Cover image for Defects-recognition imaging and physics in semiconductors XIV selected peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, September 25-29, 2011, Miyazaki, Japan
Title:
Defects-recognition imaging and physics in semiconductors XIV selected peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, September 25-29, 2011, Miyazaki, Japan
Author:
International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (2011 : Miyazaki, Japan)
ISBN:
9783038138563
Conference Author:
International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (2011 : Miyazaki, Japan)
Publication Information:
Durnten-Zurich ; Enfield, N.H. : Trans Tech Publications, c2012.
Physical Description:
1 online resource (xiii, 299 p.) : ill.
Series:
Materials science forum, v. 725
Series Title:
Materials science forum, 0255-5476 ; v. 725
Subject Term:
Semiconductors -- Defects -- Congresses.

Image processing -- Congresses.
Added Author:
Yamada-Kaneta, Hiroshi.

Sakai, Akira.
Electronic Access:
EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=517215
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