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1. 
Cover image for Statistical intervals : a guide for practitioners and researchers.
Statistical intervals : a guide for practitioners and researchers.
Author 
Meeker, William Q. Hahn, Gerald J. Escobar, Luis A.
Preferred Shelf Number 
QA276 .H22 2017 EB
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781118594841
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2. 
Cover image for Statistical methods for reliability data
Statistical methods for reliability data
Author 
Meeker, William Q. Escobar, Luis A., ort. yaz.
Preferred Shelf Number 
TS 173 M44 1998
Format: 
Availability 
Beytepe Library~1
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3. 
Cover image for Statistical intervals a guide for practitioners
Statistical intervals a guide for practitioners
Author 
Hahn, Gerald J. Meeker, William Q. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=695349
http://site.ebrary.com/lib/alltitles/Doc?id=10504140
HathiTrust Digital Library, Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/23139974.html
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Online Library~1
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4. 
Cover image for Achieving Product Reliability : A Key to Business Success.
Achieving Product Reliability : A Key to Business Success.
Author 
Doganaksoy, Necip, 1960- author. Meeker, William Q., author. Hahn, Gerald J., author.
Preferred Shelf Number 
TS156
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003181361
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
Format: 
Availability 
Online Library~1
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