Defects-recognition imaging and physics in semiconductors XIV selected peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, September 25-29, 2011, Miyazaki, Japan için kapak resmi
Başlık:
Defects-recognition imaging and physics in semiconductors XIV selected peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, September 25-29, 2011, Miyazaki, Japan
Yazar:
International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (2011 : Miyazaki, Japan)
ISBN:
9783038138563
Yayın Bilgileri:
Durnten-Zurich ; Enfield, N.H. : Trans Tech Publications, c2012.
Fiziksel Tanımlama:
1 online resource (xiii, 299 p.) : ill.
Seri:
Materials science forum, v. 725
Seri Başlığı:
Materials science forum, 0255-5476 ; v. 725
Ayırtma:
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