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1. 
Cover image for Properties of crystalline materials by X-ray diffraction methods and symmetry groups : a practical approach
Properties of crystalline materials by X-ray diffraction methods and symmetry groups : a practical approach
Author 
Mesa, John Fernando Zapata, 1971- author.
Preferred Shelf Number 
QD921
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003344438
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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2. 
Cover image for Fundamentals of crystallography, powder X-ray diffraction, and transmission electron microscopy for materials scientists
Fundamentals of crystallography, powder X-ray diffraction, and transmission electron microscopy for materials scientists
Author 
Dong, ZhiLi, author.
Preferred Shelf Number 
QD131 .D66 2022
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9780429351662
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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3. 
Cover image for In-situ Studies with Photons, Neutrons and Electrons Scattering II
In-situ Studies with Photons, Neutrons and Electrons Scattering II
Author 
Kannengiesser, Thomas. editor. Babu, Sudarsanam Suresh. editor. Komizo, Yu-ichi. editor. Ramirez, Antonio J. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-06145-0
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4. 
Cover image for Statistics of medical imaging
Statistics of medical imaging
Author 
Lei, Tianhu., author.
Preferred Shelf Number 
RC78.7 .D53 L45 2012
Electronic Access 
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5. 
Cover image for Hot deformation and processing of aluminum alloys
Hot deformation and processing of aluminum alloys
Author 
McQueen, H. J.
Preferred Shelf Number 
TS209.5 .H675 2011
Electronic Access 
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6. 
Cover image for Biochemical applications of nonlinear optical spectroscopy
Biochemical applications of nonlinear optical spectroscopy
Author 
Yakovlev, Vladislav.
Preferred Shelf Number 
QP519.9 .L37 B56 2008
Electronic Access 
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7. 
Cover image for X-ray metrology in semiconductor manufacturing
X-ray metrology in semiconductor manufacturing
Author 
Bowen, D. Keith (David Keith), 1940- author. Tanner, B. K. (Brian Keith)
Preferred Shelf Number 
TK7874.58 .B69 2006
Electronic Access 
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