrial radiation effects in ULSI devices and electronic systems
Author 
Ibe, Eishi H., author.
Preferred Shelf Number 
ONLINE(342252.1)
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9781118479308
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7. 
Cover image for Green electronics manufacturing : creating environmental sensible products
Green electronics manufacturing : creating environmental sensible products
Author 
Wang, John X., 1962, author.
Preferred Shelf Number 
TK7836 .W36 2013
Electronic Access 
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8. 
Cover image for Semiconductor process reliability in practice
Semiconductor process reliability in practice
Author 
Gan, Zhenghao. Wong, Waisum. Liou, Juin J.
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9. 
Cover image for Radiation effects in semiconductors
Radiation effects in semiconductors
Author 
Iniewski, Krzysztof.
Preferred Shelf Number 
TK7871.85 .R317 2010
Electronic Access 
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10. 
Cover image for ESD failure mechanisms and models
ESD failure mechanisms and models
Author 
Voldman, Steven H. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9780470747254
http://site.ebrary.com/lib/alltitles/Doc?id=10317806
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11. 
Cover image for Handbook of semiconductor manufacturing technology
Handbook of semiconductor manufacturing technology
Author 
Doering, Robert, 1946- Nishi, Yoshio, 1940-
Preferred Shelf Number 
TK7871.85 .H3335 2008
Electronic Access 
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12. 
Cover image for Bayesian process monitoring, control and optimization
Bayesian process monitoring, control and optimization
Author 
Colosimo, Bianca M. Del Castillo, Enrique.
Preferred Shelf Number 
TS156.8 .B39 2007
Electronic Access 
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