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1. 
Cover image for Nanotechnology in electronics : materials, properties, devices
Nanotechnology in electronics : materials, properties, devices
Author 
P. M., Visakh, editor. Semkin, Artem, editor. B., Raneesh, 1986- editor. Lazović, Saša, editor.
Preferred Shelf Number 
TK7874.84
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9783527824229
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2. 
Cover image for Metal oxide nanocomposite thin films for optoelectronic device applications
Metal oxide nanocomposite thin films for optoelectronic device applications
Author 
Zargar, Rayees Ahmad, editor.
Preferred Shelf Number 
TA418.9 .T45 M48 2023
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119865636
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3. 
Cover image for Semiconductor process reliability in practice
Semiconductor process reliability in practice
Author 
Gan, Zhenghao. Wong, Waisum. Liou, Juin J.
Preferred Shelf Number 
ONLINE
Electronic Access 
Subscription required
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4. 
Cover image for Reliability wearout mechanisms in advanced CMOS technologies
Reliability wearout mechanisms in advanced CMOS technologies
Author 
Strong, Alvin Wayne, 1946-
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029
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5. 
Cover image for Transient-induced latchup in CMOS integrated circuits
Transient-induced latchup in CMOS integrated circuits
Author 
Ker, Ming-Dou. Hsu, Sheng-Fu.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5453758
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